单时钟，单锁存，扫描设计

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI:10.1109/IMTC.2002.1006912

Amit M. Sheth, J. Savir

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引用次数: 2

摘要

本文描述了一种新的扫描设计，在扫描和功能模式中使用相同的时钟。测试信号区分正常操作和测试操作。这种新设计节省了电路、引脚和测试时间，并具有高速扫描能力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single-clock, single-latch, scan design

This paper describes a new scan design that uses the same clock for both scan and functional mode. A test made signal distinguishes between normal and test operations. This new design enjoys savings in circuits, pins, test time, and also enjoys the benefits of a high-speed scan capability.

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来源期刊

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)

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