Xiaoxiao Kong;Chong Zhang;H. S. Du;H. Miyake;Y. Tanaka;Boxue Du
{"title":"Effects of Thermo-Oxidative Aging on the Dielectric Property and Electrical Breakdown of Epoxy Resin Using in High-Voltage Equipment","authors":"Xiaoxiao Kong;Chong Zhang;H. S. Du;H. Miyake;Y. Tanaka;Boxue Du","doi":"10.1109/TDEI.2024.3501997","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3501997","url":null,"abstract":"In this article, the effects of thermo-oxidative aging on the dielectric properties of epoxy resin are investigated at 180 °C under different durations. In the early stage of aging (0–168 h), the dielectric properties of epoxy resin are slightly improved, which are characterized by the reduction of dielectric loss and conductivity and the slightly enhancement of breakdown strength. These are attributed to the molecular rearrangement and postcuring reactions inside the epoxy resin, as evidenced by the improved glass transition temperature. With the continuous increase of thermal aging time, oxidative decomposition and scission reactions start to dominate. The cross-linked network of epoxy resin is gradually destroyed, leading to the increase of carrier quantity and the reduction of trap energy level and density. The dielectric polarization and charge injection are intensified, while the partial discharge initiation voltage (PDIV) and breakdown strength are decreased significantly. After aging for 1440 h, the conductivity could be increased by 59.64%, and the breakdown strength is decreased by 18.14%. The insulation performance of epoxy resin is determined by the competition results of the molecular rearrangement, postcuring, and oxidative cleavage reactions during thermal aging, which could provide a theoretical basis for the aging assessment of epoxy resin for high-voltage applications.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"254-262"},"PeriodicalIF":2.9,"publicationDate":"2024-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hao Liu;Wei-Xing Han;Zhen-Xing Fan;Ji-Hang Sun;Wei-Qi Qin;Xiang-Dong Liao;Si-Han Wang;Guo-Ming Ma
{"title":"Acoustic Emission and Propagation Characteristics of Metal Particles in GIS","authors":"Hao Liu;Wei-Xing Han;Zhen-Xing Fan;Ji-Hang Sun;Wei-Qi Qin;Xiang-Dong Liao;Si-Han Wang;Guo-Ming Ma","doi":"10.1109/TDEI.2024.3499895","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3499895","url":null,"abstract":"Metal particle pollution was one of the significant factors that endangered the reliability of the gas-insulated switchgears (GISs). The detection of metal particles in GIS was crucial for ensuring the safe operation of GIS. This article established a calculation model for the cut-off frequency of acoustic emission (AE) generated by the metal particle collision with the GIS enclosure. The effects of metal particle materials, the Gaussian equivalent radius, and the bounce heights on the cut-off frequency of the AE signal were obtained. Through the AE measurement experiments of metal particle colliding with an aluminum plate, the accuracy of the cut-off frequency calculation model was verified. Besides, the experiment confirmed that the propagation mode of the AE signal on GIS enclosure was primarily the S0 mode Lamb wave. The attenuation of the AE signal was analyzed. The geometric attenuation and the energy loss attenuation were determined as the primary attenuation processes. A calculation model for the attenuation of AE signal was established. Based on this, the variation of the cut-off frequency after propagation on the GIS enclosure was clarified. The AE and propagation characteristic proposed in this article provided guidance for optimizing the frequency band of ultrasonic sensors and setting up the measurement points.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"20-27"},"PeriodicalIF":2.9,"publicationDate":"2024-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Molecular Thermodynamic Evaluation of Various Cu-Doped ZIF-8 Ratios for SF6 Catalysis","authors":"Fuping Zeng;Kexin Zhu;Langlang Lv;Guangzhi Chen;Hua Jiang;Zichun Xue;Ju Tang","doi":"10.1109/TDEI.2024.3495588","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3495588","url":null,"abstract":"SF6 is a greenhouse gas with strong greenhouse effect. How to rationally deal with waste SF6 has become an extensive research topic for scholars at home and abroad. Studies have shown that ZIF-8 has certain superiority as a catalyst, while metal doping in ZIF-8 may promote its catalytic ability. In this article, the undoped ZIF-8 model and the Cu-doped ZIF-8 model (Zn:Cu =1:5; Zn:Cu =3:3) were constructed, and the most stable adsorption structures of SF6 at three typical sites were obtained based on density-functional theory (DFT), with the 6-membered ring (6MR) window as the optimal adsorption site. The stable adsorption energy was the largest in the Zn:Cu =5:1 doped model (−98.352 kcal/mol), and during the adsorption process, the SF6 molecular bond lengths changed most drastically, and even the bond breaking phenomenon appeared. The catalytic ability of the Zn:Cu =3:3 doping model was in between that of the ZIF-8 and Zn:Cu =1:5 doping models. The results of the Mulliken charge transfer and the HOMO-LUMO energy level showed that in the Zn:Cu =5:1 doping model, the Cu atom can both transfer a large number of electrons (−0.606 e) to SF6 and enhance the ability of Zn atoms to lose electrons, effectively weakening the S-F bond strength of SF6 gas molecules and thus promoting SF6 gas molecule catalysis. The highest occupied molecular orbital (HOMO) wave function in the system is mainly distributed around the doped Cu atoms, the energy gap is significantly reduced, and the catalyst reactivity is enhanced.