Sensitometric response of CdZnTe detectors for digital radiography

Abstract

The sensitometric response of the CdZnTe semiconductor detectors, within the X-ray diagnostic energy range, have been studied with the aim of optimizing the image quality parameters of these solid state-ionization devices. The detected signal and noise contributions were measured and related to the tube setting current parameters. Furthermore, the detector contrast has been experimentally determined. The experimental results indicate that CdZnTe detectors have high resistivity, high signal-to-noise ratio, and high detector contrast resolution. Therefore, they appear to be potential candidates for imaging applications with applications in X-ray digital radiography, dual-energy radiography, and computed tomography (CT).