IEEE Transactions on Nuclear Science最新文献

{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3568184","DOIUrl":"https://doi.org/10.1109/TNS.2025.3568184","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11006315","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science publication information","authors":"","doi":"10.1109/TNS.2025.3568262","DOIUrl":"https://doi.org/10.1109/TNS.2025.3568262","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11006311","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Announcing the New Senior Editor for Accelerator Technology Papers","authors":"Gian-Franco Dalla Betta","doi":"10.1109/TNS.2025.3562304","DOIUrl":"https://doi.org/10.1109/TNS.2025.3562304","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1662-1662"},"PeriodicalIF":1.9,"publicationDate":"2025-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11006328","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Response of Overhead Cables to Low-Altitude Nuclear Electromagnetic Pulse","authors":"Zhaomin Li;Jiarong Dong;Bing Wei;Xinbo He;Hui Chen","doi":"10.1109/TNS.2025.3551326","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551326","url":null,"abstract":"The coupling characteristics of overhead wires under high-altitude nuclear electromagnetic pulse (HEMP) have been extensively studied. However, the effects of low-altitude nuclear electromagnetic pulse (NEMP) on the field values at observation points vary with explosion height, yield, and ground medium, and the coupling characteristics of overhead wires under low-altitude NEMP remain unresolved. To address this issue, this article proposes a solution. First, the finite-difference time-domain (FDTD) method is employed within a rotated ellipsoidal-hyperbolic orthogonal coordinate system to solve Maxwell’s equations and the air ionization equation, thus obtaining the source field at the location of the overhead wires. Subsequently, these results are used as an excitation source to calculate the response characteristics of the overhead wires with terminal loads using transmission line methods. Finally, the impacts of factors such as explosive yield, altitude, ground conductivity, terminal impedance, and cable height on the terminal induced current of overhead wires located at the edge of the source region under low-altitude NEMP incidence are analyzed. This study provides theoretical support and reference value for the protective design of power systems.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1741-1747"},"PeriodicalIF":1.9,"publicationDate":"2025-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Practical Design of Single-Slope ADC With Improved Dynamic Range on FPGA","authors":"Jianfeng Zhang;Yonggang Wang;Keyi Zhang;Xinren Qi","doi":"10.1109/TNS.2025.3551544","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551544","url":null,"abstract":"The development of field-programmable gate array (FPGA)-based analog-to-digital converters (ADCs) helps to improve system integration, shorten development cycles, and reduce costs. One realization of this is the single-slope ADC, which uses a ramp waveform to intersect the input signal, converting the input voltage into a measurable time interval for digitization. Although existing designs are capable of waveform digitization, there remains considerable potential for further research in terms of design practicality, flexibility, and performance. This article presents an implementation that advances current designs in three aspects. First, by decoupling the ADC sampling clock from the time-to-digital converter (TDC) clock, the ADC’s sampling rate can be reconfigured without the need for firmware resynthesis. Second, the two cross points within a single sampling cycle are combined to convert voltage into pulsewidth for measurement, significantly simplifying the firmware design. Finally, a mapping calibration between time and voltage is applied to improve the ADC linearity while maintaining the widest possible dynamic range. The proposed ADC was implemented on a Xilinx UltraScale+ FPGA for performance evaluation at a 200-MS/s sampling rate and 10-bit resolution. Test results show that the ADC achieves a measurement range of 70–1770 mV with an effective number of bits (ENOB) of 7.2. The differential nonlinearity (DNL) ranges from −0.23 to 0.23 LSB, and the integral nonlinearity (INL) ranges from −1.95 to 1.33 LSB. This ADC design requires no off-chip components, is not susceptible to FPGA placement and routing, and can be implemented as an intellectual property (IP) core, allowing end-users to integrate it into systems without requiring in-depth knowledge of ADC design.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1810-1818"},"PeriodicalIF":1.9,"publicationDate":"2025-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Single-Event Upset Laser Testing of Various SRAM Resources of a 7-nm FinFET System-on-Chip and Correlation With Heavy Ion Data","authors":"S. Achaq;V. Pouget;L. Artola;G. Hubert;A. Urena;F. Manni;A. Dufour;J. Boch","doi":"10.1109/TNS.2025.3551550","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551550","url":null,"abstract":"We present the single-event upset (SEU) laser testing of different static random access memory (SRAM) resources of a 7-nm fin field-effect transistor (FinFET) programmable system-on-chip (SoC). The results provide original insights into the physical organization of the device, and testing challenges are discussed. Multiple-cell upsets (MCUs) are discussed together with Monte Carlo simulation results. Correlation with heavy ion data is presented and discussed.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1460-1469"},"PeriodicalIF":1.9,"publicationDate":"2025-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143883304","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Rapid, Pulsed Laser Testing Approach for Single Event Latch-Up Screening","authors":"Liam P. Andrus;Jeffrey H. Warner;William C. Rice;Anthony C. Le;Christopher B. Saltonstall","doi":"10.1109/TNS.2025.3550857","DOIUrl":"https://doi.org/10.1109/TNS.2025.3550857","url":null,"abstract":"Sandia National Laboratories (SNL) has developed a custom pulsed laser single event effects testing facility utilizing a tunable wavelength (680–1080 nm), 140 fs, 80 MHz, Ti:sapphire laser. This system uses a pair of galvanometric mirrors to steer the laser beam across a field-of-view (FOV) to provide a rapid screening capability not available in traditional fixed laser beam testing systems. This article focuses on demonstrating the rapid screening capabilities of the SNL galvo-based laser system by screening an analog-to-digital converter (AD9240) which is known to be sensitive to single event latch-up (SEL). We compare the laser pulse energy thresholds required to induce SEL and the scanning speeds with measurements obtained from a traditional fixed-beam, low-repetition rate laser system. Our results show that rapid detection capabilities can be achieved without compromising SEL threshold determination. Additionally, an integrated imaging system has been designed to provide real-time visualization of SEL-sensitive nodes via emission microscopy (EMMI).","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1050-1058"},"PeriodicalIF":1.9,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Enhancing Temporal Uniformity in Pulse-Dilation Framing Camera Using Curved-Dilation-Pulse","authors":"Wenlong Lv;Yanli Bai;Yi Jiang;Guochun Huang;Songchun Li;Haoming Shuai;Dajian Liu","doi":"10.1109/TNS.2025.3569639","DOIUrl":"https://doi.org/10.1109/TNS.2025.3569639","url":null,"abstract":"The pulse-dilation framing camera (PDFC) is a 2-D ultrafast diagnostic device with high temporal resolution (TR). In high-energy physics experiments, it can be used to investigate related transient processes and ultrafast dynamics. Nevertheless, the transmission of linear dilation pulse (DP) along the photocathode (PC) may lead to TR non-uniformity in the PDFC, causing variations in the physical information captured at different time points and potentially resulting in distorted observations. To address this issue, a curved DP (CDP) was designed using an insulated gate bipolar transistor (IGBT), transformer coils, and high-pass filters, and its application in improving temporal uniformity (TU) was investigated. The research findings indicate that the IGBT circuit can generate a CDP with non-linearly rising amplitude and a slope ranging from 0.132 to 3.39 V/ps. Under conditions of -3-kV PC voltage, an initial time width of 10 ps for the electron beam (EB), and a drift distance of 500 mm, when applied to an 80-mm long PC, the average relative error (ARE) of EB dilation ratio (EBDR) along PC can be minimized to 0.63% (EBDR: <inline-formula> <tex-math>$11.68times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$11.81times $ </tex-math></inline-formula>). This represents a significant enhancement in TU compared to the 7.20% (<inline-formula> <tex-math>$3.84times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$4.42times $ </tex-math></inline-formula>) achieved with the linear ones. Furthermore, when evaluated based on the maximum relative error of EBDR along PC, the CDP achieves 1.11% compared with the multi-group high-precision time synchronization requirements of multi-pulse fusion (MPF, 9.14%, <inline-formula> <tex-math>$9.52times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$10.39times $ </tex-math></inline-formula>) and V-shaped pulse superposition (VSPS, 26.15%, <inline-formula> <tex-math>$11.28times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$14.23times $ </tex-math></inline-formula>), the CDP based on IGBT technology only requires a single group of time synchronization to effectively enhance TU. Meanwhile, the CDP can also be applied to a 1-D streak camera for mitigating dynamic spatio-temporal distortion.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 6","pages":"1843-1848"},"PeriodicalIF":1.9,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144314822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Neutron Energy Spectrum Obtained Using Energy Spectrum Superposition Method for Boron Neutron Capture Therapy","authors":"Junkai Yang;Haopeng Deng;Pingquan Wang;Hui Zhang;Zhimeng Hu;Likai Guo;Min Peng;Junmei Zeng;Chungming Paul Chu;Lin Xiao;Hongyu Guo;Giuseppe Gorini","doi":"10.1109/TNS.2025.3569730","DOIUrl":"https://doi.org/10.1109/TNS.2025.3569730","url":null,"abstract":"The neutron energy spectrum and fluence rate constitute critical determinants of tumor absorbed dose and therapeutic efficacy in neutron capture therapy (NCT). Variations in tumor depth and morphology, combined with accelerator beam intensity fluctuations, make it challenging to quickly obtain an accurate neutron energy spectrum. This study develops an energy spectrum superposition method (ESSM) that enables rapid neutron spectrum reconstruction through parameter retrieval from precomputed neutron transport databases. The methodology is validated using a beam shape assembly (BSA) with the three-layer moderator of aluminum fluoride (AlF3)-32.5 cm, CaF2-22.5 cm, and titanium fluoride (TiF3)-2 cm. Compared to the traditional simulation-based method, the energy spectrum obtained by ESSM demonstrates improved smoothness and superior statistical quality. For the two physical processes—proton bombardment on the target and neutron injection into the BSA—the neutron fluence rate ratios relative to the ESSM and the traditional simulation-based method were 0.958 and 0.996, respectively. After integrating the two physical processes, the BSA’s emission window demonstrated a fluence rate ratio of 0.977. Furthermore, when the number of calculated particles is <inline-formula> <tex-math>$3times 10^{{8}}$ </tex-math></inline-formula>, the equivalent computation efficiency is a 16500-fold enhancement, which can significantly reduce the time needed to calculate. The achieved rapid calculation demonstrates clinical viability for real-time treatment planning system (TPS) operation during image-guided boron NCT (BNCT) procedures.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 6","pages":"1856-1863"},"PeriodicalIF":1.9,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144314773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation","authors":"Matthew L. Breeding;Antonio E. Teijeiro;David Hughart;Joshua Young;Dolores A. Black;Jeffrey D. Black;Edward P. Wilcox","doi":"10.1109/TNS.2025.3549487","DOIUrl":"https://doi.org/10.1109/TNS.2025.3549487","url":null,"abstract":"Single-event upset (SEU) cross sections are reduced in 176-layer charge trap (CT) 3-D <sc>nand</small> devices under proton irradiation when multiple write operations are applied sequentially without the typical erase-before-write. This effect is observed for multiple data patterns and in both single-level cell (SLC) and triple-level cell (TLC) operating modes. SEU cross section calculation methodologies are discussed for highly scaled 3-D devices both with and without the application of rewrites, and potential implications for long-term endurance effects are proposed.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1433-1442"},"PeriodicalIF":1.9,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143883319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}