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VLSI Design and Test for Systems Dependability最新文献

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Challenges and Opportunities in VLSI for Systems Dependability VLSI系统可靠性的挑战与机遇
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_1
S. Asai
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引用次数: 0
An FPGA Implementation of Comprehensive Security Functions for Systems-Level Authentication 系统级认证综合安全功能的FPGA实现
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_28
D. Suzuki, Koichi Shimizu, T. Fujino
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引用次数: 1
Electromagnetic Noises 电磁噪音
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_4
M. Nagata, N. Yamasaki, Yusuke Kumura, Shuma Hagiwara, M. Inaba
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引用次数: 0
Malicious Attacks on Electronic Systems and VLSIs for Security 针对电子系统和vlsi安全的恶意攻击
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_10
T. Fujino, D. Suzuki, Y. Hori, M. Shiozaki, M. Yoshikawa, T. Asai, Masayoshi Yoshimura
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引用次数: 0
Test Coverage 测试覆盖率
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_11
M. Fujita, K. Takayama, Takeshi Matsumoto, Kosuke Oshima, Satoshi Jo, M. Inoue, T. Yoneda, Yuta Yamato
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引用次数: 2
An On-chip Router Architecture for Dependable Multicore Processor 可靠多核处理器的片上路由器架构
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_20
Kenji Kise
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引用次数: 1
A 3D-VLSI Architecture for Future Automotive Visual Recognition 未来汽车视觉识别的3D-VLSI架构
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_26
M. Koyanagi, Hiroaki Kobayashi, T. Aoki, T. Sueyoshi, Tadashi Kamada
{"title":"A 3D-VLSI Architecture for Future Automotive Visual Recognition","authors":"M. Koyanagi, Hiroaki Kobayashi, T. Aoki, T. Sueyoshi, Tadashi Kamada","doi":"10.1007/978-4-431-56594-9_26","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_26","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133305906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Formal Verification and Debugging of VLSI Logic Design for Systems Dependability: Experiments and Evaluation VLSI逻辑设计对系统可靠性的形式化验证与调试:实验与评估
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_14
M. Fujita, Takeshi Matsumoto, A. M. Gharehbaghi, Kosuke Oshima, Satoshi Jo, Hiroaki Yoshida, Takashi Takenaka, K. Wakabayashi
{"title":"Formal Verification and Debugging of VLSI Logic Design for Systems Dependability: Experiments and Evaluation","authors":"M. Fujita, Takeshi Matsumoto, A. M. Gharehbaghi, Kosuke Oshima, Satoshi Jo, Hiroaki Yoshida, Takashi Takenaka, K. Wakabayashi","doi":"10.1007/978-4-431-56594-9_14","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_14","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129608542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Wireless Power Delivery Resilient Against Loading Variations 无线电力传输弹性负载变化
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_22
H. Ishikuro
{"title":"Wireless Power Delivery Resilient Against Loading Variations","authors":"H. Ishikuro","doi":"10.1007/978-4-431-56594-9_22","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_22","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125036478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radiation-Induced Soft Errors 辐射引起的软误差
VLSI Design and Test for Systems Dependability Pub Date : 2018-07-21 DOI: 10.1007/978-4-431-56594-9_3
E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, Kazutoshi Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, M. Sugihara
{"title":"Radiation-Induced Soft Errors","authors":"E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, Kazutoshi Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, M. Sugihara","doi":"10.1007/978-4-431-56594-9_3","DOIUrl":"https://doi.org/10.1007/978-4-431-56594-9_3","url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134093617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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