{"title":"测量混频器的带内失真","authors":"A. Geens, W. Moer, Y. Rolain","doi":"10.1109/IMTC.2002.1007150","DOIUrl":null,"url":null,"abstract":"This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measuring in-band distortions of mixers\",\"authors\":\"A. Geens, W. Moer, Y. Rolain\",\"doi\":\"10.1109/IMTC.2002.1007150\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.\",\"PeriodicalId\":141111,\"journal\":{\"name\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2002.1007150\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2002.1007150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.