发布求助
文献互助 智能选刊 最新文献

VLSI Design and Test for Systems Dependability最新文献

筛选
英文 中文
Wireless Interconnect in Electronic Systems 电子系统中的无线互连
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_21
T. Kuroda, Atsutake Kosuge
{"title":"Wireless Interconnect in Electronic Systems","authors":"T. Kuroda, Atsutake Kosuge","doi":"10.1007/978-4-431-56594-9_21","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_21","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123587707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Unknown Threats and Provisions 未知的威胁和条款
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_12
N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi
{"title":"Unknown Threats and Provisions","authors":"N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi","doi":"10.1007/978-4-431-56594-9_12","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_12","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"316 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116366369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Connectivity in Wireless Telecommunications 无线电讯的连通性
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_7
K. Tsubouchi, F. Adachi, S. Kameda, M. Motoyoshi, A. Taira, N. Suematsu, T. Takagi, H. Oguma, M. Fujishima, R. Inagaki, M. Tsuru, E. Taniguchi, H. Fukumoto, A. Matsuzawa, M. Miyahara, M. Iwata, F. Yamagata, N. Izuka
{"title":"Connectivity in Wireless Telecommunications","authors":"K. Tsubouchi, F. Adachi, S. Kameda, M. Motoyoshi, A. Taira, N. Suematsu, T. Takagi, H. Oguma, M. Fujishima, R. Inagaki, M. Tsuru, E. Taniguchi, H. Fukumoto, A. Matsuzawa, M. Miyahara, M. Iwata, F. Yamagata, N. Izuka","doi":"10.1007/978-4-431-56594-9_7","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_7","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125704669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Responsiveness and Timing 响应性和时机
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_9
T. Yoneda, Y. Nakabo, N. Yamasaki, Masayoshi Takasu, Masashi Imai, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi, K. Tsubouchi
{"title":"Responsiveness and Timing","authors":"T. Yoneda, Y. Nakabo, N. Yamasaki, Masayoshi Takasu, Masashi Imai, S. Kameda, H. Oguma, A. Taira, N. Suematsu, T. Takagi, K. Tsubouchi","doi":"10.1007/978-4-431-56594-9_9","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_9","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"7 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123730177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SRAM-Based Physical Unclonable Functions (PUFs) to Generate Signature Out of Silicon for Authentication and Encryption 基于sram的物理不可克隆函数(puf)生成硅外签名用于认证和加密
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_29
K. Nii
{"title":"SRAM-Based Physical Unclonable Functions (PUFs) to Generate Signature Out of Silicon for Authentication and Encryption","authors":"K. Nii","doi":"10.1007/978-4-431-56594-9_29","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_29","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"15 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120871120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DART—A Concept of In-field Testing for Enhancing System Dependability 提高系统可靠性的现场测试概念
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_16
K. Hatayama, S. Kajihara, T. Yoneda, Yuta Yamato, M. Inoue, Yasuo Sato, Y. Miura, S. Ohtake
{"title":"DART—A Concept of In-field Testing for Enhancing System Dependability","authors":"K. Hatayama, S. Kajihara, T. Yoneda, Yuta Yamato, M. Inoue, Yasuo Sato, Y. Miura, S. Ohtake","doi":"10.1007/978-4-431-56594-9_16","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_16","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"198 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114201809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space 可重构处理器作为嵌入式自动机在空间物联网传感器网络中的应用
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_27
H. Hihara, A. Iwasaki, M. Hashimoto, H. Ochi, Y. Mitsuyama, H. Onodera, H. Kanbara, K. Wakabayashi, T. Sugibayashi, Takashi Takenaka, H. Hada, M. Tada
{"title":"Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space","authors":"H. Hihara, A. Iwasaki, M. Hashimoto, H. Ochi, Y. Mitsuyama, H. Onodera, H. Kanbara, K. Wakabayashi, T. Sugibayashi, Takashi Takenaka, H. Hada, M. Tada","doi":"10.1007/978-4-431-56594-9_27","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_27","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114382933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design and Development of Electronic Systems for Quality and Dependability 电子系统质量与可靠性的设计与开发
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_2
S. Asai
{"title":"Design and Development of Electronic Systems for Quality and Dependability","authors":"S. Asai","doi":"10.1007/978-4-431-56594-9_2","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_2","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132770038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Network-on-Chip Based Multiple-Core Centralized ECUs for Safety-Critical Automotive Applications 基于片上网络的多核集中式ecu，用于安全关键型汽车应用
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_19
T. Yoneda, Masashi Imai, H. Saito, A. Mochizuki, T. Hanyu, Kenji Kise, Yuichi Nakamura
{"title":"Network-on-Chip Based Multiple-Core Centralized ECUs for Safety-Critical Automotive Applications","authors":"T. Yoneda, Masashi Imai, H. Saito, A. Mochizuki, T. Hanyu, Kenji Kise, Yuichi Nakamura","doi":"10.1007/978-4-431-56594-9_19","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_19","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123645673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems 虚拟化:汽车电子控制系统中SRAM错误的系统级故障仿真
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_15
S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto
{"title":"Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems","authors":"S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto","doi":"10.1007/978-4-431-56594-9_15","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_15","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123735556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信