IEEE Transactions on Nuclear Science最新文献_第8页

A High-Compression-Ratio Channel-Multiplexing Method for Micropattern Gaseous Detectors 一种用于微图样气体探测器的高压缩比信道复用方法

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-31 DOI: 10.1109/TNS.2025.3537159

Yu Wang;Shubin Liu;Hao Zhuang;Zhengwu Ding;Zhihang Yao;Changqing Feng;Zhiyong Zhang

{"title":"A High-Compression-Ratio Channel-Multiplexing Method for Micropattern Gaseous Detectors","authors":"Yu Wang;Shubin Liu;Hao Zhuang;Zhengwu Ding;Zhihang Yao;Changqing Feng;Zhiyong Zhang","doi":"10.1109/TNS.2025.3537159","DOIUrl":"https://doi.org/10.1109/TNS.2025.3537159","url":null,"abstract":"The demand for a large number of readout channels has been a limiting factor for the application of micropattern gaseous detectors (MPGDs) in achieving higher spatial resolution and larger detection areas. This challenge is further compounded by issues related to system integration, power consumption, and cost efficiency. To address these challenges, this study proposes two novel multiplexing methods based on Eulerian circuits. Mathematical calculations indicate that with n electronic channels, up to <inline-formula> <tex-math>$n times (n-1)/2 - (n - 2)/2 + 1$ </tex-math></inline-formula> detector channels can be read out, where n is even. Three types of multiplexing circuits were designed, implemented, and tested in combination with micromesh gaseous structure (Micromegas) detectors. Experimental results demonstrate that for a multiplexing circuit with a factor of 8, the spatial resolution remains comparable to the direct readout method, while achieving a detection efficiency exceeding 94%. For a circuit with a multiplexing factor of 16, although the spatial resolution shows a slight degradation, the detection efficiency remains above 93.6%. These results demonstrate that the proposed multiplexing methods can significantly reduce the number of readout channels while maintaining an acceptable level of spatial resolution and detection efficiency. These findings highlight the potential of the proposed multiplexing techniques for applications in fields requiring high-resolution and cost-effective detector systems, such as cosmic-ray muon imaging.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"765-772"},"PeriodicalIF":1.9,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design and Characterization of a Radiation-Tolerant Wireless Physical Layer for Control Applications in CERN Particle Accelerators 欧洲核子研究中心粒子加速器控制应用的耐辐射无线物理层设计与特性分析

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-30 DOI: 10.1109/TNS.2025.3537402

Antonio Scialdone;Rudy Ferraro;Salvatore Danzeca;Frederic Saigne;Jérôme Boch;Luigi Dilillo;Alessandro Masi

{"title":"Design and Characterization of a Radiation-Tolerant Wireless Physical Layer for Control Applications in CERN Particle Accelerators","authors":"Antonio Scialdone;Rudy Ferraro;Salvatore Danzeca;Frederic Saigne;Jérôme Boch;Luigi Dilillo;Alessandro Masi","doi":"10.1109/TNS.2025.3537402","DOIUrl":"https://doi.org/10.1109/TNS.2025.3537402","url":null,"abstract":"The article explores the design and radiation characterization of a wireless physical layer (PHY) specifically tailored for equipment control in harsh radiation environments, such as those in particle accelerators like the large hadron collider (LHC). The PHY, built with commercial-off-the-shelf (COTS), leverages a software-defined radio (SDR), which, compared to dedicated transceivers, provides more flexibility and enables enhanced reliability through mitigation techniques. It is designed for low latency to meet the sampling time requirements of current LHC control applications. The PHY is developed to be radiation-tolerant, capable of withstanding the LHC radiation environment. The article presents the radiation characterization of all system components using a 200-MeV proton beam. Experimental results show the link’s robustness against total ionizing dose (TID) and single-event effects (SEEs), with no performance degradation due to SEEs and tolerance up to kGy of dose. Radiation-induced link losses were observed, and strategies to enhance link reliability were discussed.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1068-1076"},"PeriodicalIF":1.9,"publicationDate":"2025-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10858761","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Waveform-Sampling Front-End ASIC for 3-D Position-Sensitive Detectors 用于三维位置敏感探测器的波形采样前端ASIC

