质子辐照下提高三维NAND闪存位可靠性的电荷阱层增压

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Nuclear Science Pub Date : 2025-03-13 DOI:10.1109/TNS.2025.3549487

Matthew L. Breeding;Antonio E. Teijeiro;David Hughart;Joshua Young;Dolores A. Black;Jeffrey D. Black;Edward P. Wilcox

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引用次数: 0

摘要

在质子辐照下，176层电荷阱（CT）三维nand器件的单事件扰动（SEU）截面减小，因为在连续进行多次写入操作时，没有典型的写前擦除。在多个数据模式以及单级单元（SLC）和三级单元（TLC）操作模式中都可以观察到这种效应。本文讨论了大尺寸三维器件在使用和不使用重写的情况下的SEU截面计算方法，并提出了对长期耐久性影响的潜在影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation

Single-event upset (SEU) cross sections are reduced in 176-layer charge trap (CT) 3-D nand devices under proton irradiation when multiple write operations are applied sequentially without the typical erase-before-write. This effect is observed for multiple data patterns and in both single-level cell (SLC) and triple-level cell (TLC) operating modes. SEU cross section calculation methodologies are discussed for highly scaled 3-D devices both with and without the application of rewrites, and potential implications for long-term endurance effects are proposed.

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来源期刊

IEEE Transactions on Nuclear Science 工程技术-工程：电子与电气

CiteScore

3.70

自引率

27.80%

发文量

314

审稿时长

6.2 months

期刊介绍： The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years. The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.