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Sensitometric response of CdZnTe detectors for digital radiography 数字放射照相用CdZnTe探测器的灵敏度响应
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603907
G. Giakos, B. Pillai, S. Chowdhury, A. Dasgupta, R. Guntupalli, S. Suryananayanan
{"title":"Sensitometric response of CdZnTe detectors for digital radiography","authors":"G. Giakos, B. Pillai, S. Chowdhury, A. Dasgupta, R. Guntupalli, S. Suryananayanan","doi":"10.1109/IMTC.1997.603907","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603907","url":null,"abstract":"The sensitometric response of the CdZnTe semiconductor detectors, within the X-ray diagnostic energy range, have been studied with the aim of optimizing the image quality parameters of these solid state-ionization devices. The detected signal and noise contributions were measured and related to the tube setting current parameters. Furthermore, the detector contrast has been experimentally determined. The experimental results indicate that CdZnTe detectors have high resistivity, high signal-to-noise ratio, and high detector contrast resolution. Therefore, they appear to be potential candidates for imaging applications with applications in X-ray digital radiography, dual-energy radiography, and computed tomography (CT).","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114931980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Test generators need to be modified to handle CMOS designs 测试生成器需要修改以处理CMOS设计
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.612437
J. Savir
{"title":"Test generators need to be modified to handle CMOS designs","authors":"J. Savir","doi":"10.1109/IMTC.1997.612437","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612437","url":null,"abstract":"CMOS designs have some unique properties that prevent existing test generators from computing a test vector for a fault when one might exist. The problem lies in the premises laid out on what it takes to detect a stuck-at fault. The basic premise that states that it is required to set a line to O(1) in order to detect a stuck-at 1(0) fault, and then propagate the error to an observable point, is not a necessary and sufficient detection condition. This is due to the existence of unknown states throughout the logic. This paper shows an example to illustrate the problem; describes what it takes in order to remedy it; proposes possible enhancements to existing test generation algorithms, and outlines the risks faced in the event that no correcting steps are taken.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130497335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Operation of mobile robots in a structured infrared environment 结构化红外环境下移动机器人的操作
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603909
H. Eren, C.C. Fung, D. Newcombe, J. Goh
{"title":"Operation of mobile robots in a structured infrared environment","authors":"H. Eren, C.C. Fung, D. Newcombe, J. Goh","doi":"10.1109/IMTC.1997.603909","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603909","url":null,"abstract":"A micro robot has been built and integrated into a structured infrared positioning sensing system. In the position sensing system the operation area is divided into sectors to allow multiple robots to operate simultaneously. The robot monitors its position whilst in motion and makes its own logical decisions. It can autonomously decide for the next action to execute. It is also able to avoid both dynamic or static obstacles by either sensing at possible collision or by anticipating obstacles from its position and position of others by means of acting on a set of given prioritised instructions. Errors in the system have been discussed and recommendations are made.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130745968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A smart sensor for pressure measurement 用于压力测量的智能传感器
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.612405
B. Andò, S. Baglio, A. Cocuccio, S. Graziani, A. La Terra
{"title":"A smart sensor for pressure measurement","authors":"B. Andò, S. Baglio, A. Cocuccio, S. Graziani, A. La Terra","doi":"10.1109/IMTC.1997.612405","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612405","url":null,"abstract":"In the paper a novel scheme for the indirect measurement of pressure in a vacuum cleaner is described. The measuring system has been developed for an industrial application and the final cost of the system has been taken into account. Fuzzy logic has been used for the device calibration.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117027179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Power prediction using an optimal neuro-fuzzy predictor 使用最优神经模糊预测器进行功率预测
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.612394
X.M. Gao, X.Z. Gao, S. Ovaska
{"title":"Power prediction using an optimal neuro-fuzzy predictor","authors":"X.M. Gao, X.Z. Gao, S. Ovaska","doi":"10.1109/IMTC.1997.612394","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612394","url":null,"abstract":"This paper presents a neuro-fuzzy predictor for received power level prediction in mobile communication systems. An important but difficult in designing such predictor is to the complexity of the predictor structure, i.e., the number of input nodes and the number of membership functions needed for each input node. We solve this problem by using the predictive minimum description length (PMDL) principle. This results in a predictor with excellent generalization capability. The optimized neuro-fuzzy predictor is then used for power prediction of simulated Rayleigh fading signals with 1.8 GHz carrier frequency. The results show that our optimized predictor can provide very accurate predictions of received signal power. Our neuro-fuzzy predictor is well suitable for applications where efficient compensation of fast fading and accurate power control are required.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131454360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A 150,000-A transient current measurement of AC comparator for national test station 国家试验站交流比较器15万A暂态电流测量