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"408-415"},"PeriodicalIF":2.9,"publicationDate":"2024-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Electric and Stress Field-Driven Electrical Tree Growth Model","authors":"Kang He;Jiahong He;Yijun Zhou;Bingtuan Gao","doi":"10.1109/TDEI.2024.3489593","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3489593","url":null,"abstract":"Electrical trees have different shapes and growth rates under different voltage conditions. This article proposes an electric and stress field-driven electrical tree simulation model. The stress field describes the gas expansion of the partial discharge (PD) process. This model introduces the driving energy to determine the tree shape according to multiphysical fields instead of controlling the tree shape manually by artificial parameters. The electrical tree simulations and experiments were carried out to analyze the electric and stress field distributions under 11- and 15-kV voltages. The tree under 11 kV is branch-shaped (fractal dimension = 1.33), with the electric and stress fields concentrated at the tree tips. Meanwhile, a significant densification effect of the electric field replaces the concentration effect and causes a bush-shaped tree (fractal dimension = 1.72) under 15 kV. The tree-driving energy during tree growth under 15 kV constantly decreases faster than 11 kV. Consequently, the tree length under 15 kV is 69% shorter than 11 kV due to the decrement of the driving effect of the stress field. The proposed model explains the geometric shapes and growth rates of electrical trees under different voltages.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"742-750"},"PeriodicalIF":2.9,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143761409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Insulation Failure Mechanism of Polyimide Under High-Frequency Electrical Stress: A Synergistic Analysis of Aging Experiments and Molecular Dynamics Simulations","authors":"Yiwei Wang;Huangkuan Xu;Bilal Iqbal Ayubi;Shengrui Zhou;Li Zhang","doi":"10.1109/TDEI.2024.3489602","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3489602","url":null,"abstract":"Polyimide (PI), an insulating material extensively employed in high-frequency power transformers, encounters accelerated insulation deterioration under high-frequency electrical stress. This study elucidates the insulation failure process of PI under high-frequency electrical stress by employing a combined approach of aging experiments and reactive force field molecular dynamics (ReaxFF MDs) simulation, with scanning electron microscopy (SEM) analysis and Fourier transform infrared spectroscopy (FTIR) used. The investigation reveals that the primary causes of PI insulation failure are partial discharge (PD) erosion and electrothermal aging. PD progressively erodes the PI surface, with the erosion intensity initially intensifying before diminishing over the material’s lifespan. The synergistic impact of electrothermal stress instigates the fracture of various chemical bonds within PI molecules. These include the C-H and C-N bonds in the imide ring and C-C bonds connecting the imide structure to the benzene ring, leading to the generation of gaseous byproducts like CO and H2 O. Concurrently, the rupture of the C-O–C bond between the benzene ring and the disintegration of the imine ring result in the main chain’s fragmentation. This process leads to the continual degradation and recombination of molecular chains with varying polymerization degrees and a small hydrocarbon product C2 H2 is produced. The influence of electrical stress on PI’s molecular configuration manifests in the alteration of the electric dipole moment and the elongation of polar bonds, notably the C-N bond in the imine ring, which rapidly fractures under electric heating stress.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"246-253"},"PeriodicalIF":2.9,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Dampness Discrimination Method for MV Power Cable Joints Based on PDC Testing Under Thermal Excitation Conditions","authors":"Guangya Zhu;Zhaogui Liu;Songkun Pan;Pengfei Meng;Kai Zhou;Xinyi Wang;Qing Shen;Hao Zhou","doi":"10.1109/TDEI.2024.3487957","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487957","url":null,"abstract":"The penetration of moisture into power cable joints accelerates cable insulation degradation, ultimately leading to cable breakdowns and power outages. The determination of whether environmental moisture has penetrated an insulation interface and the discrimination of dampness status are, thus, significant tasks in cable operation, maintenance, and management. Therefore, a dampness discrimination method based on polarization and depolarization current (PDC) testing under thermal stimulation is presented here. Initially, a working principle of the PDC testing method for detecting moisture in cable joints is developed. Subsequently, a thorough description of the principle of dampness discrimination in cable joints is provided based on PDC testing under thermal stimulation. This analysis reveals that thermal stimulation may alter the phase state of water and the interface contact state between cross-linked polyethylene (XLPE) and silicone rubber (SiR), decreasing the conducting current of the cable. In addition, finite element simulations are employed to determine the parameters for the thermal stimulation methods. Finally, experimental results confirm the effectiveness of the proposed method in accurately identifying dampness defects in cable joints.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"581-588"},"PeriodicalIF":2.9,"publicationDate":"2024-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Progress in Nanodielectrics: Future From the Past Decade","authors":"Toshikatsu Tanaka","doi":"10.1109/TDEI.2024.3487813","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487813","url":null,"abstract":"Since the early 21st century, nanodielectrics have attracted significant attention. Initially regarded as exotic materials, they have since evolved into widely accessible advanced materials. Research has primarily focused on solid polymer nanocomposites and has recently expanded to include liquid nanocomposites, known as nanofluids. Over the past decade, considerable progress has been made in the field of nanodielectrics. To capture this progress, more than 400 papers published in the IEEE Transactions on Dielectrics and Electrical Insulation and IEEE Electrical Insulation Magazine between 2011 and 2023 have been collected and reviewed. The evaluation of host materials, guest nanoparticles, and their combinations has been carried out to identify those that deliver superior performance. Notable advances in microscopic studies of interphases and particle dispersions are highlighted. Applications in high-voltage (HV) equipment and power electronics devices are also referenced to promote further research in this area. In addition, it is important to recognize that machine learning (ML) plays a critical role in accelerating the research and development of nanodielectrics and their applications.