III-V型半导体OM-CVD生长模型的改进-金属有机卤化物CVD生长

Hari Prakash
{"title":"III-V型半导体OM-CVD生长模型的改进-金属有机卤化物CVD生长","authors":"Hari Prakash","doi":"10.1016/0146-3535(86)90012-2","DOIUrl":null,"url":null,"abstract":"<div><p>Metalorganic halides are discussed for OM-CVD crystal growth. A growth model for the III–V semiconductors is proposed which employs metal-halogen-metal bridging to eliminate the metal- carbon-metal bridging in the group III organometallics considered to be a major factor for the carbon contamination of the OM-CVD crystals and formation of metal carbide parasitic phase. The metal-halogen-metal bridge theory underlying the model is put to test by spanning the organo and halide functions substituted on group III element for elimination of carbon contamination and improvements of the growth rates and electrophysical properties of the III–V alloys.</p></div>","PeriodicalId":101046,"journal":{"name":"Progress in Crystal Growth and Characterization","volume":"12 1","pages":"Pages 265-269"},"PeriodicalIF":0.0000,"publicationDate":"1986-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0146-3535(86)90012-2","citationCount":"0","resultStr":"{\"title\":\"An improved OM-CVD growth model for III–V semiconductors—Metalorganic halides for the CVD growth\",\"authors\":\"Hari Prakash\",\"doi\":\"10.1016/0146-3535(86)90012-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Metalorganic halides are discussed for OM-CVD crystal growth. A growth model for the III–V semiconductors is proposed which employs metal-halogen-metal bridging to eliminate the metal- carbon-metal bridging in the group III organometallics considered to be a major factor for the carbon contamination of the OM-CVD crystals and formation of metal carbide parasitic phase. The metal-halogen-metal bridge theory underlying the model is put to test by spanning the organo and halide functions substituted on group III element for elimination of carbon contamination and improvements of the growth rates and electrophysical properties of the III–V alloys.</p></div>\",\"PeriodicalId\":101046,\"journal\":{\"name\":\"Progress in Crystal Growth and Characterization\",\"volume\":\"12 1\",\"pages\":\"Pages 265-269\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0146-3535(86)90012-2\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Progress in Crystal Growth and Characterization\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0146353586900122\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Progress in Crystal Growth and Characterization","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0146353586900122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

讨论了金属有机卤化物对OM-CVD晶体生长的影响。提出了一种III - v型半导体的生长模型,该模型采用金属-卤素-金属桥接来消除III族有机金属中的金属-碳-金属桥接,这种桥接被认为是OM-CVD晶体碳污染和金属碳化物寄生相形成的主要因素。通过跨越取代III族元素的有机和卤化物功能来消除碳污染并改善III - v合金的生长速率和电物理性能,从而对该模型基础的金属-卤素-金属桥理论进行了测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An improved OM-CVD growth model for III–V semiconductors—Metalorganic halides for the CVD growth

Metalorganic halides are discussed for OM-CVD crystal growth. A growth model for the III–V semiconductors is proposed which employs metal-halogen-metal bridging to eliminate the metal- carbon-metal bridging in the group III organometallics considered to be a major factor for the carbon contamination of the OM-CVD crystals and formation of metal carbide parasitic phase. The metal-halogen-metal bridge theory underlying the model is put to test by spanning the organo and halide functions substituted on group III element for elimination of carbon contamination and improvements of the growth rates and electrophysical properties of the III–V alloys.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信