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All-optical combinational logical units featuring fifth-order cascade 具有五阶级联的全光组合逻辑单元
Chip Pub Date : 2024-12-01 Epub Date: 2024-10-11 DOI: 10.1016/j.chip.2024.100112
Haiqi Gao , Yu Shao , Yipeng Chen , Junren Wen , Yuchuan Shao , Yueguang Zhang , Weidong Shen , Chenying Yang
{"title":"All-optical combinational logical units featuring fifth-order cascade","authors":"Haiqi Gao ,&nbsp;Yu Shao ,&nbsp;Yipeng Chen ,&nbsp;Junren Wen ,&nbsp;Yuchuan Shao ,&nbsp;Yueguang Zhang ,&nbsp;Weidong Shen ,&nbsp;Chenying Yang","doi":"10.1016/j.chip.2024.100112","DOIUrl":"10.1016/j.chip.2024.100112","url":null,"abstract":"<div><div>Modern computational technologies are gradually encountering significant limitations, driving a shift toward alternative paradigms such as optical computing. In this study, novel all-optical combinational logic units based on diffractive neural networks (D<sup>2</sup>NNs) were introduced, which were designed to perform high-order logical operations efficiently and swiftly with the adoption of only two modulation layers. This innovative design exhibits increased processing speed, improved energy efficiency, robust environmental stability, and high error tolerance, making it exceptionally well-suited for a broad spectrum of applications in optical computing and communications. By leveraging the transfer learning, we successfully developed a fifth-order cascaded combinational logic circuit for a practical information transmission system. Furthermore, we revealed a pioneering application of the device in optical time division multiplexing (OTDM), demonstrating its capability to manage high-speed data transfer seamlessly without the need for electronic conversion. Extensive simulations and experimental validations demonstrate the potential of the model as a foundational technology for future optical computing architectures, which paves the way toward more sustainable and efficient optical data processing platforms.</div></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 4","pages":"Article 100112"},"PeriodicalIF":0.0,"publicationDate":"2024-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143129374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Suspended nanomembrane silicon photonic integrated circuits 悬浮纳米膜硅光子集成电路
Chip Pub Date : 2024-09-01 Epub Date: 2024-07-05 DOI: 10.1016/j.chip.2024.100104
Rongxiang Guo , Qiyue Lang , Zunyue Zhang , Haofeng Hu , Tiegen Liu , Jiaqi Wang , Zhenzhou Cheng
{"title":"Suspended nanomembrane silicon photonic integrated circuits","authors":"Rongxiang Guo ,&nbsp;Qiyue Lang ,&nbsp;Zunyue Zhang ,&nbsp;Haofeng Hu ,&nbsp;Tiegen Liu ,&nbsp;Jiaqi Wang ,&nbsp;Zhenzhou Cheng","doi":"10.1016/j.chip.2024.100104","DOIUrl":"10.1016/j.chip.2024.100104","url":null,"abstract":"<div><p><strong>Leveraging the low linear and nonlinear absorption loss of silicon at</strong> <strong>mid-infrared</strong> <strong>(mid-IR) wavelengths, silicon photonic integrated circuits (PICs) have attracted significant attention for</strong> <strong>mid-IR</strong> <strong>applications including optical sensing, spectroscopy, and nonlinear optics. However,</strong> <strong>mid-IR</strong> <strong>silicon PICs typically show moderate performance compared to</strong> <strong>state-of-the-art</strong> <strong>silicon photonic devices operating in the telecommunication band. Here, we proposed and demonstrated suspended nanomembrane silicon (SNS) PICs with light</strong><strong>-</strong><strong>guiding within</strong> <strong>deep-subwavelength</strong> <strong>waveguide thickness for operation in the short</strong><strong>-</strong><strong>wavelength</strong> <strong>mid-IR</strong> <strong>region. We demonstrated key building components, namely, grating couplers, waveguide arrays,</strong> <strong>micro-resonators,</strong> <strong>etc.,</strong> <strong>which</strong> <strong>exhibit</strong> <strong>excellent performances in bandwidths, back reflections, quality factors, and fabrication tolerance. Moreover,</strong> <strong>the results</strong> <strong>show that the proposed SNS PICs have high compatibility with the</strong> <strong>multi-project</strong> <strong>wafer foundry services. Our study provides an unprecedented platform for</strong> <strong>mid-IR</strong> <strong>integrated</strong> <strong>photonics and applications.