{"title":"A universal data acquisition and processing system for flight test applications","authors":"N. Schuck","doi":"10.1016/0921-5956(92)80028-R","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80028-R","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"27 1","pages":"147-159"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75244010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Missing-sample predictiontechnique for distributed data acquisition applications","authors":"Seppo J. Ovaska","doi":"10.1016/0921-5956(92)80023-M","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80023-M","url":null,"abstract":"<div><p>A predictor-type transmission-error correction technique is presented for a plain communication protocol that is used in transferring discrete samples of a measurement signal from integrated data acquisition nodes to the intelligent main computer. The proposed lost-sample predictor is based on an FIR-type extrapolator with a narrow impulse response. Two alternative extrapolation principles are discussed with numerical examples.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 2","pages":"Pages 97-105"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80023-M","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91664640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Low-cost controller for multi-axes stepper motors","authors":"Faisal Fadul, Louis Arnold","doi":"10.1016/0921-5956(92)80026-P","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80026-P","url":null,"abstract":"<div><p>Power integrated circuit controller/driver-based multi-axes stepper motors areextensively used in industry and other market sectors. Previously suggested techniques and existing commercially available full circuit controller boards employ complete set of commercially available driver/controller chips for each stepper motor. This paper describes how it is possible, to use a single controller chip and multi-driver chips to design a controller for simultaneous and independent control of multi-axes stepper motors. The controller circuit is supported with multi-task and efficient algorithms. The proposed controller circuit surpasses the existing controller boards in terms of its lower power consumption, low cost, and compact size. The software developed and the hardware testing were done using the EV87C51 FB Development System Board with the Orental stepper motor PH264-0213.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 2","pages":"Pages 133-140"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80026-P","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91680914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Homodyne interferometric displacement measurement using multimode fiber speckles","authors":"S. Kawata , K. Matsubaral","doi":"10.1016/0921-5956(92)80027-Q","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80027-Q","url":null,"abstract":"<div><p>A homodyne optical fiber interferometer was constructed for measurement of thedisplacement of a moving object at the accuracy of a half wavelength of He-Ne laser. Speckles in the far-field image of the fiber end, representing guided modes of the multimode fiber, were utilized to sense the direction of movement of the target as well as its velocity. The displacement of a vibrating voice coil driven by sinusoidal and triangular wave currents was measured.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 2","pages":"Pages 141-146"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80027-Q","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91725420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Interactive surface modelling: model of a function-oriented expert system for specification of surface properties","authors":"B.-G. Rosén, R. Crafoord","doi":"10.1016/0921-5956(92)80024-N","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80024-N","url":null,"abstract":"<div><p>This paper presents a model in which function-related surface topography knowledgecan be stored in a relation (expert system0database and retrieved by computer communication from an integrated CAD environment. Also, the principles for the representation of a surface function and its related parameters, together with database contents, are discussed. Based on the ideas described, a pilot system for use in interactive surface modelling (ISM) on a personal computer CAD system has been implemented. The ISM system combines company and national standards with geometric representation of 2-D and 3-D surfaces. The system allows the user to interactively construct and simualte 3-D surfaces in the CAD-system with the use of the surface's “key” function parameters. Separation of function components makes it possible to simulate 3-D surfaces with desired properties interactively by the method of “mathematical machining” presented in this paper.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 2","pages":"Pages 107-119"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80024-N","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91680913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A universal data acquisition and processing system for flight test applications","authors":"Norbert Schuck","doi":"10.1016/0921-5956(92)80028-R","DOIUrl":"https://doi.org/10.1016/0921-5956(92)80028-R","url":null,"abstract":"<div><p>In the present paper the structure of a powerful measuring and computer system on board a research aircraft is proposed. The system is mainly designed for real-time data acquisition and processing applications in the field of flight test engineering. All subsystems consist of commercial hardware components. Modular hardware and software structures allow a comfortable integration of additional components. Extensive process monitoring facilities enable flight test engineers to perform a time-saving evaluation of new sensors and real-time algorithms during flight tests.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 2","pages":"Pages 147-159"},"PeriodicalIF":0.0,"publicationDate":"1992-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80028-R","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91725421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurement of surface roughness parameter using a neural network and laser scattering","authors":"L. Villalobos, S. Gruber","doi":"10.1016/0921-5956(91)80023-9","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80023-9","url":null,"abstract":"","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"8 1","pages":"33-44"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87038784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An investigation into theperformance of probes on coordinate measuring machines","authors":"Clive Butler","doi":"10.1016/0921-5956(91)80025-B","DOIUrl":"https://doi.org/10.1016/0921-5956(91)80025-B","url":null,"abstract":"<div><p>Coordinate measuring machines (CMMs) have become very widely used in recent years because of their ability to measure most or all of the individual geometrical features on complex engineering components. Compared with traditional methods, which normally employ a variety of separate instruments, CMMs are fast in operation and are adequately accurate for many applications. However, accuracy limitations often inhibit their use for high precision metrology. Accuracy is limited by such factors as straightness and orthogonality of the CMM movements; established techniques exist for determining these factors. In many cases, the errors introduced by the probes are very significant and often exceed the errors from other sources. This paper describes an investigation into the nature of probe errors, the factors that influence their performance and proposes a method of verifying the probe performance. Results from a number of probes used in different modes are presented. The application of the work to linking CAD systems to CMMs is briefly described.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 1","pages":"Pages 59-70"},"PeriodicalIF":0.0,"publicationDate":"1991-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(91)80025-B","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91759065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}