Progress in Crystal Growth and Characterization最新文献

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LPE of buried heterostructure laser devices 埋藏异质结构激光器件的LPE
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90009-2
R.A. Logan
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引用次数: 5
Metastable phases in the binary system Ga2S3-MnS: Thermal and structural features Ga2S3-MnS二元体系的亚稳相:热学和结构特征
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90030-4
M.P. Pardo, J. Flahaut
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引用次数: 3
MO-CVD growth of InGaAs using Me3Ga, AsMe3, AsH3 and Me3In or Et3In and analyses of adducts formed during the growth process 用Me3Ga、AsMe3、AsH3和Me3In或Et3In进行InGaAs的MO-CVD生长及生长过程中形成的加合物分析
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90015-8
C.H. Cheng , K.A. Jones , K.M. Motyl
{"title":"MO-CVD growth of InGaAs using Me3Ga, AsMe3, AsH3 and Me3In or Et3In and analyses of adducts formed during the growth process","authors":"C.H. Cheng ,&nbsp;K.A. Jones ,&nbsp;K.M. Motyl","doi":"10.1016/0146-3535(86)90015-8","DOIUrl":"10.1016/0146-3535(86)90015-8","url":null,"abstract":"<div><p>High quality <em>InGaAs</em> films have been grown using the adduct <em>Me</em><sub>3</sub><em>In</em>⋅<em>AsMe</em><sub>3</sub> to block the room temperature reaction between <em>Me</em><sub>3</sub><em>In</em> and <em>AsH</em><sub>3</sub> and by using a cover piece to prevent the preferential evaporation of phosphorus from the <em>InP</em> substrate during the warm up. Infrared spectroscopy shows that <em>Me</em><sub>3</sub><em>Ga</em>+<em>AsMe</em><sub>3</sub> and <em>Me</em><sub>3</sub><em>Ga</em>+<em>AsH</em><sub>3</sub> form stable adducts at room temperature, <em>Me</em><sub>3</sub><em>In</em>+<em>AsMe</em><sub>3</sub> probably form a stable adduct, while <em>Et</em><sub>3</sub><em>In</em>+<em>AsMe</em><sub>3</sub> probably do not form a stable Lewis acid/base adduct. Poorer quality films are grown with <em>Et</em><sub>3</sub><em>In</em> than with <em>Me</em><sub>3</sub><em>In</em> because the <em>AsMe</em><sub>3</sub> is unable to prevent by adduct formation the room temperature reaction between <em>Et</em><sub>3</sub><em>In</em> and <em>AsH</em><sub>3</sub>. Pyrolysis studies show that the individual alkyls are stable to ∼ 400°C and mixtures are stable to ∼ 350°C. The problems associated with the lower vapor pressure of the adducts, adduct dissociation at room temperature and the growth temperature, and using an adduct as the starting material are discussed.</p></div>","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"12 1","pages":"Pages 319-333"},"PeriodicalIF":0.0,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90015-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76023675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
CVD growth of InGaAs InGaAs的CVD生长
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90029-8
Kenneth A. Jones
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引用次数: 5
Compound index 复合索引
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90017-1
{"title":"Compound index","authors":"","doi":"10.1016/0146-3535(86)90017-1","DOIUrl":"https://doi.org/10.1016/0146-3535(86)90017-1","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"12 1","pages":"Pages 341-342"},"PeriodicalIF":0.0,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90017-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136940098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Liquid phase electroepitaxy of semiconductor compounds 半导体化合物的液相电外延
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90005-5
T. Bryskiewicz
{"title":"Liquid phase electroepitaxy of semiconductor compounds","authors":"T. Bryskiewicz","doi":"10.1016/0146-3535(86)90005-5","DOIUrl":"10.1016/0146-3535(86)90005-5","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"12 1","pages":"Pages 29-43"},"PeriodicalIF":0.0,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90005-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80739635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
An improved OM-CVD growth model for III–V semiconductors—Metalorganic halides for the CVD growth III-V型半导体OM-CVD生长模型的改进-金属有机卤化物CVD生长
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90012-2
Hari Prakash
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引用次数: 0
Liquid-solid interface stability 液固界面稳定性
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90018-3
V.N. Lozovskii, A.N. Ovcharenko, V.P. Popov
{"title":"Liquid-solid interface stability","authors":"V.N. Lozovskii,&nbsp;A.N. Ovcharenko,&nbsp;V.P. Popov","doi":"10.1016/0146-3535(86)90018-3","DOIUrl":"10.1016/0146-3535(86)90018-3","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"13 3","pages":"Pages 145-162"},"PeriodicalIF":0.0,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90018-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89857850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Contents, subject and compound indexes 内容、主题和复合索引
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90034-1
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引用次数: 0
LPE growth of InP and related alloys InP及相关合金的LPE生长
Progress in Crystal Growth and Characterization Pub Date : 1986-01-01 DOI: 10.1016/0146-3535(86)90013-4
Haruo Nagai
{"title":"LPE growth of InP and related alloys","authors":"Haruo Nagai","doi":"10.1016/0146-3535(86)90013-4","DOIUrl":"10.1016/0146-3535(86)90013-4","url":null,"abstract":"","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"12 1","pages":"Pages 271-294"},"PeriodicalIF":0.0,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90013-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74561955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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