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-29 DOI: 10.1109/TNS.2025.3536220

Gianluigi De Geronimo;Yuefeng Zhu;James E. Berry;Zhong He

引用次数: 0

Integration of Hardware Acceleration Techniques in a Real-Time Framework Using FPGA Devices 硬件加速技术在FPGA实时框架中的集成

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-28 DOI: 10.1109/TNS.2025.3534905

C. González;M. Ruiz;J. Nieto;A. Carpeño;A. Piñas;V. Costa;E. Barrera;G. Arranz;W. Lee;T. Tak;A. Zagar

{"title":"Integration of Hardware Acceleration Techniques in a Real-Time Framework Using FPGA Devices","authors":"C. González;M. Ruiz;J. Nieto;A. Carpeño;A. Piñas;V. Costa;E. Barrera;G. Arranz;W. Lee;T. Tak;A. Zagar","doi":"10.1109/TNS.2025.3534905","DOIUrl":"https://doi.org/10.1109/TNS.2025.3534905","url":null,"abstract":"The ITER International Fusion Experiment Organization is implementing the real-time framework (RTF) to facilitate the development, deployment, and execution of instrumentation and control (I&C) applications optimized for real-time performance using the GNU/Linux-based ITER CODAC Core System (CCS) software distribution. This contribution examines the feasibility of using hardware acceleration techniques with field-programmable gate arrays (FPGAs) to implement real-time applications in the RTF that requires specific compute-intensive functions. By combining the use of languages such as high-level synthesis (HLS) and open computing language (OpenCL) with FPGA devices, specific hardware architectures can be implemented to solve certain computational problems to gain performance and limit latency. This work shows the methodology used to integrate HLS and OpenCL in the ITER CCS and the results obtained in terms of execution time for two common processing operations, vector addition and matrix multiplication, using a commercial off-the-shelf FPGA-based device.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"273-279"},"PeriodicalIF":1.9,"publicationDate":"2025-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10855802","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Investigation on Radiation Effects of White Neutron Source on COTS Solid-State Drives 白色中子源对COTS固态硬盘辐射效应的研究

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-27 DOI: 10.1109/TNS.2025.3535502

Tian Yu;Yingqi Ma;Xiaoheng Xu;Xiang Zhu;Longlong Zhang;Jieyi Wang;Jianwei Han

引用次数: 0

Neutron Yield of Thermo Scientific P385 D–T Neutron Generator Versus Current and Voltage Thermo Scientific P385 D-T中子发生器的中子产率与电流和电压的关系

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-27 DOI: 10.1109/TNS.2025.3534627

Jihye Jeon;Robert J. Goldston;Erik P. Gilson

{"title":"Neutron Yield of Thermo Scientific P385 D–T Neutron Generator Versus Current and Voltage","authors":"Jihye Jeon;Robert J. Goldston;Erik P. Gilson","doi":"10.1109/TNS.2025.3534627","DOIUrl":"https://doi.org/10.1109/TNS.2025.3534627","url":null,"abstract":"The Thermo Scientific P385 Neutron Generator is a compact neutron source, producing 14-MeV neutrons through the deuterium-tritium (D-T) fusion reaction. It is important to measure and understand the dependence of the neutron production rate on the accelerator current and voltage. In this study, we evaluated neutron production with an absolutely calibrated liquid scintillator neutron spectrometer (BTI N-Probe), an absolutely calibrated He-3 detector surrounded by high-density polyethylene (HDPE) shells [Detec nested neutron spectrometer (NNS)], and two uncalibrated zinc sulfide (ZnS) fast neutron scintillators (EJ-410), for both A3082 and A3083 sealed tubes. We also modeled the neutron yield using the Transport of Ions in Matter (TRIM) code, which calculates the trajectory and the energy loss of deuterons and tritons in the target. Experimental results showed an essentially linear dependence on the beam current, as expected. A <inline-formula> <tex-math>$3.59~pm ~0.08$ </tex-math></inline-formula> power law dependence on the operating voltage was measured, in effective agreement with the modeled value of 3.5. A series of absolute NNS and N-Probe measurements, matched against Monte Carlo N-Particle (MCNP) calculations, showed that the A3083 and A3082 tubes provide a maximum neutron yield of <inline-formula> <tex-math>$ 8.2 times 10^{8}$ </tex-math></inline-formula> and <inline-formula> <tex-math>$4.7 times 10^{8}$ </tex-math></inline-formula> n/s, respectively, with an estimated uncertainty of ±10%. We showed, through modeling, that tritium decay is not a significant consideration for tubes, such as these, with lifetimes of less than ten years.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"919-924"},"PeriodicalIF":1.9,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

