IEEE Transactions on Nuclear Science最新文献

{"title":"X-Ray and Neutron Radiography for Quantitative Material Reconstructions","authors":"Andrew J. Gilbert;Luke W. Campbell;Nikhil Deshmukh;Paul A. Hausladen;Matthew R. Heath;Dustin M. Kasparek;Lauren A. Misurek;Paul B. Rose;Kyle T. Schmitt","doi":"10.1109/TNS.2025.3572420","DOIUrl":"https://doi.org/10.1109/TNS.2025.3572420","url":null,"abstract":"Radiography is a powerful tool to determine the interior structure of objects. X-ray radiography is widely used and provides high-resolution images though X-rays have limited transmission through materials of high atomic number (Z) and density. In contrast, neutrons can penetrate many materials that are heavily attenuating to X-rays, such as metals, providing contrast in the inner layers of highly attenuating items. Past work has shown the value of using both X-ray and neutron radiography for estimating material thicknesses though that work was limited to simulated data. Here, we demonstrate quantitative material reconstructions using experimental X-ray and neutron radiography data from laboratory-based systems, accurately modeling radiography system responses to within a few percent to enable quantitative measures of material thickness. We demonstrate the utility of neutron radiography and X-ray radiography for these quantitative reconstructions and introduce methods for using their complementarity to improve image quality and optimize experimental design.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2183-2193"},"PeriodicalIF":1.9,"publicationDate":"2025-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Optimization of Scintillation Light Collection Efficiency in BGO Crystals With Surface Diffusion for Enhanced Sensitivity in the KAPAE","authors":"D. W. Jeong;E. Choi;J. Y. Cho;Nguyen Thanh Luan;H. Park;H. W. Park;Vladimir Shlegel;H. J. Kim","doi":"10.1109/TNS.2025.3552904","DOIUrl":"https://doi.org/10.1109/TNS.2025.3552904","url":null,"abstract":"The Kyungpook National University (KNU) Advanced Positronium Annihilation Experiment (KAPAE) aims to search for rare decays of positronium. The Phase I detector of KAPAE, equipped with bismuth germanate (Bi4Ge3O12, BGO) scintillation crystals with a polished surface, was designed to observe rare visible decays. The BGO scintillation crystals were chosen for their high gamma detection efficiency, high density, and high effective atomic number, making them suitable for gamma-ray detection in various applications, including medical imaging and high-energy physics experiments. However, due to its high refractive index of 2.15, BGO experiences considerable internal light trapping, which significantly reduces the efficiency of scintillation light collection. The Phase II detector focuses on detecting invisible decays of positronium by improving the light collection efficiency and energy resolution while minimizing dead areas using surface-diffused BGO crystals. This article investigates the light collection efficiency of <inline-formula> <tex-math>$3times 3times 15$ </tex-math></inline-formula> cm3 surface-diffused BGO crystals, demonstrating an approximately 22% higher light yield compared to polished surfaces. This improvement is confirmed by Monte Carlo simulations using the Geant4 toolkit, which predict similar enhancements in the light collection efficiency. The energy resolution is improved from an average of 12% to 10.8% with the diffused BGO crystals at 662 keV. These results enhance the sensitivity of the KAPAE Phase II detector to invisible decays of positronium. These improvements in the light collection efficiency and energy resolution of surface-diffused BGO crystals make them suitable materials for broader applications in experiments that require precise gamma energy measurement. In this article, we present the optimization of the KAPAE detector, providing insights for the design and enhancement of scintillation detector performance in particle physics and other high-energy applications.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2071-2075"},"PeriodicalIF":1.9,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Photobleaching of Neutron Radiation Induced Attenuation of Optical Fibers at Liquid Nitrogen Temperature","authors":"F. Solis Fernandez;B. M. Ludbrook;B. Phoenix;M. Ramesh;J. Schuyt;D. A. Moseley;M. Conroy;T. Price;G. F. Fernando;R. A. Badcock","doi":"10.1109/TNS.2025.3571354","DOIUrl":"https://doi.org/10.1109/TNS.2025.3571354","url":null,"abstract":"In this work, the effect of neutron radiation on optical fibers at cryogenic temperature was investigated and the effect of photobleaching as a way to mitigate the damage caused by this type of radiation was demonstrated. A neutron beam supplying a neutron flux of around <inline-formula> <tex-math>$1.5times 10{^{scriptscriptstyle {10}}}$ </tex-math></inline-formula> neutrons/cm<inline-formula> <tex-math>${^{scriptscriptstyle {2}}}~cdot $ </tex-math></inline-formula> s corresponding to an absorbed dose rate of 0.04 Gy(<inline-formula> <tex-math>$mathrm {mathbf {SiO_{2}}}$ </tex-math></inline-formula>)/s was used, which enabled reaching fluences as high as <inline-formula> <tex-math>$10{^{scriptscriptstyle {15}}}$ </tex-math></inline-formula> neutrons/cm<inline-formula> <tex-math>${}^{scriptscriptstyle {2}}$ </tex-math></inline-formula> (equivalent absorbed doses of 2.3 kGy(<inline-formula> <tex-math>$mathrm {mathbf {SiO_{2}}}$ </tex-math></inline-formula>) while maintaining the optical fibers at 77 K with a liquid nitrogen bath. A comparison was made between the radiation-induced attenuation (RIA) dynamics of standard (Ge-doped), photosensitive (high Ge-doped), and rad hard (F-doped and pure silica core) fibers. The effectiveness of four power levels (4.5, 1, 0.5, and 0.1 mW) of photobleaching light at 1050 nm at mitigating RIA at 1550 nm was also studied. The recovery of the fibers upon warm-up from 77 K to room temperature was recorded as well as a comparison between RIA of pristine fibers and pre-irradiated fibers.