{"title":"Measuring ‘Big G’, the Newtonian Constant, with a Frequency Metrology Approach","authors":"A. Marchi","doi":"10.5772/INTECHOPEN.75635","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.75635","url":null,"abstract":"A new approach is described and discussed to the determination of the Newtonian gravitational constant G, which is based on the very powerful measurement of the frequency difference between two similar oscillators. The rate of change of time delay between the two is equal to their relative frequency difference, and small variations of either one can then be detected via delay monitoring with resolution limited only by time resolution and frequency stability of the two oscillators. The latter should be highly sensitive to gravitational field, to measure G, which triggers the choice of simple pendulums as field detectors. Since the relative effect on frequency readily obtainable in the lab by wellcontrolled variations of the gravitational field is on the order of 10−7, stabilities on the order of 10−12 are needed of the relative frequency difference if measurement of the fifth decimal digit of G is the target of the experiment. It is argued that such high stability is possible with a pendulum properly designed for being locally isochronous and showing an adequately high Q factor. The latter is projected to reach possibly 107 or more with the discussed design.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"109 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80599965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Methods for Evaluation of Measurement Uncertainty","authors":"J. Damasceno, P. Couto","doi":"10.5772/INTECHOPEN.74873","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.74873","url":null,"abstract":"This chapter presents and explains the most used methodologies for the evaluation of measurement uncertainty in metrology with practical examples. The main topics are basic concepts and importance, existing documentation, the harmonized methodology of the Guide to the Expression of Uncertainty in Measurement, types of uncertainty, modeling of measurement systems, use of alternative methods (including the GUM supplement 1 Monte Carlo numerical method), evaluation of uncertainty for calibration curves, correlated uncertainties, uncertainties arising from the calibration of instruments, and the main proposals for the new revised GUM. The chapter also discusses the GUM as a tool for the technical management of measurement processes.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"14 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81418239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Variational Calibration","authors":"M. Surdu","doi":"10.5772/intechopen.74220","DOIUrl":"https://doi.org/10.5772/intechopen.74220","url":null,"abstract":"The approach to the improving the accuracy of the impedance parameter measurements is described. This approach is based on the well-known variations of the influence of the disturbing factors on the results of measurement. Using these variations, measure- ment circuit provides the additional number of measurements, equal to the number of the disturbing factors. System of equations describes these results of measurements. The solution of this system eliminates the influence of the appropriate uncertainty sources on the results of measurement and gets the true result of the measured value. In addition, the solution of this system also gets the values of the uncertainty components in every measurement and possibility to monitor the properties of the measurement circuit. Examples of the realization of this method for improving the accuracy of the impedance parameter measurements in different bridges are given.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"64 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75902078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical Radiation Metrology and Uncertainty","authors":"Manal A. Haridy, A. Aslam","doi":"10.5772/INTECHOPEN.75205","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.75205","url":null,"abstract":"Metrology is the science of measurement. The chapter contains introductory material, terminology and units used in the optical radiation metrology. Optical radiation metrology provides an applied understanding of essential optical measurement concepts, techniques and procedures. In this chapter, we focus on electromagnetic radiation with wavelengths from approximately 100 to 2500 nm. We describe the principles used to measure photometry and radiometry quantities such as total flux, intensity, illuminance, luminance, radiance, exitance and irradiance. Measurement results should be expressed in terms of estimated value and an associated uncertainty, we provide an explanation to how to estimate and build the uncertainty budget of measurements. Metrology is based on measurements and comparisons. The unit is a unique name we assign to the measures of that quantity. Base standards must be both accessible and invariable. The metrological traceability chain is the sequence of measurement standards and calibrations that were used to relate the measurement result to the reference. The uncertainty budgets for photometric and radiometric quantities are represented in this chapter.","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"214 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75582996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using image analysis for lumbersize control measurements","authors":"James W. Funck, Jeffrey A. Gaber, Fatima Aslam","doi":"10.1016/0921-5956(92)80006-F","DOIUrl":"10.1016/0921-5956(92)80006-F","url":null,"abstract":"<div><p>An optical imaging system is proposed for monitoring thickness or width for onlinesize control in lumber production. Adaptations required to convert a general image analysis algorithm to this specific application are presented to illustrate the difficulty associated with applying imaging techniques to wood products processes. Several images containing common features that interfere with standard imaging techniques are used to illustrate the effects of key algorithm modifications and additions as well as parameter changes. Success with these images indicates that the proposed on-line system is feasible.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 3","pages":"Pages 237-252"},"PeriodicalIF":0.0,"publicationDate":"1992-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80006-F","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79178410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Applications of artificial vision in the wood industry","authors":"Joseph Ciccotelli, Jean-François Portala","doi":"10.1016/0921-5956(92)80003-C","DOIUrl":"10.1016/0921-5956(92)80003-C","url":null,"abstract":"<div><p>One mission of the Wood and Furniture Technical Center (CTBA) is to assist wood industries in integrating new technologies into their transformation processes. This mission was entrusted to Pôle Productique (Pont-à-Mousson, France), which, since 1986, has been developing new sensors for measurement and verification based on artificial vision techniques. In this paper some recently completed industrial applications are presented, together with their objectives and the principal techniques selected. Also described are present developments and the first results obtained in an attempt to grade pieces of wood by image analysis.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 3","pages":"Pages 185-194"},"PeriodicalIF":0.0,"publicationDate":"1992-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80003-C","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82490875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Nondestructive testing techniquesapplied to wood scanning","authors":"Jean-François Portala, Joseph Ciccotelli","doi":"10.1016/0921-5956(92)80009-I","DOIUrl":"10.1016/0921-5956(92)80009-I","url":null,"abstract":"<div><p>The mission of the CTBA (Technical Center for Wood and Furniture), and in particularlyits “Pôle Productique” department, is to provide industrial solutions to wood industries. Five industrial applications installed in 1990 have demonstrated the aptitude of an artificial vision machine to detect defects on wood. In order to provide an answer to new industrial problems, where black-and-white vision is inefficient, CTBA has undertaken several research projects. The first results consist in the realization of three industrial prototypes. This article describes the method employed, the hardware used and the algorithms used in the limit of industrial property.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 3","pages":"Pages 299-307"},"PeriodicalIF":0.0,"publicationDate":"1992-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80009-I","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74241136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computed tomographymeasurements on wood","authors":"John Davis, Peter Wells","doi":"10.1016/0921-5956(92)80004-D","DOIUrl":"10.1016/0921-5956(92)80004-D","url":null,"abstract":"<div><p>Wood is a valuable natural resource, which is becoming increasingly scarce. In orderto conserve this natural resource maximum value must be extracted from wood. The ability to nondestructively acquire information about the structure and microstructure of wood will improve the return from this resource. With computed tomography, two- and three-dimensional images of the internal structure of objects may be obtained without physical sectioning. Imaging wood tomographically makes it possible to gather precise information about density; the size, location and distribution of defects; and the local moisture content. The development of existing tomography scanners will improve the return from sawlogs and will assist in understanding the structure of wood down to the submillimeter scale.</p></div>","PeriodicalId":100666,"journal":{"name":"Industrial Metrology","volume":"2 3","pages":"Pages 195-218"},"PeriodicalIF":0.0,"publicationDate":"1992-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0921-5956(92)80004-D","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88983241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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