High Holding Voltage SCR Devices With 150-krad(Si) TID Irradiation Tolerance for ESD Protection 具有150克拉（Si） TID辐照容限的ESD保护高保持电压可控硅器件

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-23 DOI: 10.1109/TNS.2025.3533214

Yujie Liu;Xiaonian Liu;Xiangliang Jin

{"title":"High Holding Voltage SCR Devices With 150-krad(Si) TID Irradiation Tolerance for ESD Protection","authors":"Yujie Liu;Xiaonian Liu;Xiangliang Jin","doi":"10.1109/TNS.2025.3533214","DOIUrl":"https://doi.org/10.1109/TNS.2025.3533214","url":null,"abstract":"In high-voltage (HV) integrated circuits (ICs), electrostatic discharge (ESD) has long been a critical reliability issue, particularly in space applications operating in radiation environments. The impact of ionizing radiation on the electrical characteristics of ESD protection devices cannot be overstated. This article investigates high holding voltage silicon-controlled rectifier (HHVSCR) devices using technology computer-aided design (TCAD) and transmission line pulse (TLP) testing systems. The HHVSCR is fabricated using 0.18-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula> m bipolar-CMOS-[double-diffused metal-oxide-semiconductor (DMOS)] (BCD) technology. TLP test results indicate a holding voltage of 20.73 V for the HHVSCR, with a human body model (HBM) protection level of 19 kV. Additionally, <inline-formula> <tex-math>$gamma $ </tex-math></inline-formula>-ray irradiation experiments demonstrate minimal degradation in ESD performance for the HHVSCR even under total-ionizing-dose (TID) irradiation of 150 krad(Si), maintaining leakage current at nA levels. Compared to existing HV ESD protection devices, the HHVSCR offers superior area efficiency, high TID tolerance, and strong latchup immunity for 12-V ICs. These features make it an excellent candidate for HV ESD protection in space applications.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"816-824"},"PeriodicalIF":1.9,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143638000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Prototype of Hi’Beam-SEE: A Real-Time High-Resolution Single-Event Effects Locating Device for Heavy-Ion Facilities Hi 'Beam-SEE原型：用于重离子设施的实时高分辨率单事件效应定位装置

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-23 DOI: 10.1109/TNS.2025.3533042

Jianwei Liao;Yanhao Jia;Shun Liao;Jiangyong Du;Haibo Yang;Ju Huang;Honglin Zhang;Xianglun Wei;Peixiong Zhao;Xianqin Li;Xiaoyang Niu;Weijia Han;Rui He;Chaojie Zou;Wenchao Sun;Xiangwei Peng;Chengxin Zhao

