{"title":"从锐利和模糊图像中估计粗边缘的深度","authors":"C. Simon, F. Bicking, Thierry Simon","doi":"10.1109/IMTC.2002.1006861","DOIUrl":null,"url":null,"abstract":"This article deals with the generalization of a local depth estimation method using sharp edges and blurred edges. This Depth from Defocus method is explained and the theoretical relations are defined. Improvements concerning the generalization and the noise sensitivity on the depth estimation are developed and application conditions are exposed. Some results on synthetic images are presented to illustrate the method efficiency.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"76 4","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Estimation of depth on thick edges from sharp and blurred images\",\"authors\":\"C. Simon, F. Bicking, Thierry Simon\",\"doi\":\"10.1109/IMTC.2002.1006861\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article deals with the generalization of a local depth estimation method using sharp edges and blurred edges. This Depth from Defocus method is explained and the theoretical relations are defined. Improvements concerning the generalization and the noise sensitivity on the depth estimation are developed and application conditions are exposed. Some results on synthetic images are presented to illustrate the method efficiency.\",\"PeriodicalId\":141111,\"journal\":{\"name\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"volume\":\"76 4\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2002.1006861\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2002.1006861","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Estimation of depth on thick edges from sharp and blurred images
This article deals with the generalization of a local depth estimation method using sharp edges and blurred edges. This Depth from Defocus method is explained and the theoretical relations are defined. Improvements concerning the generalization and the noise sensitivity on the depth estimation are developed and application conditions are exposed. Some results on synthetic images are presented to illustrate the method efficiency.