Industrial Metrology最新文献

{"title":"Analysis of Vector Network Analyzer Thermal Drift Error","authors":"A. Bystrov, Yi Wang, P. Gardner","doi":"10.3390/metrology2020010","DOIUrl":"https://doi.org/10.3390/metrology2020010","url":null,"abstract":"Ensuring a high accuracy when measuring the parameters of devices under testing is an important task when conducting research in the terahertz-frequency range. The purpose of this paper is a practical study of the thermal drift errors of a vector network analyzer using low-terahertz-frequency extender modules. For this, the change in the measurement error, which is a function of time, was analysed using system, based on Keysight N5247B vector network analyzer and covering the frequency ranges of 220–330 GHz, 500–750 GHz, and 750–1100 GHz. The results of our experiment showed that the measurement error decreased rapidly during the first half hour of warm-up and stabilized by 3 h after turning on the equipment. These results allow for an estimation of the necessary warm-up time depending on the requirements for the measurement’s accuracy. This makes it possible to optimize the experiment and reduce its duration.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"38 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78701664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The GUM Tree Calculator: A Python Package for Measurement Modelling and Data Processing with Automatic Evaluation of Uncertainty","authors":"B. D. Hall","doi":"10.3390/metrology2010009","DOIUrl":"https://doi.org/10.3390/metrology2010009","url":null,"abstract":"There is currently interest in the digitalisation of metrology because technologies that can measure, analyse, and make critical decisions autonomously are beginning to emerge. The notions of metrological traceability and measurement uncertainty should be supported, following the recommendations in the Guide to the Expression of Uncertainty in Measurement (GUM). However, GUM offers no specific guidance. Here, we report on a Python package that implements algorithmic data processing using ‘uncertain numbers’, which satisfy the general criteria in GUM for an ideal format to express uncertainty. An uncertain number can represent a physical quantity that has not been determined exactly. Using uncertain numbers, measurement models can be expressed clearly and succinctly in terms of the quantities involved. The algorithms and simple data structures we use provide an example of how metrological traceability can be supported in digital systems. In particular, uncertain numbers provide a format to capture and propagate detailed information about quantities that influence a measurement along the various stages of a traceability chain. More detailed information about influence quantities can be exploited to extract more value from results for users at the end of a traceability chain.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"22 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90255587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"GUM-Compliant Uncertainty Evaluation Using Virtual Experiments","authors":"G. Wübbeler, M. Marschall, K. Kniel, D. Heißelmann, F. Härtig, C. Elster","doi":"10.3390/metrology2010008","DOIUrl":"https://doi.org/10.3390/metrology2010008","url":null,"abstract":"A virtual experiment simulates a real measurement process by means of a numerical model. The numerical model produces virtual data whose properties reflect those of the data observed in the real experiment. In this work, we explore how the results of a virtual experiment can be employed in the context of uncertainty evaluation for a corresponding real experiment. The uncertainty evaluation was based on the Guide to the Expression of Uncertainty in Measurement (GUM), which defines the de facto standard for uncertainty evaluation in metrology. We show that, under specific assumptions about model structure and variance of the data, virtual experiments in combination with a Monte Carlo method lead to an uncertainty evaluation for the real experiment that is in line with Supplement 1 to the GUM. In the general case, a GUM-compliant uncertainty evaluation in the context of a real experiment can no longer be based on a corresponding virtual experiment in a simple way. Nevertheless, virtual experiments are still useful in order to increase the reliability of an uncertainty analysis. Simple generic examples as well the case study of a virtual coordinate measuring machine are presented to illustrate the treatment.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"64 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90532310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Noise Limitations in Multi-Fringe Readout of Laser Interferometers and Resonators","authors":"Tobias Eckhardt, O. Gerberding","doi":"10.3390/metrology2010007","DOIUrl":"https://doi.org/10.3390/metrology2010007","url":null,"abstract":"Laser interferometers that operate over a dynamic range exceeding one wavelength are used as compact displacement sensors for gravitational wave detectors and inertial sensors and in a variety of other high-precision applications. A number of approaches are available to extract the phase from such interferometers by implementing so-called phasemeters, algorithms to provide a linearised phase estimate. While many noise sources have to be considered for any given scheme, they are fundamentally limited by additive noise in the readout, such as electronic readout, digitisation, and shot-noise, which manifest as an effective, white phase noise in the phasemeter output. We calculated and compared the Cramer–Rao lower bound for phasemeters of some state-of-the-art two-beam interferometer schemes and derived their noise limitations for sub-fringe operation and for multi-fringe readout schemes. From this, we derived achievable noise performance levels for one of these interferometer techniques, deep-frequency modulation interferometry. We then applied our analysis to optical resonators and show that frequency scanning techniques can in theory benefit from such resonant enhancement, indicating that the sensitivities can be improved in future sensors.