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IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)最新文献

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An asynchronous-sampling technique for the analysis of mixed signals 一种用于混合信号分析的异步采样技术
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007132
L. Peretto, R. Sasdelli, R. Tinarelli
{"title":"An asynchronous-sampling technique for the analysis of mixed signals","authors":"L. Peretto, R. Sasdelli, R. Tinarelli","doi":"10.1109/IMTC.2002.1007132","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007132","url":null,"abstract":"The paper deals with the performance evaluation of a digital method, which is based on an asynchronous sampling technique, for the analysis of bi-tone mixed signal. A deterministic and a statistical approach are proposed to study the influence of the tone frequencies, the observation interval and the sampling frequency on the behavior of the method implementation.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126509120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance analysis of fault tolerant multistage interconnection networked parallel instrumentation with concurrent testing and diagnosis 并行测试诊断的容错多级互联网络化并行仪器性能分析
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007177
M. Choi, N. Park, F. Meyer, F. Lombardi
{"title":"Performance analysis of fault tolerant multistage interconnection networked parallel instrumentation with concurrent testing and diagnosis","authors":"M. Choi, N. Park, F. Meyer, F. Lombardi","doi":"10.1109/IMTC.2002.1007177","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007177","url":null,"abstract":"Performance and reliability are two of the most crucial issues in today's high-performance instrumentation and measurement systems. Instrumentation and measurement systems have found and enjoyed their performance enhancement through parallel and distributed processing. High speed and density Multistage Interconnection Networks (MINs) are widely-used subsystems of parallel processing and communication systems. New performance models are proposed to evaluate the fault tolerant MIN in this paper, thereby establishing a sound foundation for assuring the performance and reliability of fault tolerant MINs with high confidence level during parallel instrumentation. A concurrent fault detection and recovery scheme for MINs is introduced to enable a generic approach to fault tolerance by rerouting over the redundant interconnection links. A switch architecture to realize the concurrent testing and diagnosis is shown. The proposed performance models are developed and used to evaluate the compound effect of the fault tolerant operations such as testing, diagnosis and recovery on the throughput and delay. Results are shown on single transient and permanent stuck-at fault on links and storage units in switching elements. it is shown that the performance degradation for the overhead due to the fault tolerance is quite graceful while the performance degradation without fault recovery is unacceptable.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121509225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Calculation of power system harmonics via wavelet packet decomposition in real time metering 实时计量中基于小波包分解的电力系统谐波计算
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007206
L. Eren, M. Devaney
{"title":"Calculation of power system harmonics via wavelet packet decomposition in real time metering","authors":"L. Eren, M. Devaney","doi":"10.1109/IMTC.2002.1007206","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007206","url":null,"abstract":"The fast Fourier transform is used widely in harmonic analysis for real time power metering due to its low computational complexity. An alternate method, wavelet packet decomposition, has been applied to power system signals to meter voltage and current harmonics Although the new method provides better analysis, the computational complexity of commonly used filters such as Daubechies, Vaidyanathan, and Beylkin places a limitation on its use in real time metering. This paper proposes an all-pass implementation of Butterworth IIR filters to reduce the computational complexity of the aforementioned FIR filters while providing similar if not better magnitude characteristics.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127532189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
Instrumental method for quantitative evaluation of cell/particle adhesion based on transport measurements in capillary flow. Part I: The measuring system 毛细管流动中基于输运测量的细胞/颗粒粘附定量评价的仪器方法。第一部分:测量系统
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007134
F. De Bisschop, J. Everaert
{"title":"Instrumental method for quantitative evaluation of cell/particle adhesion based on transport measurements in capillary flow. Part I: The measuring system","authors":"F. De Bisschop, J. Everaert","doi":"10.1109/IMTC.2002.1007134","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007134","url":null,"abstract":"An instrumental method is proposed for quantitative evaluation of cell/particle adhesion at solid/liquid interfaces. The retardation of convective cell/particle transport is measured in capillary flow tubes (columns), that have been internally coated with the substance under investigation. Ac-operated electronic gating is used for the determination of the elution rate. The technique is similar to that of HPLC (high pressure liquid chromatography). Cell/particle transport however, on column, is totally different from that of solutes: transport mainly takes place at a radial distance about halfway the axis and the wall (Segre-Silberberg effect). At specific flow rates of the carrier, cells/particles contact the wall and may be released again as a consequence of increasing lift and drag. The resulting transport retardation depends on the chemical nature of the capillary wall coatings.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132350312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-line liquid crystalline polarization transformer 直列式液晶极化变压器
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007087
A. Walczak, E. Nowinowski-Kruszelnicki, L. Jaroszewicz