</strong></p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100104"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000224/pdfft?md5=cd27c1841a4799cf4cf48ad7ef718a52&pid=1-s2.0-S2709472324000224-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141691844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical performance and reliability analysis of vertical gallium nitride Schottky barrier diodes with dual-ion implanted edge termination 具有双离子植入边缘终端的垂直 GaN 肖特基势垒二极管的电气性能和可靠性分析
Chip Pub Date : 2024-09-01 Epub Date: 2024-07-24 DOI: 10.1016/j.chip.2024.100105
Bo Li , Jinpei Lin , Linfei Gao , Zhengweng Ma , Huakai Yang , Zhihao Wu , Hsien-Chin Chiu , Hao-Chung Kuo , Chunfu Zhang , Zhihong Liu , Shuangwu Huang , Wei He , Xinke Liu
{"title":"Electrical performance and reliability analysis of vertical gallium nitride Schottky barrier diodes with dual-ion implanted edge termination","authors":"Bo Li ,&nbsp;Jinpei Lin ,&nbsp;Linfei Gao ,&nbsp;Zhengweng Ma ,&nbsp;Huakai Yang ,&nbsp;Zhihao Wu ,&nbsp;Hsien-Chin Chiu ,&nbsp;Hao-Chung Kuo ,&nbsp;Chunfu Zhang ,&nbsp;Zhihong Liu ,&nbsp;Shuangwu Huang ,&nbsp;Wei He ,&nbsp;Xinke Liu","doi":"10.1016/j.chip.2024.100105","DOIUrl":"10.1016/j.chip.2024.100105","url":null,"abstract":"<div><p>In this study, a gallium nitride (GaN) substrate and its 15 μm epitaxial layer were entirely grown by adopting the hydride vapor phase epitaxy (HVPE) technique. To enhance the breakdown voltage (<em>V</em><sub>BR</sub>) of vertical GaN-on-GaN Schottky barrier diodes (SBDs), a dual ion coimplantation of carbon and helium was employed to create the edge termination. The resulting devices exhibited a low turn-on voltage of 0.55 V, a high <em>I</em><sub>on</sub>/<em>I</em><sub>off</sub> ratio of approximately 10<sup>9</sup>, and a low specific on-resistance of 1.93 mΩ cm<sup>2</sup>. When the ion implantation edge was terminated, the maximum <em>V</em><sub>BR</sub> of the devices reached 1575 V, with an average improvement of 126%. These devices demonstrated a high figure of merit (FOM) of 1.28 GW cm<sup>–2</sup> and showed excellent reliability during pulse stress testing.</p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100105"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000236/pdfft?md5=39e7a0c9e23864accd3ca2de9e3d77c6&pid=1-s2.0-S2709472324000236-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141844463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Channel-bias-controlled reconfigurable silicon nanowire transistors via an asymmetric electrode contact strategy 通过非对称电极接触策略实现通道偏压控制的可重构硅纳米线晶体管
Chip Pub Date : 2024-09-01 Epub Date: 2024-06-08 DOI: 10.1016/j.chip.2024.100098
{"title":"Channel-bias-controlled reconfigurable silicon nanowire transistors via an asymmetric electrode contact strategy","authors":"","doi":"10.1016/j.chip.2024.100098","DOIUrl":"10.1016/j.chip.2024.100098","url":null,"abstract":"<div><p>Reconfigurable field-effect transistors (R-FETs) that can dynamically reconfigure the transistor polarity, from n-type to p-type channel or vice versa, represent a promising new approach to reduce the logic complexity and granularity of programmable electronics. Although R-FETs have been successfully demonstrated upon silicon nanowire (SiNW) channels, a pair of extra program gates is still needed to control the source/drain (S/D) contacts. In this work, we propose a rather simple single gate R-FET structure with an asymmetric S/D electrode contact, where the FET channel polarity can be altered by changing the sign of channel bias <em>V</em><sub>ds</sub>. These R-FETs were fabricated upon an orderly array of planar SiNW channels, grown via in-plane solid-liquid-solid mechanism, and contacted by Ti/Al and Pt/Au at the S/D electrodes, respectively. Remarkably, this channel-bias-controlled R-FET strategy has been successfully testified and implemented upon both p-type-doped (with indium dopants) or n-type-doped (phosphorus) SiNW channels, whereas the R-FET prototypes demonstrate an impressive high <em>I</em><sub>on/off</sub> ratio of &gt; 10<sup>6</sup> and a steep subthreshold swing of 79 mV/dec. These results indicate a rather simple, compact and generic enough R-FET strategy for the construction of a new generation of SiNW-based programmable and low-power electronics.</p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100098"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000169/pdfft?md5=e3070abd5dfb82b3bdcb7e25f29beb8d&pid=1-s2.0-S2709472324000169-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141411691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical evaluation of 571 GaAs quantum point contact transistors showing the 0.7 anomaly in quantized conductance using cryogenic on-chip multiplexing 对 571 个砷化镓量子点接触晶体管进行统计评估,显示使用低温片上多路复用技术的量子化电导存在 0.7 的反常现象
Chip Pub Date : 2024-09-01 Epub Date: 2024-04-16 DOI: 10.1016/j.chip.2024.100095
{"title":"Statistical evaluation of 571 GaAs quantum point contact transistors showing the 0.7 anomaly in quantized conductance using cryogenic on-chip multiplexing","authors":"","doi":"10.1016/j.chip.2024.100095","DOIUrl":"10.1016/j.chip.2024.100095","url":null,"abstract":"<div><p>The mass production and the practical number of cryogenic quantum devices producible in a single chip are limited to the number of electrical contact pads and wiring of the cryostat or dilution refrigerator. It is, therefore, beneficial to contrast the measurements of hundreds of devices fabricated in a single chip in one cooldown process to promote the scalability, integrability, reliability, and reproducibility of quantum devices and to save evaluation time, cost and energy. Here, we used a cryogenic on-chip multiplexer architecture and investigated the statistics of the 0.7 anomaly observed on the first three plateaus of the quantized conductance of semiconductor quantum point contact (QPC) transistors. Our single chips contain 256 split gate field-effect QPC transistors (QFET) each, with two 16-branch multiplexed source-drain and gate pads, allowing individual transistors to be selected, addressed and controlled through an electrostatic gate voltage process. A total of 1280 quantum transistors with nano-scale dimensions are patterned in 5 different chips of GaAs heterostructures. From the measurements of 571 functioning QFETs taken at temperatures <em>T</em> = 1.4 K and <em>T</em> = 40 mK, it is found that the spontaneous polarisation model and Kondo effect do not fit our results. Furthermore, some of the features in our data largely agreed with van Hove model with short-range interactions. Our approach provides further insight into the quantum mechanical properties and microscopic origin of the 0.7 anomaly in QFETs, paving the way for the development of semiconducting quantum circuits and integrated cryogenic electronics, for scalable quantum logic control, readout, synthesis, and processing applications.</p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100095"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000133/pdfft?md5=5f30d302d84e157cb03adf3d6b99680b&pid=1-s2.0-S2709472324000133-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140757484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Highly sensitive diamond X-ray detector array for high-temperature applications 用于高温应用的高灵敏度金刚石 X 射线探测器阵列
Chip Pub Date : 2024-09-01 Epub Date: 2024-08-05 DOI: 10.1016/j.chip.2024.100106
Wenjie Dou , Chaonan Lin , Wei Fan , Xun Yang , Chao Fang , Huaping Zang , Shaoyi Wang , Congxu Zhu , Zhi Zheng , Weimin Zhou , Chongxin Shan
