{"title":"Using abstraction for efficient formal verification of pipelined processors with value prediction","authors":"M. Velev","doi":"10.1109/ISQED.2006.142","DOIUrl":"https://doi.org/10.1109/ISQED.2006.142","url":null,"abstract":"Presented are abstraction techniques that accelerate the formal verification of pipelined processors with value prediction. The formal verification is done by modeling based on the logic of equality with uninterpreted functions and memories (EUFM), and using an automatic tool flow. Applying special abstractions in previous work had resulted in EUFM correctness formulas where most of the terms (abstract word-level values) appear in only positive equations (equality comparisons) or as arguments of uninterpreted functions and uninterpreted predicates, allowing such terms to be treated as distinct constants - a property called positive equality. That property produced orders of magnitude speedup. However, in processors with value prediction, the mechanism for correcting value mispredictions introduces both positive and negated equations between the actual and predicted values, thus reducing significantly the potential for exploiting positive equality. The contributions of this paper are: 1) modeling and formal verification of pipelined processors with load-value prediction and fully implemented mechanism for correcting load-value mispredictions; 2) an approach to abstract the mechanism for detecting load-value mispredictions, thus allowing the use of positive equality, at the cost of enriching the specification processor with the abstracted mechanism for detecting load-value mispredictions; and 3) the observation that this abstraction technique is general and applicable to the formal verification of pipelined processors with other forms of value prediction, e.g., branch prediction, as illustrated with experimental results. The presented abstraction technique produced an order of magnitude speedup when formally verifying a 5-stage pipelined processor with load-value prediction. It can be expected that the speedup would be significantly greater for more complex processors with value prediction","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115004634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A watermarking system for IP protection by buffer insertion technique","authors":"Guangyu Sun, Zhiqiang Gao, Yi Xu","doi":"10.1109/ISQED.2006.19","DOIUrl":"https://doi.org/10.1109/ISQED.2006.19","url":null,"abstract":"In this paper, we introduce a kind of watermarking system for IP protection (IPP). The copyright is encrypted and then embedded into the design as the watermark in buffer insertion stage. This watermarking technique can identify the design copyright uniquely, and is fit for both ASIC using standard cells and full-custom design. We have evaluated the technique on several testing designs, the inserted results show that the watermarking process achieves 100% success causing little overhead on design performance. Extraction and identification process of the watermark is also analyzed. The watermark embedded is hard to be found out and tampered away, and the technique can be integrated into EDA tools for manufacturing","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121063281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Time redundancy based scan flip-flop reuse to reduce SER of combinational logic","authors":"P. Elakkumanan, K. Prasad, R. Sridhar","doi":"10.1109/ISQED.2006.137","DOIUrl":"https://doi.org/10.1109/ISQED.2006.137","url":null,"abstract":"With technology scaling, combinational logic is becoming increasingly vulnerable to radiation strikes. Classical fault tolerant techniques mainly address single even upsets (SEUs). Robust combinational logic designs capable of tolerating single event transients (SETs) also are needed in lower technology nodes. In this paper, we present a novel SET mitigation scheme for flip-flops based on the time redundancy principle. The incurred area overhead due to the radiation hardening is minimized by reusing existing components (uses existing scan portion for SET tolerance). As shown by the simulation results, the proposed SET tolerant flip-flop has no performance overheads and simulation results that show the area overheads in ISCAS benchmark circuits are also presented","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125911043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Logic SER reduction through flip flop redesign","authors":"V. Joshi, Rajeev R. Rao, D. Blaauw, D. Sylvester","doi":"10.1109/ISQED.2006.82","DOIUrl":"https://doi.org/10.1109/ISQED.2006.82","url":null,"abstract":"In this paper, we present a new flip flop sizing scheme that efficiently immunizes combinational logic circuits from the effects of radiation induced single event transients (SET). The proposed technique leverages the effect of temporal masking by selectively increasing the length of the latching windows associated with the flip flops thereby preventing faulty transients from being registered. We propose an effective flip flop sizing scheme and construct a variety of flip flop variants that function as low-pass filters for SETs and reduce the soft error rates (SER) of combinational circuits. In contrast to previously proposed flip flop designs that rely on logic duplication and complicated circuit design styles, our method provides a simple yet highly effective mechanism for logic SER reduction while incurring very small overheads in both delay (about 5 FO4) and power (about 5%). Experimental results at the circuit level on a wide range of benchmarks show 1000times reductions in SER for small increases in circuit delay and power","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"236 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117173245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Post-layout gate sizing for interconnect delay and crosstalk noise optimization","authors":"N. Hanchate, Nagarajan Ranganathan","doi":"10.1109/ISQED.2006.101","DOIUrl":"https://doi.org/10.1109/ISQED.2006.101","url":null,"abstract":"In this paper, we develop a new post-layout gate sizing algorithm for simultaneous optimization of interconnect delay and crosstalk noise. We have modeled the problem of gate sizing as a normal form game and solved using the Nash equilibrium. The noise induced on a