{"title":"In-line liquid crystalline polarization transformer","authors":"A. Walczak, E. Nowinowski-Kruszelnicki, L. Jaroszewicz","doi":"10.1109/IMTC.2002.1007087","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007087","url":null,"abstract":"A new in-line type tunable liquid crystalline fiber-optic polarization transformer is presented. The main idea is to obtain anisotropic waveguide structure based on biconically tapered isotropic fiber core and anisotropic liquid fiber clad. As the liquid crystalline clad the nematic mixture W-602 made by Dabrowski's group has been used. The special construction of a device with simple external cross-section secures a possibility to change molecular orientation of the liquid-crystalline clad by external field. Thus, different polarizing action has been obtained depending on fulfillment waveguide condition of the structure.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130485157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A spline function, DSP based mixed-signal arbitrary waveform generator 一个样条函数，基于DSP的混合信号任意波形发生器
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007130
M. Yeary, R. Fink, D. Beck, M. Burns, D. Guidry
{"title":"A spline function, DSP based mixed-signal arbitrary waveform generator","authors":"M. Yeary, R. Fink, D. Beck, M. Burns, D. Guidry","doi":"10.1109/IMTC.2002.1007130","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007130","url":null,"abstract":"As it currently stands, waveform generators are being employed in many diverse areas such as communication systems, radar applications, simulation, and testing. The arbitrary waveform generator introduced in this paper consists of a DSP (Digital Signal Processor), a FIFO memory, a video palette, and a PC interface. A program running on the PC creates a digital representation of a waveform according to user parameters and sends it to the DSP's RAM. The DSP algorithmically converts the digital representation to a point-by-point representation of the desired analog signal. The data points are sent to the FIFO buffer, which latches the data to the video palette that serves as the digital to analog converter. The system uses JTAG and a high-speed serial port interface to communicate with the PC, to allow for readily programmed signals. In addition to the production of traditional signals such as sinusoids and squarewaves, a mathematical tool known as splines will be employed to aid in the development of customized arbitrary waveforms. A picture of our new device is presented in the paper, in addition to laboratory measurements.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130501827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Generalised calibration schemes for precision RF vector network analyser measurements 精密射频矢量网络分析仪测量的广义校准方案
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007154
A. G. Morgan, N. Ridler, M. Salter
{"title":"Generalised calibration schemes for precision RF vector network analyser measurements","authors":"A. G. Morgan, N. Ridler, M. Salter","doi":"10.1109/IMTC.2002.1007154","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007154","url":null,"abstract":"This paper discusses RF calibration schemes for one-port vector network analysers other than the traditional short-open-load scheme. Before use, the calibration standards are characterised by fitting polynomials to measured voltage reflection coefficient values. Simulated uncertainty profiles and examples of measurement uncertainties obtained for various calibration schemes are presented. A method of adaptively choosing the best calibration scheme for a particular device at a particular frequency is suggested.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117007517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Sensor fusion for context understanding 用于上下文理解的传感器融合
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006808
Huadong Wu, M. Siegel, Sevim Ablay
{"title":"Sensor fusion for context understanding","authors":"Huadong Wu, M. Siegel, Sevim Ablay","doi":"10.1109/IMTC.2002.1006808","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006808","url":null,"abstract":"To answer the challenge of context-understanding for HCI, we propose and test experimentally a top-down sensor fusion approach. We seek to systematize the sensing process in two steps. first, decompose relevant context information in such a way that it can be described in a model of discrete facts and quantitative measurements, second, we build a generalizable sensor fusion architecture to deal with highly distributed sensors in a dynamic configuration to collect, fuse and populate our context information model. This paper describes our information model, system architecture, and preliminary experimental results.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130983394","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 60
A quantitative method to evaluate the performance of hyperspectral data fusion 一种定量评价高光谱数据融合性能的方法
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007076
Qiang Wang, Yi Shen, Ye Zhang
{"title":"A quantitative method to evaluate the performance of hyperspectral data fusion","authors":"Qiang Wang, Yi Shen, Ye Zhang","doi":"10.1109/IMTC.2002.1007076","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007076","url":null,"abstract":"Hyperspectral data fusion technique is the focus of hyperspectral data processing in recent years. Many fusion methods have been proposed, but little research work has been done to evaluate the performances of different data fusion methods. In order to meet the urgent need, a new method called quantitative correlation analysis is proposed in this paper. With this method, the performances of different fusion methods can be compared and analyzed directly based on the data of before and after the data fusion take place. The experiment results show that the new method is effective and the comparative results conform to the application results.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131282378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Power quality index meter 电能质量指数计
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007098
L. Eren, M. Devaney
{"title":"Power quality index meter","authors":"L. Eren, M. Devaney","doi":"10.1109/IMTC.2002.1007098","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007098","url":null,"abstract":"The increased sensitivity of power electronics equipment results in high susceptibility of industrial customers to short term voltage variations such as sags and swells. Many utilities are publishing power quality index values to indicate overall quality of their distribution systems. In this study, a real time Power Quality Index Meter that combines the detection of disturbances and the calculation of required power quality indices is proposed. The real time index metering eliminates the need for extended memory and greatly reduces subsequent data processing efforts.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131561712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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