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IEEE Transactions on Very Large Scale Integration (VLSI) Systems最新文献

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46-nA High-PSR CMOS Buffered Voltage Reference With 1.2–5 V and $-$40 $^{circ}$C to 125 $^{circ}$C Operating Range 46-nA 高PSR CMOS 缓冲电压基准，工作范围为 1.2-5 V 和 $-$40 $^{circ}$C 至 125 $^{circ}$C
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-17 DOI: 10.1109/tvlsi.2024.3455428
Chiara Venezia, Andrea Ballo, Alfio Dario Grasso, Alessandro Rizzo, Calogero Ribellino, Salvatore Pennisi
{"title":"46-nA High-PSR CMOS Buffered Voltage Reference With 1.2–5 V and $-$40 $^{circ}$C to 125 $^{circ}$C Operating Range","authors":"Chiara Venezia, Andrea Ballo, Alfio Dario Grasso, Alessandro Rizzo, Calogero Ribellino, Salvatore Pennisi","doi":"10.1109/tvlsi.2024.3455428","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3455428","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"54 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142266327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Architectural Exploration for Waferscale Switching System 晶圆级交换系统架构探索
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-17 DOI: 10.1109/tvlsi.2024.3455332
Zhiquan Wan, Zhipeng Cao, Shunbin Li, Peijie Li, Qingwen Deng, Weihao Wang, Kun Zhang, Guandong Liu, Ruyun Zhang, Qinrang Liu
{"title":"Architectural Exploration for Waferscale Switching System","authors":"Zhiquan Wan, Zhipeng Cao, Shunbin Li, Peijie Li, Qingwen Deng, Weihao Wang, Kun Zhang, Guandong Liu, Ruyun Zhang, Qinrang Liu","doi":"10.1109/tvlsi.2024.3455332","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3455332","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142266253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effective Parallel Redundancy Analysis Using GPU for Memory Repair 利用 GPU 对内存修复进行有效的并行冗余分析
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-13 DOI: 10.1109/tvlsi.2024.3454286
Seung Ho Shin, Hayoung Lee, Sungho Kang
{"title":"Effective Parallel Redundancy Analysis Using GPU for Memory Repair","authors":"Seung Ho Shin, Hayoung Lee, Sungho Kang","doi":"10.1109/tvlsi.2024.3454286","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3454286","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"96 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142266254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sophon: A Time-Repeatable and Low-Latency Architecture for Embedded Real-Time Systems Based on RISC-V Sophon：基于 RISC-V 的可重复时间和低延迟嵌入式实时系统架构
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-11 DOI: 10.1109/tvlsi.2024.3447279
Zhe Huang, Xingyao Chen, Feng Gao, Ruige Li, Xiguang Wu, Fan Zhang
{"title":"Sophon: A Time-Repeatable and Low-Latency Architecture for Embedded Real-Time Systems Based on RISC-V","authors":"Zhe Huang, Xingyao Chen, Feng Gao, Ruige Li, Xiguang Wu, Fan Zhang","doi":"10.1109/tvlsi.2024.3447279","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3447279","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"4 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CR-DRAM: Improving DRAM Refresh Energy Efficiency With Inter-Subarray Charge Recycling CR-DRAM：利用子阵列间电荷回收提高 DRAM 刷新能效
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-11 DOI: 10.1109/tvlsi.2024.3445631
Haitao Du, Hairui Zhu, Song Chen, Yi Kang
{"title":"CR-DRAM: Improving DRAM Refresh Energy Efficiency With Inter-Subarray Charge Recycling","authors":"Haitao Du, Hairui Zhu, Song Chen, Yi Kang","doi":"10.1109/tvlsi.2024.3445631","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3445631","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"73 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142225011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel TriNet Architecture for Enhanced Analog IC Design Automation 用于增强模拟集成电路设计自动化的新型 TriNet 架构
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-10 DOI: 10.1109/TVLSI.2024.3452032
Arunkumar P Chavan;Shrish Shrinath Vaidya;Sanket M. Mantrashetti;Abhishek Gurunath Dastikopp;Kishan S. Murthy;H. V. Ravish Aradhya;Prakash Pawar
{"title":"A Novel TriNet Architecture for Enhanced Analog IC Design Automation","authors":"Arunkumar P Chavan;Shrish Shrinath Vaidya;Sanket M. Mantrashetti;Abhishek Gurunath Dastikopp;Kishan S. Murthy;H. V. Ravish Aradhya;Prakash Pawar","doi":"10.1109/TVLSI.2024.3452032","DOIUrl":"10.1109/TVLSI.2024.3452032","url":null,"abstract":"Analog integrated circuit (IC) design and its automation pose significant challenges due to the time-consuming mathematical computations and complexity of circuit design. Though efforts have been made to automate the analog design flow, the current approach falls short in meeting the exact design requirements and plagued by inaccuracies, highlighting the necessity for a more robust approach capable of accurately predicting circuits. In addition, there is a need for an improved dataset collection technique to