{"title":"Evaluation of practical definitions of parameters for smooth impulses and impulses with small amounts of distortion (overshoot and/or oscillations)","authors":"T. McComb, J. Dunn","doi":"10.1109/IMTC.1997.612376","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612376","url":null,"abstract":"The existing definitions of the parameters of high-voltage impulses were derived to be used on measurements made on an oscillogram and hence they were based on a small number of readings which would usually have uncertainties of reading of about /spl plusmn/1% (or more) of the read parameter. Records taken on digital recorders may have much greater precision (and the possibility of lower uncertainties) and in some cases their precision may be increased by appropriate processing of the recorded data. This paper discusses definitions of the parameters used to define impulses and how they can be modified to facilitate automated data processing while maintaining a reasonable correlation with the very-large established database gathered using the old definitions. The parameters are evaluated using these new definitions on records of standard test impulses and the values obtained are compared with those obtained using the old definitions evaluated with either non-linear curve fitting or smoothing.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114664232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fuzzy-based adaptive digital power metering using a genetic algorithm","authors":"C. Kung, M. Devaney, Chung-Ming Huang, C. Kung","doi":"10.1109/IMTC.1997.609285","DOIUrl":"https://doi.org/10.1109/IMTC.1997.609285","url":null,"abstract":"This paper describes an innovative fuzzy-based adaptive approach to the metering of power and RMS voltage and current employing the genetic algorithm. The fuzzy-based adaptive metering engine adjusts the number of points per cycle to be processed and the location of these points based on the optimal fuzzy rules constructed bp the genetic algorithm to satisfy overall metering error criteria under different operating environment while minimizing the number of points actually employed in the metering computation. This results in a reduction in the metering computation effort which frees up the processor for other tasks such as communication or power quality measurements. The fuzzy-based adaptive metering algorithm has been implemented on a microcontroller-based power metering system which operates under a multi-tasking operating system which exploits the efficiencies achieved by the reduced metering rite. The fuzzy-based adaptive metering algorithm has been tested with a variety of actual and synthesized power system waveforms and the experimental evaluations have demonstrated excellent accuracy in the metered power system quantities.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117164164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fast and accurate transmission lines estimator","authors":"E. Arif, P. Boets, L. van Biesen","doi":"10.1109/IMTC.1997.604054","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604054","url":null,"abstract":"A new estimator for the identification of transmission lines based on the skin-effect equivalent circuit consisting of resistors and inductors is proposed and is named Log/sup 2/ELiS (Logarithmic-Squared-ELiS). A software package that calculates the parametric maximum likelihood estimate of transfer functions, i.e. ELiS (Estimation of Linear Systems); already exists. ELiS allows accurate modelling of lumped linear systems from noisy observations and permits the estimation of the delay and the system parameters. Due to the delay, the cost function using ELiS has a lot of local minima and one needs good parameter starting values to obtain the global minimum. Both ELiS and Log/sup 2/ELiS were applied to a practical measurement problem such as the identification of a transfer function with time delay. The simulation as well as measurement results have proven that Log/sup 2/ELiS is better estimator to characterise transmission lines.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"7 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120858993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of commercial fibre optic strain sensors","authors":"K. Liu","doi":"10.1109/IMTC.1997.604046","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604046","url":null,"abstract":"Fibre-optic strain gauge (FOSG), one of the most widely studied optical sensors, has found applications beyond experimental mechanics labs reaching out to aerospace, civil, power, and process control engineering. Significant progress has been made to commercialize the FOSG's and systems. The rapid advancement of optical communications has made many high-performance passive and active optoelectronic components more accessible and cost effective. It has also helped to develop new sensor system concept and architecture. This presentation will review the optical configurations for FOSG and analyze the technical difficulties involved in the commercialization of FOSG.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121112677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A course on instrumentation: the signal processing approach","authors":"A. Carlosena, R. Cabeza","doi":"10.1109/IMTC.1997.612414","DOIUrl":"https://doi.org/10.1109/IMTC.1997.612414","url":null,"abstract":"This paper describes a new course on Instrumentation given to Telecommunications Engineering students at the Universidad Publica de Navarra. This course has been introduced within the context of the renovation of curricula in Spain, in which instrumentation has become a mandatory subject. Instrumentation is thus presented as a relevant discipline on its own in which many technologies and techniques converge. A system approach is used along the course what serves to emphasize and remark to students signal and system theory concepts.