Generalised calibration schemes for precision RF vector network analyser measurements

Abstract

This paper discusses RF calibration schemes for one-port vector network analysers other than the traditional short-open-load scheme. Before use, the calibration standards are characterised by fitting polynomials to measured voltage reflection coefficient values. Simulated uncertainty profiles and examples of measurement uncertainties obtained for various calibration schemes are presented. A method of adaptively choosing the best calibration scheme for a particular device at a particular frequency is suggested.