{"title":"Flash new laws [NAND flash memory circuits]","authors":"C. Edwards","doi":"10.1049/ESS:20070601","DOIUrl":"https://doi.org/10.1049/ESS:20070601","url":null,"abstract":"The rapid growth in NAND flash capacity has made it possible to store hundreds of thousands of images from high-end digital still cameras. But the most recent increases in claimed capacity are coming at the expense of increased die size. The Samsung 64 Gb NAND flash memory was built using a technique called self-aligned double-patterning in an attempt to overcome problems with defining on-chip features as small as 30 nm across using light with a wavelength more than six times longer than that. Double patterning works by using two complementary masks exposed one at a time to ease the demands on lithography. In effect, two patterns spaced at 60 nm are overlapped to produce the 30 nm features. Double-patterning slows down the lithography process and restricts what can be printed, making it unpopular among logic users. But it may be viable for bulk memory production as those designs are far more regular.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124812672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Where did all the money go? [integrated circuit economics]","authors":"C. Evans-Pughe","doi":"10.1049/ESS:20070603","DOIUrl":"https://doi.org/10.1049/ESS:20070603","url":null,"abstract":"The author talks about the economic state of semiconductor industry. The paper also presented views, from a semiconductor industry's chief economist, of the future profitability of this industry by developing a clever marketing plan through the development of consumer electronics and other high technology applications.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116512992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Uncertain future [Semiconductor design]","authors":"C. Edwards","doi":"10.1049/ESS:20070607","DOIUrl":"https://doi.org/10.1049/ESS:20070607","url":null,"abstract":"","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130886364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cook up better code [Software code optimisation]","authors":"J. Dahlin","doi":"10.1049/ESS:20070606","DOIUrl":"https://doi.org/10.1049/ESS:20070606","url":null,"abstract":"Source code not going down well with the compiler? You may need a different recipe. The way source code is written can determine how well the optimiser can digest it and produce software that runs quickly.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"163 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115583283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"What you can't see can hurt you [oscilloscope]","authors":"P. Stearns","doi":"10.1049/ESS:20070609","DOIUrl":"https://doi.org/10.1049/ESS:20070609","url":null,"abstract":"Engineers live in fear of the unknown. Any problem or trade-off, if adequately managed, can be mitigated by the engineer's skill. The problems that you don't see - which may be intermittent signal anomalies, such as glitches - become increasingly expensive as they propagate to quality testing, manufacturing or to your customers. A fast update rate -a frequently misunderstood characteristic -is critical to your oscilloscope's ability to display these problems. How an oscilloscope captures and displays signals can make a big difference to your ability to track down glitches.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130720654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cut the cord - Wireless USB","authors":"L. Collins","doi":"10.1049/ESS:20070610","DOIUrl":"https://doi.org/10.1049/ESS:20070610","url":null,"abstract":"The universal serial bus (USB) is a phenomenally successful connection standard. Although its arrival on PCs was not accompanied by working drivers, once the key operating systems had been updated, it rapidly replaced clunky D-type serial connectors and unwieldy parallel printer cables, and has now spread to almost everything you can connect to a computer, from digital cameras to novelty office rocket launchers. USB will add wireless and higher speed variants if standards makers can overcome some tricky issues.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114869559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power squeeze [Portable system energy budget]","authors":"R. Forsyth","doi":"10.1049/ESS:20070505","DOIUrl":"https://doi.org/10.1049/ESS:20070505","url":null,"abstract":"Careful thought is needed to design portable systems that have a strong mixed-signal component. The need to power a system purely from batteries puts severe constraints on the design in terms of energy consumption. We are seeing more portable systems appear, particularly in the medical, industrial and consumer markets. Cost and size considerations mean they often need custom silicon designing for them. But there are different trade-offs needed depending on where the bulk of the energy is consumed. For energy efficient designs, it is important to calculate the energy budget of a system including internal and external power dissipation, and also to consider the energy budget summed over the full operating cycle or lifetime.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128750060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Skin deep [Terahertz radiation for medical applications]","authors":"C. Edwards","doi":"10.1049/ESS:20070500","DOIUrl":"https://doi.org/10.1049/ESS:20070500","url":null,"abstract":"Terahertz radiation has the potential to spot explosives, drugs and cancers. It could be useful for medical applications but, as the body contains a large percentage of water, it cannot diagnose many forms of cancer. But it seems to be good at picking out the extent of tumours under the surface of the skin that are invisible under visible light. It is concluded that terahertz radiation is slowly emerging as a technique that can open up new applications.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123731389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis: Let's stick together","authors":"C. Edwards","doi":"10.1049/ESS:20070405","DOIUrl":"https://doi.org/10.1049/ESS:20070405","url":null,"abstract":"Until recently, CMOS and RF looked as though they would follow separate paths when it came to chip design. Chris Edwards looks at how teams are now looking seriously at combining them on the latest wave of digital silicon processes.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127031956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis: Looking for the one way to multicore debug","authors":"C. Edwards","doi":"10.1049/ESS:20070303","DOIUrl":"https://doi.org/10.1049/ESS:20070303","url":null,"abstract":"The rise of multicore embedded processors is seeing many standards groups trying to work out how to get debuggers to work together.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122434169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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