net depends on the size of the gates driving the coupled nets and itself. Increasing the gate size of the driver increases the noise induced by the net on its coupled nets, where as, increasing the size of the driver of coupled nets increases the noise induced on the net itself, resulting in a conflicting situation. The problem of post-layout gate size optimization is difficult to solve due to its conflicting nature (M. R. Becer, 2003). Game theory provides a natural framework for handling such conflicting situations and allows multi-metric optimization. We have exploited this property of game theory to solve the cyclic dependency of crosstalk noise on its gate sizes, while modeling the problem of gate sizing for simultaneous optimization of interconnect delay and crosstalk noise, which again are conflicting in nature. Experimental results on several medium and large opencore designs indicate average improvements of 13.33% and 16.61% for interconnect delay and crosstalk noise, without any area overhead or need for re-routing","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121832473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Partial selective encryption: an improved system for protecting VLSI design data in the OASIS format","authors":"A. P. Kulkarni, T. J. Grebinski","doi":"10.1109/ISQED.2006.98","DOIUrl":"https://doi.org/10.1109/ISQED.2006.98","url":null,"abstract":"Protecting proprietary design-file data is a major interest of manufacturers, but traditional VLSI layout file formats have not allowed for this capability short of encrypting an entire file. We demonstrate a method with which the new OASIS P39 VLSI format can be used to facilitate arbitrary-strength encryption by use of the compression flag. The method supports partial encryption of selected components of the file with multiple access keys and the existence of encrypted components is invisible to eavesdroppers","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122099018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Area efficient temporal coding schemes for reducing crosstalk effects","authors":"Jean-Marc Philippe, S. Pillement, O. Sentieys","doi":"10.1109/ISQED.2006.28","DOIUrl":"https://doi.org/10.1109/ISQED.2006.28","url":null,"abstract":"In this paper, we present some new crosstalk avoidance coding schemes devoted to on-chip busses. These schemes consist in encoding sequences of bits on each line of a bus transferring a packet in order to eliminate worst-case crosstalk patterns. They permit to improve the delay on the link at the cost of doubling the number of transmitted bits. The advantage of the presented solutions is that they have no wiring overhead, so they are independent from the bus bit-width. The coding schemes allow an increase of 50% of the data rate for a 1-mm bus. Moreover, the proposed solutions induce a direction in deep-submicron noise that can be used to implement a noise-tolerant system","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128863540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dummy-gate structure to improve ESD robustness in a fully-salicided 130-nm CMOS technology without using extra salicide-blocking mask","authors":"Hsin-Chyh Hsu, M. Ker","doi":"10.1109/ISQED.2006.54","DOIUrl":"https://doi.org/10.1109/ISQED.2006.54","url":null,"abstract":"NMOS with dummy-gate structure is proposed to significantly improve electrostatic discharge (ESD) robustness in a fully-salicided CMOS technology. By using this structure, ESD current is discharged far away from the salicided surface channel of NMOS, therefore the NMOS can sustain a much higher ESD level. The HBM (MM) ESD robustness of the NMOS with dummy-gate structure (W/L = 480 mum/0.18 mum) has been successfully improved from 0.5 kV (125 V) to 1.5 kV (325 V) in a 130-nm fully-salicided CMOS process. Under the same layout area of the gate-grounded NMOS (ggNMOS), HBM (MM) ESD level can be improved over 300% (260%) by the proposed dummy-gate structure. The proposed dummy-gate structure is fully processed compatible to general salicided CMOS processes without additional mask, which is very cost-efficient for application in the IC products","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130339562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design of window comparators for integrator-based capacitor array testing circuits","authors":"A. Laknaur, Haibo Wang","doi":"10.1109/ISQED.2006.47","DOIUrl":"https://doi.org/10.1109/ISQED.2006.47","url":null,"abstract":"This paper investigates the impact of window comparator threshold variations on the performance of integrator-based programmable capacitor array (PCA) testing circuits. It presents two window comparator designs that take different approaches to address the problem of comparator threshold variations in PCA testing. The first comparator design utilizes a fully symmetric circuit structure to achieve small threshold deviations. The second design relies on increasing testing time to reduce the effect of comparator threshold variations. Experimental results are presented to compare the performance of the two design approaches","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132404287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power-aware test pattern generation for improved concurrency at the core level","authors":"Arkan Abdulrahman, S. Tragoudas","doi":"10.1109/ISQED.2006.104","DOIUrl":"https://doi.org/10.1109/ISQED.2006.104","url":null,"abstract":"A functional automatic test pattern generation (ATPG) for embedded core testing is presented that meets power constraints requirements and time to market consideration. Quick turnaround time for the ATPG is obtained by utilizing compact sets of test vectors. Use of test functions for the embedded cores control the switching activity so that the generated test vectors meet constraints on power dissipation. Concurrency is guaranteed with the use of test functions (as opposed to patterns) and appropriate I/O pin TAM allocations during a compact ATPG process that benefit from pre-existing test vectors. Low power dissipation is also facilitated by test functions and is driven by a metric that requires that a very small portion of each core net-list is available","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114206106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}