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"102-116"},"PeriodicalIF":2.9,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition","authors":"Yaxiong Tan;Jiayi Gong;Shangding Li;Jian Li;Weigen Chen","doi":"10.1109/TDEI.2024.3487820","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487820","url":null,"abstract":"The current deep learning (DL) model for fault diagnosis of high-voltage circuit breakers (HVCBs) lacks explainability. It is difficult to further analyze the cause and mechanism of faults, which could provide little help for the maintenance and optimization design of HVCBs. To address this problem, a fault feature assessment method of HVCBs based on explainable image recognition is proposed to realize a quantitative analysis of faults. First, the vibration signals of HVCBs are preprocessed by continuous wavelet transform (CWT). The time-frequency diagrams of CWT are segmented by the travel curve to obtain the action sequence of the HVCB. Then, Shapley additive explanations (SHAPs) explain the deep residual network ResNet to obtain the feature importance distribution maps. Through the feature importance distribution map, accurate fault location and time traceability can be realized, and the frequency-domain features of the fault can be directly visualized from the distribution degree of the feature importance. The fault evaluation factor (FEF) is proposed to quantitatively study the time-frequency–amplitude comprehensive difference between the fault state and the normal state of the circuit breaker.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"92-101"},"PeriodicalIF":2.9,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Single Step Processing of an Integrated FGM BaTiO3-Ni Capacitor for Power Modules’ Assembly","authors":"Romain Raisson;Sophie Guillemet-Fritsch;Pascal Dufour;Paul-Etienne Vidal;Geoffroy Chevallier;Donatien Martineau;Cyrille Duchesne","doi":"10.1109/TDEI.2024.3486677","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3486677","url":null,"abstract":"The miniaturization of power electronic devices is pushing manufacturers to improve the multifunctionality of components. Obtaining new materials with heterogeneous electrical properties is a challenge. In this work, the objective is to prepare, in a single step processing, a ceramic capacitor, including a thick metallization. This device will be a first step toward its integration in a power module. The assembly of a metal and ceramics is a challenge due to the difference of properties of these materials. A new BaTiO3-Ni functionally graded material (FGM) has been obtained by spark plasma sintering (SPS) co-sintering. The processing parameters of the BaTiO3-Ni FGM are optimized to target highly dense material with controlled microstructure. In this case, a crack free device is obtained with controlled dielectric properties and can be integrated in a power module device. The processing leading to the fabrication of this FGM in one step can be used for other components in power electronics applications.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"887-894"},"PeriodicalIF":2.9,"publicationDate":"2024-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143761495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Juan D. Mina-Casaran;Belén García;Diego F. García;Ángel M. Gómez;Andrés Montero
{"title":"Partial Discharge Patterns in Natural Esters From Different Vegetable Bases","authors":"Juan D. Mina-Casaran;Belén García;Diego F. García;Ángel M. Gómez;Andrés Montero","doi":"10.1109/TDEI.2024.3486275","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3486275","url":null,"abstract":"Transformer insulation system is composed of solid and liquid insulation, working in conjunction for the safe, efficient, and optimal performance of the equipment. The condition of these two insulation components is closely related to the life expectancy of a transformer. Mineral oil (MO) has been widely used as transformer liquid insulation, although alternative liquids of vegetable base have begun to emerge. These alternative liquids offer advantageous physic-chemical properties, including dielectric performance evaluated through high-voltage tests. This article focuses on evaluating the partial discharge (PD) performance of four vegetable oils, comparing their properties with those of a transformer MO. The study was repeated for fresh samples and for samples with different aging degrees. PD tests were carried out in the lab using a needle-to-plane electrode system and two different test methods for applying the testing voltage. Four different interpretation criteria were used for determining the PD inception voltage (PDIV) value. Electrical parameters, such as PDIV, pulse repetition rate, and phase-resolved PD (PRPD), were measured for each oil sample. Additionally, other physic-chemical properties of the samples were measured. The results show that all the tested liquids presented a fair performance under PD, although significant differences were found between them. In some cases, as for the high-oleic sunflower-based natural ester (NE), the PDIV was found to be significantly larger than that of MO.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"435-443"},"PeriodicalIF":2.9,"publicationDate":"2024-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10734359","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}