Industrial Metrology最新文献_第6页

Three-Dimensional Transfer Functions of Interference Microscopes 干涉显微镜的三维传递函数

Industrial Metrology Pub Date : 2021-11-09 DOI: 10.3390/metrology1020009

P. Lehmann, Sebastian Hagemeier, T. Pahl

{"title":"Three-Dimensional Transfer Functions of Interference Microscopes","authors":"P. Lehmann, Sebastian Hagemeier, T. Pahl","doi":"10.3390/metrology1020009","DOIUrl":"https://doi.org/10.3390/metrology1020009","url":null,"abstract":"Three-dimensional transfer functions (3D TFs) are generally assumed to fully describe the transfer behavior of optical topography measuring instruments such as coherence scanning interferometers in the spatial frequency domain. Therefore, 3D TFs are supposed to be independent of the surface under investigation resulting in a clear separation of surface properties and transfer characteristics. In this paper, we show that the 3D TF of an interference microscope differs depending on whether the object is specularly reflecting or consists of point scatterers. In addition to the 3D TF of a point scatterer, we will derive an analytical expression for the 3D TF corresponding to specular surfaces and demonstrate this as being most relevant in practical applications of coherence scanning interferometry (CSI). We additionally study the effects of temporal coherence and disclose that in conventional CSI temporal coherence effects dominate. However, narrowband light sources are advantageous if high spatial frequency components of weak phase objects are to be resolved, whereas, for low-frequency phase objects of higher amplitude, the temporal coherence is less affecting. Finally, we present an approach that explains the different transfer characteristics of coherence peak and phase detection in CSI signal analysis.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"26 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86234664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Calibration of a Digital Current Transformer Measuring Bridge: Metrological Challenges and Uncertainty Contributions 数字电流互感器测量桥的校准:计量挑战和不确定性贡献

Industrial Metrology Pub Date : 2021-10-03 DOI: 10.3390/metrology1020007

G. Frigo, M. Agustoni

引用次数: 5

A General Mathematical Approach Based on the Possibility Theory for Handling Measurement Results and All Uncertainties 基于可能性理论的处理测量结果和所有不确定性的一般数学方法

Industrial Metrology Pub Date : 2021-10-01 DOI: 10.3390/metrology1020006

S. Salicone, Harsha Vardhana Jetti

引用次数: 1

Metrology: A New Open Access Journal with a Broad Scope and an Exciting Mission 计量学:一种新的开放获取期刊，具有广泛的范围和令人兴奋的使命

Industrial Metrology Pub Date : 2021-09-03 DOI: 10.3390/metrology1010005

H Han Haitjema

引用次数: 0

The Statistical Power and Confidence of Some Key Comparison Analysis Methods to Correctly Identify Participant Bias 正确识别参与者偏差的几种关键比较分析方法的统计能力和置信度

Industrial Metrology Pub Date : 2021-08-26 DOI: 10.3390/metrology1010004

E. Molloy, A. Koo, B. D. Hall, R. Harding

引用次数: 1

A Possibilistic Kalman Filter for the Reduction of the Final Measurement Uncertainty, in Presence of Unknown Systematic Errors 在存在未知系统误差的情况下，降低最终测量不确定度的可能性卡尔曼滤波

Industrial Metrology Pub Date : 2021-08-17 DOI: 10.3390/metrology1010003

Harsha Vardhana Jetti, S. Salicone

{"title":"A Possibilistic Kalman Filter for the Reduction of the Final Measurement Uncertainty, in Presence of Unknown Systematic Errors","authors":"Harsha Vardhana Jetti, S. Salicone","doi":"10.3390/metrology1010003","DOIUrl":"https://doi.org/10.3390/metrology1010003","url":null,"abstract":"A Kalman filter is a concept that has been in existence for decades now and it is widely used in numerous areas. It provides a prediction of the system states as well as the uncertainty associated to it. The original Kalman filter can not propagate uncertainty in a correct way when the variables are not distributed normally or when there is a correlation in the measurements or when there is a systematic error in the measurements. For these reasons, there have been numerous variations of the original Kalman filter, most of them mathematically based (like the original one) on the theory of probability. Some of the variations indeed introduce some improvements, but without being completely successful. To deal with these problems, more recently, Kalman filters have also been defined using random-fuzzy variables (RFVs). These filters are capable of also propagating distributions that are not normal and propagating systematic contributions to uncertainty, thus providing the overall measurement uncertainty associated to the state predictions. In this paper, the authors make another step forward, by defining a possibilistic Kalman filter using random-fuzzy variables which not only considers and propagates both random and systematic contributions to uncertainty, but also reduces the overall uncertainty associated to the state predictions by compensating for the unknown residual systematic contributions.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"38 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-08-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74891110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

An Overview of Acoustic Impedance Measurement Techniques and Future Prospects 声阻抗测量技术综述及展望

Industrial Metrology Pub Date : 2021-05-11 DOI: 10.3390/METROLOGY1010002

Nandeesh V. Hiremath, Vaibhav Kumar, Nicholas Motahari, Dhwanil Shukla

引用次数: 20

Accurate Measurements of a Wavelength Drift in High-Temperature Silica-Fiber Bragg Gratings 高温硅光纤布拉格光栅波长漂移的精确测量

Industrial Metrology Pub Date : 2021-04-14 DOI: 10.3390/METROLOGY1010001

S. Dedyulin, E. Timakova, D. Grobnic, C. Hnatovsky, A. Todd, S. Mihailov

{"title":"Accurate Measurements of a Wavelength Drift in High-Temperature Silica-Fiber Bragg Gratings","authors":"S. Dedyulin, E. Timakova, D. Grobnic, C. Hnatovsky, A. Todd, S. Mihailov","doi":"10.3390/METROLOGY1010001","DOIUrl":"https://doi.org/10.3390/METROLOGY1010001","url":null,"abstract":"Fiber Bragg gratings (FBG) are extensively used to perform high-temperature measurements in harsh environments, however the drift of the characteristic Bragg wavelength affects their long-term stability resulting in an erroneous temperature measurement. Herein we report the most precise and accurate measurements of wavelength drifts available up to date on high-temperature FBGs. The measurements were performed with a set of packaged π-phase-shifted FBGs for high wavelength resolution, in caesium and sodium pressure-controlled heat pipes for stable temperature environment and with a tunable laser for stable wavelength measurements with a 0.1 pm resolution. Using this dataset we outline the experimental caveats that can lead to inconsistent results and confusion in measuring wavelength drifts, namely: influence of packaging; interchangeability of FBGs produced under identical conditions; birefringence of π-phase-shifted FBGs; initial transient behaviour of FBGs at constant temperature and dependence on the previous thermal history of FBGs. In addition, we observe that the wavelength stability of π-phase-shifted gratings at lower temperature is significantly improved upon by annealing at higher temperature. The lowest value of the wavelength drift we obtain is +0.014 pm·h−1 at 600 °C (corresponding to +0.001 °C·h−1) after annealing for 400 h at 1000 °C, the longest annealing time we have tried. The annealing time required to achieve the small drift rate is FBG-specific.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"12 1","pages":"1-16"},"PeriodicalIF":0.0,"publicationDate":"2021-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87797726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

A New Statistical Tool Focused on Metrological Tasks 一种专注于计量任务的新统计工具

Industrial Metrology Pub Date : 2018-08-01 DOI: 10.5772/INTECHOPEN.74872

Eugene Charnukha

引用次数: 0

Introductory Chapter: Metrology 导论章:计量

Industrial Metrology Pub Date : 2018-08-01 DOI: 10.5772/INTECHOPEN.75541

A. Akdoğan

引用次数: 0