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121272719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of design of experiment techniques to measurement procedures. An example of optimisation applied to the digital measurement of partial discharges","authors":"R. Bozzo, G. Coletti, C. Gemme, F. Guastavino","doi":"10.1109/IMTC.1997.603993","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603993","url":null,"abstract":"In the last decade, multistage digital measuring systems of partial discharges (PDs) have been introduced, allowing one to support the diagnostic of defects (sites of PDs) in power electric components. They transfer information about defects from full data sets of PD patterns, obtained from a Phase Resolved Partial Discharge Analyser (PRPDA) to reduced data set by implementing pattern recognition techniques. The latter data sets are then classified versus similar reference data sets. The validity of the above diagnostic requires that the measuring process, which is influenced by several factors, is optimised. The three main settings of the PRPDA are among such factors of influence, but so far, as a simple mathematical model of this measuring process is not available, it has not been possible to quantitatively assess their \"weight\" on the validity of above diagnostic. This work presents a successful \"Design Of Experiment\" (DOE) approach to solve the latter problem. The DOE analysis of the results of 81 PD tests performed on a simple physical model of an insulation system quantified the weight and the interaction of the three factors and allowed one to derive criteria for selecting the \"optimal\" values of such factors and the \"optimal\" composition of the reduced data sets.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127549243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated thermoluminescence measurement using microcontroller","authors":"P. Neelamegam, S. Arumugam","doi":"10.1109/IMTC.1997.610258","DOIUrl":"https://doi.org/10.1109/IMTC.1997.610258","url":null,"abstract":"A dedicated real time microcontroller thermoluminescence measurement setup has been developed to measure light intensity and temperature and to control linear heating for conducting investigations on thermoluminescent materials such as alkali halides with and without doping of impurities. This instrument system permits recording of glow curve data and enables microcontroller processing of such data to evaluate glow peak temperature and activation energy. A simple and powerful 8051 microcontroller board has been developed and, along with the necessary software for this purpose, is explained fully.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124845628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Instrumentation system to implement LEAK TEST PROGRAM","authors":"W. J. Turner, R. Brown, D. Rael","doi":"10.1109/IMTC.1997.603962","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603962","url":null,"abstract":"HVAC equipment, gloveboxes, and other types of enclosures are required to meet rigid well-defined leak rates when they are to be installed in a nuclear facility. This paper describes two implementations of an instrumentation system that is used to test leak rates on heating, ventilation, and air conditioning (HVAC) plenums, gloveboxes, and experimental chambers, etc. One of the implementations used a programmable logic controller (PLC). The other used what is probably a simpler system based on FlexNet/spl copy/ modules. The emphasis on both systems was on automatic data collection, automatic report generation, and validation of the test results to ERDA 76-21 and ASME-N510. The data are collected using input modules connected to the PLC in one case. In the other case the data are collected using the FlexNet modules. In both cases, the data are stored and the reports are generated in a spreadsheet.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"187 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124933605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Hardware realization of Krawtchouk transform utilizing VNDL modeling","authors":"N. Botros, J. Yang, P. Feinsilver, R. Schott","doi":"10.1109/IMTC.1997.603937","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603937","url":null,"abstract":"In this paper we present a simplification of Krawtchouk transform and its hardware realization on a Xilinx FPGA. A brief contrast between this hardware and that of Fourier Transform is presented. The hardware is tested by inputting data through a CAD programs and reading the results of the transform from the RAM of the hardware. These results those calculated by software programs for the same input data. The hardware is stand-alone and operates on a real-time basis.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125809561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Roundoff error analysis of the PCA networks","authors":"T. Szabó, G. Horváth","doi":"10.1109/IMTC.1997.603954","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603954","url":null,"abstract":"This paper deals with some of the effects of finite precision data representation and arithmetics in principal component analysis (PCA) neural networks. The PCA networks are single layer linear neural networks that use some versions of Oja's learning rule. The paper concentrates on the effects of premature convergence or early termination of the learning process. It determines an approximate analytical expression of the lower limit of the learning rate parameter. Selecting the learning rate below this limit-which depends on the statistical properties of the input data and the quantum size used in the finite precision arithmetics the convergence will slow down significantly or the learning process will stop before converging to the proper weight vector.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123771622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}