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"9 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83526654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Experimental Design for Virtual Experiments in Tilted-Wave Interferometry","authors":"G. Scholz, I. Fortmeier, M. Marschall, M. Stavridis, M. Schulz, C. Elster","doi":"10.3390/metrology2010006","DOIUrl":"https://doi.org/10.3390/metrology2010006","url":null,"abstract":"The tilted-wave interferometer (TWI) is a recent and promising technique for optically measuring aspheres and freeform surfaces and combines an elaborate experimental setup with sophisticated data analysis algorithms. There are, however, many parameters that influence its performance, and greater knowledge about the behavior of the TWI is needed before it can be established as a measurement standard. Virtual experiments are an appropriate tool for this purpose, and in this paper we present a digital twin of the TWI that was carefully designed for such experiments. The expensive numerical calculations involved combined with the existence of multiple influencing parameters limit the number of virtual experiments that are feasible, which poses a challenge to researchers. Experimental design is a statistical technique that allows virtual experiments to be planned such as to maximize information gain. We applied experimental design to virtual TWI experiments with the goal of identifying the main sources of uncertainty. The results from this work are presented here.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85570276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Characterization of Surface Topography Features for the Effect of Process Parameters and Their Correlation to Quality Monitoring in Metal Additive Manufacturing","authors":"Jinsun Lee, Md Shahjahan Hossain, M. Taheri, Awse Jameel, M. Lakshmipathy, H. Taheri","doi":"10.3390/metrology2010005","DOIUrl":"https://doi.org/10.3390/metrology2010005","url":null,"abstract":"Layering deposition methodology in metal additive manufacturing (AM) and the influence of different processing parameters, such as energy source level and deposition speed, which can change the melt pool condition, are known to be the important influencing factors on properties of components fabricated via AM. The effect of melt pool conditions and geometry on properties and quality of fabricated AM components has been widely studied through experimental and simulation techniques. There is a need for better understanding the influence of solidified melt pool topography on characteristics of next deposition layer that can be applied to complex surfaces, especially those with sparse topographical features, such as those that occur in AM deposition layers. Topography of deposited layers in metal additive manufacturing is a significant aspect on the bonding condition between the layers and defect generation mechanism. Characterization of the topography features in AM deposition layers offers a new perspective into investigation of defect generation mechanisms and quality evaluation of AM components. In this work, a feature-based topography study is proposed for the assessment of process parameters’ influence on AM deposition layers topography and defect generation mechanism. Titanium alloy (Ti6Al4V) samples deposited on steel substrate, by direct energy deposition (DED) AM technique at different process conditions, were used for the assessment. Topography datasets and analysis of shape and size differences pertaining to the relevant topographic features have been performed. Different AM process parameters were investigated on metallic AM samples manufactured via direct energy deposition (DED) and the potential defect generation mechanism was discussed. The assessment of the topography features was used for correlation study with previously published in-situ monitoring and quality evaluation results, where useful information was obtained through characterization of signature topographic formations and their relation to the in-situ acoustic process monitoring, as the indicators of the manufacturing process behavior and performance.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"7 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85887465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Surface-Sensing Principle of Microprobe System for Micro-Scale Coordinate Metrology: A Review","authors":"M. Michihata","doi":"10.3390/metrology2010004","DOIUrl":"https://doi.org/10.3390/metrology2010004","url":null,"abstract":"Micro-coordinate measuring machines (micro-CMMs) for measuring microcomponents require a probe system with a probe tip diameter of several tens to several hundreds of micrometers. Scale effects work for such a small probe tip, i.e., the probe tip tends to stick on the measurement surface via surface adhesion forces. These surface adhesion forces significantly deteriorate probing resolution or repeatability. Therefore, to realize micro-CMMs, many researchers have proposed microprobe systems that use various surface-sensing principles compared with conventional CMM probes. In this review, the surface-sensing principles of microprobe systems were the focus, and the characteristics were reviewed. First, the proposed microprobe systems were summarized, and the probe performance trends were identified. Then, the individual microprobe system with different sensing principles was described to clarify the performance of each sensing principle. By comprehensively summarizing multiple types of probe systems and discussing their characteristics, this study contributed to identifying the performance limitations of the proposed micro-probe system. Accordingly, the future development of micro-CMMs probes is discussed.