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2145-2153"},"PeriodicalIF":1.9,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Quantitative Analysis on Multi-Factor Coupling Influence Effects of Single Event Transient Characteristic Dependence of 22-nm FDSOI Circuits","authors":"Tongde Li;Yuanfu Zhao;Yongqin Zhu;Alessandro Paccagnella;Liang Wang;Yu Sun","doi":"10.1109/TNS.2025.3571475","DOIUrl":"https://doi.org/10.1109/TNS.2025.3571475","url":null,"abstract":"In this work, heavy-ion irradiation was performed for single-event transient (SET) characteristics research on characterization test chips designed in 22-nm fully depleted silicon-on-insulator (FDSOI) technology. SET pulsewidths were obtained under various designed conditions in order to reveal the coupling influence effects between factors, including layout style in particular the continuous active diffusion (CNRX) structure, supply voltage, circuit structure, drive strength, and linear energy transfer (LET) value. The contribution of the influencing factors is quantified. The results show that the stacked structure and higher drive strength are the prior factors to reduce the SET pulsewidth. The technology computer aided design (TCAD) 3-D-mode simulations were run to explore the influence of supply voltage on bipolar amplification and the voltage fluctuation in the output of the inverter. The research results can support the flexible selection of low-cost radiation hardened methods considering conventional performance. In addition, the influence of unique CNRX structure in the FDSOI technology on SET characteristics between inverter, <sc>NAND</small> gate, and <sc>NOR</small> gate was discussed.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2137-2144"},"PeriodicalIF":1.9,"publicationDate":"2025-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science publication information","authors":"","doi":"10.1109/TNS.2025.3548740","DOIUrl":"https://doi.org/10.1109/TNS.2025.3548740","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930345","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3549806","DOIUrl":"https://doi.org/10.1109/TNS.2025.3549806","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930343","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Parallelized Neutron Radiation Testing Technique to Understand Failures Within a Complex SoC","authors":"Jeffrey Goeders;Weston Smith;Maria Kastriotou;Michael Wirthlin","doi":"10.1109/TNS.2025.3551657","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551657","url":null,"abstract":"Complex system on chip (SoC) is increasingly used in embedded applications where both high computing performance and low power consumption are required. These devices are especially important in embedded environments where safety and reliability are critical, such as advanced driver assistance systems (ADASs) and space applications. The failure modes and failure rates of these devices due to single-event effects are not well understood, and methods for testing these devices are tedious and time-consuming. This work introduces a methodology for simultaneously testing multiple components of an SoC device. This methodology is used to evaluate the failure modes of several components within an AMD UltraScale+ multiprocessor SoC (MPSoC) device under neutron radiation. The results from two neutron beam tests are described and compared.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1059-1067"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Context-Dependent Outlier Detection Technique for Analysis of Single Event Frequency Transients in CMOS LC-Tank Oscillators","authors":"W. Rombouts;P. Karsmakers;G. Adom-Bamfi;S. Biereigel;J. Prinzie","doi":"10.1109/TNS.2025.3551881","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551881","url":null,"abstract":"This article presents a contextual outlier detection technique employing machine learning (ML) method to improve the quality of experimentally obtained data from heavy-ion irradiation campaigns. Artifacts arising from the experimental setup often compromise the integrity and representativeness of the measured data. These artifacts, also known as outliers, can be removed to ensure a consistent dataset that accurately represents the device under test (DUT). Due to the dynamic and variable nature of the DUT properties, outliers may manifest in various forms, rendering conventional outlier detection techniques inadequate. To address this challenge, we present a contextual outlier removal technique that incorporates spatial context by segmenting the tested area and using the isolation forest (iForest) algorithm for localized outlier detection. As a case study, this technique is applied to single-event frequency transient (SEFT) data obtained during heavy-ion microbeam irradiation of a planar spiral inductor within an integrated 65-nm CMOS LC-tank digitally controlled oscillator (DCO) circuit. A graphical side-by-side comparison demonstrates significant improvements in data quality, validated by a proposed metric that shows an average enhancement of <inline-formula> <tex-math>$4.4times $ </tex-math></inline-formula>.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1086-1093"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science publication information","authors":"","doi":"10.1109/TNS.2025.3549911","DOIUrl":"https://doi.org/10.1109/TNS.2025.3549911","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930350","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3548741","DOIUrl":"https://doi.org/10.1109/TNS.2025.3548741","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930342","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}