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603977
S. Ren, Wenyi Hu, Sunan Lu
{"title":"A 150,000-A transient current measurement of AC comparator for national test station","authors":"S. Ren, Wenyi Hu, Sunan Lu","doi":"10.1109/IMTC.1997.603977","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603977","url":null,"abstract":"A 150,000-A transient current measurement device based on self-balancing AC current comparator type, which can be used in National Test Station and industrial heavy current system for calibration and measurement is presented. Testing of the comparator indicates that its transient current tolerance is less than 1% under the conditions of 150,000-A primary transient current, 100% full offset DC component, and 150 ms time constant of primary current. The transient performance and the test results are discussed.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"39 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131578913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the calibration of a 6D laser tracking system for contactless, dynamic robot measurements 对一种用于非接触式动态机器人测量的6D激光跟踪系统进行标定
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.612390
S. Spiess, M. Vincze, M. Ayromlou
{"title":"On the calibration of a 6D laser tracking system for contactless, dynamic robot measurements","authors":"S. Spiess, M. Vincze, M. Ayromlou","doi":"10.1109/IMTC.1997.612390","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612390","url":null,"abstract":"The repeatability of today's robots is at least a magnitude better than their accuracy. A proper tool to improve accuracy provides geometric calibration which needs reliable and accurate measurement data of the actual robot. The single beam Laser Tracking System \"LuxWess\" provides can excellent means to obtain these measurements. In this paper we describe the calibration of the geometry of this measurement tool, itself. The calibration method is cheap and flexible, no external reference measurements are needed. In the following we describe the principles of the design of our system and shortly mention why it is superior to other laser trackers. Then we give a description of the model and the calibration for three dimensional measurements.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132471467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A distributed data processing system for industrial recycling 一种用于工业回收的分布式数据处理系统
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603942
B. Karlsson
{"title":"A distributed data processing system for industrial recycling","authors":"B. Karlsson","doi":"10.1109/IMTC.1997.603942","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603942","url":null,"abstract":"In the future, recycling will become more and more important due to the increase of environmental awareness. During the active life of a product many changes will occur. To be able to disassemble a product in an automatic way many parameters have to be measured. More specifically, to be able to detect and measure all defects and small model differences, complex sensor systems need to be used. These sensor systems will produce a large amount of data. To reduce the amount of data transmitted over the bus local processors pre-process the data.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132700464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Integrating modern instrumentation, control and information technology in the undergraduate laboratory 整合现代仪器、控制和信息技术于本科实验室
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.612435
L.A. Chemane, A. Nunes, G. Hancke
{"title":"Integrating modern instrumentation, control and information technology in the undergraduate laboratory","authors":"L.A. Chemane, A. Nunes, G. Hancke","doi":"10.1109/IMTC.1997.612435","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612435","url":null,"abstract":"This paper describes the development and implementation of a computer integrated instrumentation and control system in the undergraduate instrumentation and control laboratory of the Department of Electrical and Electronic Engineering at the University of Pretoria. It describes the process plant, the SCADA (Supervisory Control and Data Acquisition) system, the communication system, intelligent and non-intelligent I/O devices and field instrumentation and emphasises the benefits and limitations of such a system within the context of the education and training of instrumentation and control engineer. The above mentioned system have been implemented on a miniature process plant in the laboratory, and although a set-up like this can not include all the practical problems encountered in a real plant, e.g. noise, interference's, environment influences, etc., it does give the student the opportunity to get involved in making real design decisions and work on a real physical plant with modern commercially available tools. This project has been done in cooperation with the Centre for Electronics and instrumentation at the Eduardo Mondlane University in Maputo, Mozambique. The goal is to also implement this system at that University in the immediate future.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128336323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
AC-DC transfer at cryogenic temperatures using a superconducting resistive transition-edge temperature sensor 使用超导电阻过渡边缘温度传感器的低温交直流传输
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.604048
C. Reintsema, E. Grossman, J. A. Koch, J. Kinard, T. Lipe
{"title":"AC-DC transfer at cryogenic temperatures using a superconducting resistive transition-edge temperature sensor","authors":"C. Reintsema, E. Grossman, J. A. Koch, J. Kinard, T. Lipe","doi":"10.1109/IMTC.1997.604048","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604048","url":null,"abstract":"A prototype, cryogenic thermal transfer device has been constructed and tested using a superconducting transition-edge thermal sensor.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131801425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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