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Precision inductors: calibration and maintenance 精密电感:校准和维护
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80024-A
Rahat Husain
{"title":"Precision inductors: calibration and maintenance","authors":"Rahat Husain","doi":"10.1016/0921-5956(91)80024-A","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80024-A","url":null,"abstract":"<div><p>This paper presents three different techniques for calibrating and maintainingprecision standard inductors at metrological laboratories which employ such items of equipment that allow the precise comparison of two impedances, usually a standard and an unknown. General radio standard inductors of 100 pH, 1 mH and 10 mH were calibrated as a demonstration. As reported by the manufacturer of the selected inductors, the stability requirement, of within 0.01% per year, was achieved using these techniques.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 45-58"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80024-A","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91758513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Stability conditions when using theforward difference method 采用正演差分法时的稳定性条件
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80027-D
Seppo J. Ovaska, Olli Vainio
{"title":"Stability conditions when using theforward difference method","authors":"Seppo J. Ovaska,&nbsp;Olli Vainio","doi":"10.1016/0921-5956(91)80027-D","DOIUrl":"10.1016/0921-5956(91)80027-D","url":null,"abstract":"<div><p>The forward difference method, also known as Euler's method, generates discretetime transfer functions that lead to compact implementations that are desirable for several industrial control applications. However, the potential of Euler's method is usually overlooked because some control literature gives misleading information on the stability of the z-domain poles obtained by Euler's method. In this paper, we derive analytical expressions for the minimum sampling rate that guarantees stability, and the optimum sampling rate that minimizes the modulus of a stable <em>z</em>-domain pole.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 85-90"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80027-D","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91163017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Advanced sensor systems for theapplication of LIME technologies in the process industry: a review 在过程工业中应用LIME技术的先进传感器系统:综述
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80022-8
M. Heitor
{"title":"Advanced sensor systems for theapplication of LIME technologies in the process industry: a review","authors":"M. Heitor","doi":"10.1016/0921-5956(91)80022-8","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80022-8","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"194 1","pages":"1-31"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83094009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An investigation into theperformance of probes on coordinate measuring machines 三坐标测量机上探头性能的研究
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80025-B
C. Butler
{"title":"An investigation into theperformance of probes on coordinate measuring machines","authors":"C. Butler","doi":"10.1016/0921-5956(91)80025-B","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80025-B","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"1229 1","pages":"59-70"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89986047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 47
Measurement of surface roughness parameter using a neural network and laser scattering 基于神经网络和激光散射的表面粗糙度参数测量
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80023-9
Leda Villalobos, Sheldon Gruber
{"title":"Measurement of surface roughness parameter using a neural network and laser scattering","authors":"Leda Villalobos,&nbsp;Sheldon Gruber","doi":"10.1016/0921-5956(91)80023-9","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80023-9","url":null,"abstract":"<div><p>The quality of surfaces is obtained by the utilization of scattered laser light examinedby a neural network. Features are extracted from the scattered angular spectrum which are then used as inputs to a hierarchical neural net. The net is “trained” by a selected set of machined surfaces whose quality has already been independently established. These samples are repeatedly presented to the sensors and the network will, each time, make a decision about the surface roughness which is then compared to the correct answer, and the error is used to modify the connection weights. Following this training period, the net is able to identify the quality of new surfaces presented to it. Experimental results, using a set of lapped surfaces are discussed with regard to fusion of different features in order to obtain an adequate measure of surface roughness using the neural network. It is shown that the system is able to measure the roughness parameter, R<sub>a</sub>, in the micron range to sub-micron accuracy. Furthermore, this non-contact measurement is performed in the millisecond time range which can be used for on-line quality control.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 33-44"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80023-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90125904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Precision inductors: calibration and maintenance 精密电感:校准和维护
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80024-A
