{"title":"测量表面粗糙度的多源夹心散斑摄影","authors":"D. Paoletti, G. Schirripa Spagnolo","doi":"10.1016/0921-5956(91)80016-9","DOIUrl":null,"url":null,"abstract":"<div><p>A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"1 4","pages":"Pages 343-352"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80016-9","citationCount":"1","resultStr":"{\"title\":\"Multiple source sandwich speckle photography for measurement of surface roughness\",\"authors\":\"D. Paoletti, G. Schirripa Spagnolo\",\"doi\":\"10.1016/0921-5956(91)80016-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.</p></div>\",\"PeriodicalId\":100666,\"journal\":{\"name\":\"Industrial Metrology\",\"volume\":\"1 4\",\"pages\":\"Pages 343-352\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0921-5956(91)80016-9\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Industrial Metrology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0921595691800169\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Industrial Metrology","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0921595691800169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Multiple source sandwich speckle photography for measurement of surface roughness
A contouring technique based upon multiple source sandwich speckle photographyis described for measurements of relatively large rms surface roughness. An image processing system for automatic analysis of speckle pattern visibility is used. Some experimental results obtained on plane surfaces of different roughnesses are reported.
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