{"title":"Prototype of Hi’Beam-SEE: A Real-Time High-Resolution Single-Event Effects Locating Device for Heavy-Ion Facilities","authors":"Jianwei Liao;Yanhao Jia;Shun Liao;Jiangyong Du;Haibo Yang;Ju Huang;Honglin Zhang;Xianglun Wei;Peixiong Zhao;Xianqin Li;Xiaoyang Niu;Weijia Han;Rui He;Chaojie Zou;Wenchao Sun;Xiangwei Peng;Chengxin Zhao","doi":"10.1109/TNS.2025.3533042","DOIUrl":"https://doi.org/10.1109/TNS.2025.3533042","url":null,"abstract":"Integrated circuits (ICs) are widely used in spacecraft and are concerned with the probability of single-event effects (SEEs). To accurately locate the SEE-sensitive area of ICs, we have designed Hi’Beam-SEE for the SEE experiment terminal at heavy-ion facilities. The Hi’Beam-SEE consists of three subsystems: the heavy-ion positioning system (HIP) is responsible for locating the position of each particle in the beam, the single-event detection (SED) system detects the SEEs that occurred in the device under test (DUT), and the online tracking algorithm extracts and reconstructs the position of each particle that triggers SEEs. The beam test with <inline-formula> <tex-math>$^{84}text {Kr}^{18+}$ </tex-math></inline-formula> particles demonstrates that the HIP can achieve a spatial resolution of <inline-formula> <tex-math>$4~mu mathrm {m}$ </tex-math></inline-formula> in measuring every single particle’s position. Also, the SED system can identify SEEs correctly and issue triggers with good timing accuracy. The online tracking algorithm can process 172 frames that contain tracks per second and extract the positions with an accuracy of <inline-formula> <tex-math>$3.2~mu mathrm {m}$ </tex-math></inline-formula>. In addition, it attains a rejection factor of 93.6% while keeping the signal efficiency of 99%. This article will discuss the design and performance characterization of the Hi’Beam-SEE.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"684-691"},"PeriodicalIF":1.9,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

2024 Index IEEE Transactions on Nuclear Science Vol. 71 核科学学报，第71卷

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-23 DOI: 10.1109/TNS.2025.3533397

引用次数: 0

A Framework for Determining System-Level SEE Vulnerabilities in Wireless RF Receivers 确定无线射频接收器系统级SEE漏洞的框架

IF 1.9 3区工程技术

IEEE Transactions on Nuclear Science Pub Date : 2025-01-23 DOI: 10.1109/TNS.2025.3533369

Jeffrey W. Teng;Zachary R. Brumbach;Delwyn G. Sam;Justin P. Heimerl;Brett L. Ringel;Jackson P. Moody;Nelson E. Sepúlveda-Ramos;Adrian Ildefonso;Ani Khachatrian;Dale McMorrow;Linda Del Castillo;Mohammad M. Mojarradi;Benjamin J. Blalock;John D. Cressler

{"title":"A Framework for Determining System-Level SEE Vulnerabilities in Wireless RF Receivers","authors":"Jeffrey W. Teng;Zachary R. Brumbach;Delwyn G. Sam;Justin P. Heimerl;Brett L. Ringel;Jackson P. Moody;Nelson E. Sepúlveda-Ramos;Adrian Ildefonso;Ani Khachatrian;Dale McMorrow;Linda Del Castillo;Mohammad M. Mojarradi;Benjamin J. Blalock;John D. Cressler","doi":"10.1109/TNS.2025.3533369","DOIUrl":"https://doi.org/10.1109/TNS.2025.3533369","url":null,"abstract":"Space-borne wireless communications systems have become ubiquitous with the advent of commercial space flight. To support robust wireless data transmission in Earth-orbiting and deep-space applications, a framework has been developed for radio frequency (RF) designers and radiation-effects engineers to identify, model, visualize, and test single-event effects (SEEs) in wireless receivers. Digital RF communications receivers are introduced, including the constellation diagram, an important visualization tool. Then, the generation of single-event transients (SETs) is presented in multiple layers, starting from transistors, building to SETs at the outputs of each circuit block, and culminating in the response of the full receiver system. Circuit blocks addressed in this work include a low-noise amplifier (LNA), a downconversion mixer, and a voltage-controlled oscillator (VCO). Analytical theory and numerical simulation are synthesized, accompanied by pulsed-laser SEE testing, to give an understanding of how deposited charges in constituent transistors convert to SETs and single-event upsets (SEUs). As an example case, a SiGe-BiCMOS direct-conversion receiver carrying 100-Mbaud quadrature phase shift keying (QPSK) at the X-band (8–12 GHz) is characterized using pulsed-laser SEE testing. This manuscript provides a useful review and analytical template that enable future designers and radiation-effects engineers to: 1) model SET propagation in a wireless receiver a priori, without testing full systems; 2) identify the SEE mechanisms present in a wireless receiver with knowledge of the circuit components present; and 3) determine sensitive transistors and circuits to develop informed test plans for worst case predictions.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"825-847"},"PeriodicalIF":1.9,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0