N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi
{"title":"Unknown Threats and Provisions","authors":"N. Kanekawa, T. Miyoshi, M. Fujita, Takeshi Matsumoto, Hiroaki Yoshida, Satoshi Jo, S. Kajihara, S. Ohtake, Masashi Imai, T. Yoneda, H. Takizawa, Ye Gao, Masayuki Sato, Ryusuke Egawa, Hiroaki Kobayashi","doi":"10.1007/978-4-431-56594-9_12","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"316 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design and Test for Systems Dependability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-4-431-56594-9_12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}