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"24 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82926083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Systematic Distortion Factor and Unrecognized Source of Uncertainties in Nuclear Data Measurements and Evaluations","authors":"N. Kornilov, V. Pronyaev, S. Grimes","doi":"10.3390/metrology2010001","DOIUrl":"https://doi.org/10.3390/metrology2010001","url":null,"abstract":"Each experiment provides new information about the value of some physical quantity. However, not only measured values but also the uncertainties assigned to them are an important part of the results. The metrological guides provide recommendations for the presentation of the uncertainties of the measurement results: statistics and systematic components of the uncertainties should be explained, estimated, and presented separately as the results of the measurements. The experimental set-ups, the models of experiments for the derivation of physical values from primary measured quantities, are the product of human activity, making it a rather subjective field. The Systematic Distortion Factor (SDF) may exist in any experiment. It leads to the bias of the measured value from an unknown “true” value. The SDF appears as a real physical effect if it is not removed with additional measurements or analysis. For a set of measured data with the best evaluated true value, their differences beyond their uncertainties can be explained by the presence of Unrecognized Source of Uncertainties (USU) in these data. We can link the presence of USU in the data with the presence of SDF in the results of measurements. The paper demonstrates the existence of SDF in Prompt Fission Neutron Spectra (PFNS) measurements, measurements of fission cross sections, and measurements of Maxwellian spectrum averaged neutron capture cross sections for astrophysical applications. The paper discusses introducing and accounting for the USU in the data evaluation in cases when SDF cannot be eliminated. As an example, the model case of 238U(n,f)/235U(n,f) cross section ratio evaluation is demonstrated.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"89 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88974052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Digital Representation of Measurement Uncertainty: A Case Study Linking an RMO Key Comparison with a CIPM Key Comparison","authors":"B. D. Hall, A. Koo","doi":"10.3390/metrology1020011","DOIUrl":"https://doi.org/10.3390/metrology1020011","url":null,"abstract":"This paper considers a future scenario in which digital reporting of measurement results is ubiquitous and digital calibration certificates (DCCs) contain information about the components of uncertainty in a measurement result. The task of linking international measurement comparisons is used as a case study to look at the benefits of digitalization. Comparison linking provides a context in which correlations are important, so the benefit of passing a digital record of contributions to uncertainty along a traceability chain can be examined. The International Committee for Weights and Measures (CIPM) uses a program of international “key comparisons” to establish the extent to which measurements of a particular quantity may be considered equivalent when made in different economies. To obtain good international coverage, the results of the comparisons may be linked together: a number of regional metrology organization (RMO) key comparisons can be linked back to an initial CIPM key comparison. Specific information about systematic effects in participants’ results must be available during linking to allow correct treatment of the correlations. However, the conventional calibration certificate formats used today do not provide this: participants must submit additional data, and the report of an initial comparison must anticipate the requirements for future linking. Special handling of additional data can be laborious and prone to error. An uncertain-number digital reporting format was considered in this case study, which caters to all the information required and would simplify the comparison analysis, reporting, and linking; the format would also enable a more informative presentation of comparison results. The uncertain-number format would be useful more generally, in measurement scenarios where correlations arise, so its incorporation into DCCs should be considered. A full dataset supported by open-source software is available.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"14 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89772678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Methodology to Create Reproducible Validation/Reference Materials for Comparison of Filter-Based Measurements of Carbonaceous Aerosols That Measure BC, BrC, EC, OC, and TC","authors":"P. Solomon, Anna-Marie Hyatt, A. Hansen, J. Schauer, N. Hyslop, J. Watson, P. Doraiswamy, Paige Presler-Jur","doi":"10.3390/metrology1020010","DOIUrl":"https://doi.org/10.3390/metrology1020010","url":null,"abstract":"A simple method that reproducibly creates validation/reference materials for comparison of methods that measure the carbonaceous content of atmospheric particulate matter deposited on filter media at concentrations relevant to atmospheric levels has been developed and evaluated. Commonly used methods to determine the major carbonaceous components of particles collected on filters include optical attenuation for “Black” (BC) and “Brown” (BrC) carbon, thermal-optical analysis (TOA) for “Elemental” (EC) and “Organic” (OC) carbon, and total combustion for “Total” carbon (TC). The new method uses a commercial inkjet printer to deposit ink containing both organic and inorganic components onto filter substrates at programmable print densities (print levels, as specified by the printer–software combination). A variety of filter media were evaluated. The optical attenuation (ATN) of the deposited sample was determined at 880 nm and 370 nm. Reproducibility or precision (as standard deviation or in percent as coefficient of variation) in ATN for Teflon-coated glass-fiber, Teflon, and cellulose substrates was better than 5%. Reproducibility for other substrates was better than 15%. EC and OC measured on quartz-fiber filters (QFF) compared to ATN measured at 880 nm and 370 nm on either QFF or Teflon-coated glass-fiber yielded R2 > 0.92 and >0.97, respectively. Four independent laboratories participated in a round robin study together with the reference laboratory. The propagated standard deviation among the five groups across all print levels was <2.2 ATN at 880 nm and <2.7 ATN at 370 nm with a coefficient of variation of <2% at ~100 ATN.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"64 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2021-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78911961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}