{"title":"Model-based design - Model misbehaviour","authors":"A. Cothard","doi":"10.1049/ESS:20060607","DOIUrl":"https://doi.org/10.1049/ESS:20060607","url":null,"abstract":"","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123527326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interview - Flash flood","authors":"M. Durcan","doi":"10.1049/ess:20060610","DOIUrl":"https://doi.org/10.1049/ess:20060610","url":null,"abstract":"","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122894741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Software protection - Putting COTS back in the box","authors":"P. Parkinson, L. Kinnan","doi":"10.1049/ESS:20060604","DOIUrl":"https://doi.org/10.1049/ESS:20060604","url":null,"abstract":"Off-the-shelf software is now a part of avionics design. But how do you stop third-party code from upsetting other parts of the system? Standards call for it to be boxed off. The avionics industry has witnessed a major shift toward integrated modular avionics (IMA) in recent years, and IMA architectures and standards are still evolving as they gain industry acceptance. This presents significant challenges for standards organisations, OEMs and commercial vendors alike. However it is clear that standards-based architectures, such as ARINC 653, will provide greater flexibility and portability and enable existing federated applications to be reused in an IMA environment.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116974877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Radiation damage - Neutron time bomb","authors":"Rodri Jones, A. Chugg","doi":"10.1049/ESS:20060605","DOIUrl":"https://doi.org/10.1049/ESS:20060605","url":null,"abstract":"Hardware errors and failures caused by radiation are becoming significant threats to a growing range of systems. Electronics manufacturers and the engineering industry have been investing more and more in research into single-event effects in recent years in order to determine the impact on system reliability today and in the future, but there is still much work to be done. For high-reliability applications, single-event effect consideration and mitigation at the design phase has become increasingly important, and with the continuing trends in technology miniaturisation, such considerations are likely to become more important in the future.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116801559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Hardware debug - Data overload","authors":"G. Bakewell","doi":"10.1049/ESS:20060602","DOIUrl":"https://doi.org/10.1049/ESS:20060602","url":null,"abstract":"Hardware debug on today's embedded platforms means dealing with huge quantities of raw data and complex architectures. Modelling and transaction-level techniques can make sense of it all. Embedded platforms drive the debug process to a new level of complexity as the process has to take in greater team diversification, significant functional complexity and an expanding range of methodologies. Some effort up front to understand debug needs and tailor the methodology appropriately can accelerate the overall design flow later in the development process.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121240891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lifetime procurement - Look deep for dependability","authors":"L. Francis","doi":"10.1049/ESS:20060603","DOIUrl":"https://doi.org/10.1049/ESS:20060603","url":null,"abstract":"It is difficult to avoid using commercial off-the-shelf hardware in military systems. You need to have plans in place to make sure the components will suit long lifetimes and high-reliability environments. The military and aerospace communities now regard the use of commercial off-the-shelf (COTS) equipment as commonplace. The shift to use ready-made hardware and software encompasses not just individual components but, sometimes, entire sub-assemblies. The impact of this change is already evident, particularly in terms of obsolescence: projects with development phases that last up to 20 years and in-service lifetimes of 40 years are being built using components with lifecycles that are, in some cases, measured in months. The scale of the problem is illustrated by recent estimates suggesting that electronic components are now going obsolete at a rate of more than 13,000 per month. The effects in terms of reliability, although important, are less clear, simply because insufficient in-service data currently exists to assess real failure rates and lifetimes. Against this background, military and aerospace engineers need to ensure the reliability safety integrity and lifetime of their designs. In particular, whole-life component management planning is essential to ensure adequate supplies of fit-for-purpose components and subassemblies throughout the lifecycle, from concept, assessment, development, manufacture and in-service life through to disposal.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121812017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analogue design - Notes are not enough","authors":"D. O'Riordan","doi":"10.1049/ESS:20060601","DOIUrl":"https://doi.org/10.1049/ESS:20060601","url":null,"abstract":"Analogue designers need to make greater use of constraints management to avoid making mistakes as they deal with higher-complexity systems. Faced with shrinking feature sizes and increased densities, analogue designers are forced more and more to rely on layout craft and specialised place-and-route techniques to meet design specifications and minimise second-order parasitic effects. Modern design-rule-checking (DRC) rule decks are insufficient by themselves in terms of guaranteeing manufacturability. Traditionally, analogue designers have solved this problem by engaging in some form of design-intent dialogue or communication with the back-end mask designers responsible for layout.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133663796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Roadmap - Touch times ahead as technology gap widens","authors":"L. Collins","doi":"10.1049/ESS:20060611","DOIUrl":"https://doi.org/10.1049/ESS:20060611","url":null,"abstract":"Logic designers may have to become even more intimate with the vagaries of manufacturing processes unless new techniques are found, claims researchers.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130456763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Paying for protection","authors":"C. Edwards","doi":"10.1049/ESS:20060210","DOIUrl":"https://doi.org/10.1049/ESS:20060210","url":null,"abstract":"Legal offerings are now backing up technology in the fight for embedded systems software slots.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126265489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Silicon on the rack","authors":"C. Edwards","doi":"10.1049/ESS:20060207","DOIUrl":"https://doi.org/10.1049/ESS:20060207","url":null,"abstract":"In the latest processes, it is normal for silicon to be stretched, strained and compressed as process engineers use ever more exotic ways of bending the silicon lattice to get more electron mobility out of transistors. This work could eventually lead to a new generation of hybrid devices that see silicon pushed out of the way altogether.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123596820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
求助内容：
应助结果提醒方式：