enhance the overall performance of the automation process. The power management unit (PMU) is a crucial block in any IC that requires the design of low-dropout regulator (LDO) for which amplifiers are fundamental blocks. This research harnesses the capabilities of deep neural networks (DNNs) to automate essential amplifier blocks, such as the differential amplifier (DiffAmp) and two-stage operational amplifier (OpAmp). In addition, it proposes an automation framework for the higher level circuitry of the LDO. This article introduces a novel “TriNet” architecture designed for various parameters of amplifiers, including gain, bandwidth, and power facilitating precise predictions for DiffAmp and OpAmp, and presents a decoder architecture tailored for LDO. A notable aspect is the development of an efficient technique for acquiring larger datasets in a condensed timeframe. The presented methodologies demonstrate high accuracy rates, achieving 97.3% for DiffAmp and OpAmp circuits and 94.3% for LDO design.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"32 11","pages":"2046-2059"},"PeriodicalIF":2.8,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10672521","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Two-Channel Interleaved ADC With Fast-Converging Foreground Time Calibration and Comparison-Based Control Logic 具有快速转换前景时间校准和基于比较的控制逻辑的双通道交错 ADC
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-09 DOI: 10.1109/TVLSI.2024.3449293
Xiang Yan;Kefan Qin;Xinyue Zheng;Weibo Hu;Wei Ma;Haitao Cui
{"title":"A Two-Channel Interleaved ADC With Fast-Converging Foreground Time Calibration and Comparison-Based Control Logic","authors":"Xiang Yan;Kefan Qin;Xinyue Zheng;Weibo Hu;Wei Ma;Haitao Cui","doi":"10.1109/TVLSI.2024.3449293","DOIUrl":"10.1109/TVLSI.2024.3449293","url":null,"abstract":"A dual-channel interleaved analog-to-digital converter (ADC) operating at 320 MS/s is prototyped to validate a fast-converging foreground time calibration algorithm that is independent of ADC offset errors. An input polarity switching technique is introduced to eliminate the impact of sub-ADC offset mismatches during foreground time calibration. After foreground calibration, the signal-to-noise and distortion ratio (SNDR) and spurious free dynamic range (SFDR) are improved by 8.6 and 18.4 dB, respectively. In the sub-ADC design, a comparison functionality is enabled in the digital circuits to prevent metastability and expedite data conversion. The single-channel conversion rates reach 160 MS/s. The ADC is implemented via 40-nm digital CMOS technology, achieving a 52.01 dB signal-to-noise plus distortion ratio (SNDR) at near-Nyquist input while sampling at 320 MS/s. The overall power consumption is 3.65 mW, which includes an on-chip reference buffer and a clock circuit.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"32 11","pages":"2001-2011"},"PeriodicalIF":2.8,"publicationDate":"2024-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multiobjective Optimization of Class-F Oscillators F 类振荡器的多目标优化
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-05 DOI: 10.1109/tvlsi.2024.3449567
Zhan Qu, Zhenjiao Chen, Xingqiang Shi, Ya Zhao, Guohe Zhang, Feng Liang
{"title":"Multiobjective Optimization of Class-F Oscillators","authors":"Zhan Qu, Zhenjiao Chen, Xingqiang Shi, Ya Zhao, Guohe Zhang, Feng Liang","doi":"10.1109/tvlsi.2024.3449567","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3449567","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"2 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142225029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Post-Bond ILV Test Method in Monolithic 3-D ICs 单片三维集成电路中的粘接后 ILV 测试方法
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-05 DOI: 10.1109/tvlsi.2024.3450452
Xu Fang, Xiaofeng Zhao
{"title":"A Post-Bond ILV Test Method in Monolithic 3-D ICs","authors":"Xu Fang, Xiaofeng Zhao","doi":"10.1109/tvlsi.2024.3450452","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3450452","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"76 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Double-Data-Rate Ripple Counter With Calibration Circuits for Correlated Multiple Sampling in CMOS Image Sensors 带校准电路的双数据率纹波计数器，用于 CMOS 图像传感器中的相关多重采样
IF 2.8 2区 工程技术
IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-09-04 DOI: 10.1109/tvlsi.2024.3449320
Wanbin Zha, Jiangtao Xu, Kaiming Nie, Zhiyuan Gao
{"title":"A Double-Data-Rate Ripple Counter With Calibration Circuits for Correlated Multiple Sampling in CMOS Image Sensors","authors":"Wanbin Zha, Jiangtao Xu, Kaiming Nie, Zhiyuan Gao","doi":"10.1109/tvlsi.2024.3449320","DOIUrl":"https://doi.org/10.1109/tvlsi.2024.3449320","url":null,"abstract":"","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"14 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142194451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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