R. Husain
{"title":"Precision inductors: calibration and maintenance","authors":"R. Husain","doi":"10.1016/0921-5956(91)80024-A","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80024-A","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"140 1","pages":"45-58"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77384402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Advanced sensor systems for theapplication of LIME technologies in the process industry: a review 在过程工业中应用LIME技术的先进传感器系统:综述
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80022-8
Manuel V. Heitor
{"title":"Advanced sensor systems for theapplication of LIME technologies in the process industry: a review","authors":"Manuel V. Heitor","doi":"10.1016/0921-5956(91)80022-8","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80022-8","url":null,"abstract":"<div><p>Modern computer-integrated manufacturing and engineering (CIME) technologieshave been developed and implemented to improve plant and process design, measurement and control design, and plant operation, together with the economic optimization of flow processes. Almost irrespective of which approach is selected for obtaining these results, success or otherwise is based on some process measurements, involving predominantly either temperature, pressure or flow. Optical sensors are often being adopted for these tasks not only because of their non-intrusive nature, but also in view of their reliability, together with their high response speed, intrinsic resolution and increasing ruggedness. In addition, the development of new measurement capabilities such as easy adjustment for operating range, compensation for effects of environmental conditions and self-diagnosis, has given a considerable level of “<em>intelligence</em>” to current sensors, which are smarter, smaller and cheaper than ever before.</p><p>This paper reviews and discusses the implementation of advanced sensor systems for onlinemeasurements of process streams with emphasis on hot, dirty, hostile and multiphase environments. The requirements for the integration of the information from the sensors in a CIME environment are considered, taking into account the different levels of automation of typical processes. Novel methodologies, such as fiber-optic sensors, semiconductor materials, image processing and data analysis are discussed, as well as the use of \"intelligent\" instruments as part of the push towards higher quality.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 1-31"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80022-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90125905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Computer-based measurement ofwastewater BOD 基于计算机的废水生化需氧量测量
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80026-C
G. Hassapis
{"title":"Computer-based measurement ofwastewater BOD","authors":"G. Hassapis","doi":"10.1016/0921-5956(91)80026-C","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80026-C","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"73 1","pages":"71-84"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82961892","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Computer-based measurement ofwastewater BOD 基于计算机的废水生化需氧量测量
Industrial Metrology Pub Date : 1991-12-01 DOI: 10.1016/0921-5956(91)80026-C
George Hassapis
{"title":"Computer-based measurement ofwastewater BOD","authors":"George Hassapis","doi":"10.1016/0921-5956(91)80026-C","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80026-C","url":null,"abstract":"<div><p>This paper describes the development of a computer-based instrument for the fastmeasurement of the biological oxygen demand (BOD) of wastewater. The conventional measurement method is based on laboratory analysis results that are available after a delay of five days. The BOD is assessed by the instrument described here by monitoring the change in the dilution ratio of fresh water to wastewater that has to be made in order to keep at a constant value the oxygen consumed in a special whirl bed reactor in which microorganisms are grown. Depending on the reactor volume, the algorithm for the computer control of the dilution ratio and the architecture of the computer selected, a measurement time in the range of 2 to 10 minutes can be achieved. The results of practical experience gained from building and testing such a measuring instrument are presented and discussed.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 71-84"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80026-C","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91759066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Multiple source sandwich speckle photography for measurement of surface roughness 测量表面粗糙度的多源夹心散斑摄影
Industrial Metrology Pub Date : 1991-05-01 DOI: 10.1016/0921-5956(91)80016-9
D. Paoletti, G. Schirripa Spagnolo
{"title":"Multiple source sandwich speckle photography for measurement of surface roughness","authors":"D. Paoletti,&nbsp;G. Schirripa Spagnolo","doi":"10.1016/0921-5956(91)80016-9","DOIUrl":"10.1016/0921-5956(91)80016-9","url":null,"abstract":"<div><p>A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"1 4","pages":"Pages 343-352"},"PeriodicalIF":0.0,"publicationDate":"1991-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80016-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73934490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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