S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto
{"title":"Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems","authors":"S. Oho, Yasuhiro Ito, Y. Sugure, Y. Nakata, H. Kawaguchi, M. Yoshimoto","doi":"10.1007/978-4-431-56594-9_15","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":127041,"journal":{"name":"VLSI Design and Test for Systems Dependability","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design and Test for Systems Dependability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-4-431-56594-9_15","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}