{"title":"CMOS图像传感器低噪声过采样信号检测技术","authors":"N. Kawai, S. Kawahito","doi":"10.1109/IMTC.2002.1006851","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a method of low-noise signal readout using frame oversampling and a CMOS image sensor with non-destructive high-speed readout mode. The technique enables the use of high-gain column amplifiers and the digital integration of signals without noise accumulation. The column amplifier is effective for reducing the noises due to the wideband amplifier and the quantization noises. Simulation results show that the noise can be reduced by a factor of 20 log/sub 10/ M [dB] where M is the oversampling ratio.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"A low-noise oversampling signal detection technique for CMOS image sensors\",\"authors\":\"N. Kawai, S. Kawahito\",\"doi\":\"10.1109/IMTC.2002.1006851\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a method of low-noise signal readout using frame oversampling and a CMOS image sensor with non-destructive high-speed readout mode. The technique enables the use of high-gain column amplifiers and the digital integration of signals without noise accumulation. The column amplifier is effective for reducing the noises due to the wideband amplifier and the quantization noises. Simulation results show that the noise can be reduced by a factor of 20 log/sub 10/ M [dB] where M is the oversampling ratio.\",\"PeriodicalId\":141111,\"journal\":{\"name\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2002.1006851\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2002.1006851","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
摘要
本文提出了一种基于帧过采样和CMOS图像传感器的低噪声信号读出方法,该方法具有无损高速读出模式。该技术能够使用高增益列放大器和无噪声积累的信号数字集成。列放大器可以有效地降低宽带放大器和量化噪声带来的噪声。仿真结果表明,噪声可以降低20 log/sub 10/ M [dB],其中M为过采样比。
A low-noise oversampling signal detection technique for CMOS image sensors
In this paper, we propose a method of low-noise signal readout using frame oversampling and a CMOS image sensor with non-destructive high-speed readout mode. The technique enables the use of high-gain column amplifiers and the digital integration of signals without noise accumulation. The column amplifier is effective for reducing the noises due to the wideband amplifier and the quantization noises. Simulation results show that the noise can be reduced by a factor of 20 log/sub 10/ M [dB] where M is the oversampling ratio.