{"title":"Highly sensitive diamond X-ray detector array for high-temperature applications","authors":"Wenjie Dou ,&nbsp;Chaonan Lin ,&nbsp;Wei Fan ,&nbsp;Xun Yang ,&nbsp;Chao Fang ,&nbsp;Huaping Zang ,&nbsp;Shaoyi Wang ,&nbsp;Congxu Zhu ,&nbsp;Zhi Zheng ,&nbsp;Weimin Zhou ,&nbsp;Chongxin Shan","doi":"10.1016/j.chip.2024.100106","DOIUrl":"10.1016/j.chip.2024.100106","url":null,"abstract":"<div><div>Diamond is a highly suitable material for X-ray detectors that can function effectively in harsh environments due to its unique properties such as ultrawide bandgap, high radiation resistance, excellent carrier mobility as well as remarkable chemical and thermal stability. However, the sensitivity of diamond X-ray detectors needs further improvement due to the relatively low X-ray absorption efficiency of diamond, and the exploration of single-crystal diamond array imaging still remains unexplored. In the current work, a 10 × 10 X-ray photodetector array was constructed from single-crystal diamond. To improve the sensitivity of the diamond X-ray detector, an asymmetric sandwich electrode structure was utilized. Additionally, trenches were created through laser cutting to prevent crosstalk between adjacent pixels. The diamond X-ray detector array exhibits exceptional performance, including a low detection limit of 4.9 nGy s<sup>−1</sup>, a sensitivity of 14.3 mC Gy<sup>−1</sup> cm<sup>−2</sup>, and a light-dark current ratio of 18,312, which are among the most favorable values ever reported for diamond X-ray detectors. Furthermore, these diamond X-ray detectors can operate at high temperatures up to 450 °C, making them suitable for development in harsh environments.</div></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100106"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000248/pdfft?md5=641348a92d64c73eaa83ace8518de946&pid=1-s2.0-S2709472324000248-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142206231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon 利用硅局部量子点温度计测量低温电子加热
Chip Pub Date : 2024-09-01 Epub Date: 2024-05-27 DOI: 10.1016/j.chip.2024.100097
{"title":"Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon","authors":"","doi":"10.1016/j.chip.2024.100097","DOIUrl":"10.1016/j.chip.2024.100097","url":null,"abstract":"<div><p>Silicon technology offers the enticing opportunity for monolithic integration of quantum and classical electronic circuits. However, the power consumption levels of classical electronics may compromise the local chip temperature and hence affect the fidelity of qubit operations. In the current work, a quantum-dot-based thermometer embedded in an industry-standard silicon field-effect transistor (FET) was adopted to assess the local temperature increase produced by an active FET placed in close proximity. The impact of both static and dynamic operation regimes was thoroughly investigated. When the FET was operated statically, a power budget of 45 nW at 100-nm separation was found, whereas at 216 μm, the power budget was raised to 150 μW. Negligible temperature increase for the switch frequencies tested up to 10 MHz was observed when operating dynamically. The current work introduced a method to accurately map out the available power budget at a distance from a solid-state quantum processor, and indicated the possible conditions under which cryoelectronics circuits may allow the operation of hybrid quantum–classical systems.</p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100097"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000157/pdfft?md5=08ee00550d4fd08f99bd72e49daa1de1&pid=1-s2.0-S2709472324000157-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141508190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Challenges and recent advances in HfO2-based ferroelectric films for non-volatile memory applications 非易失性存储器应用中基于 HfO2 的铁电薄膜所面临的挑战和最新进展
Chip Pub Date : 2024-09-01 Epub Date: 2024-06-15 DOI: 10.1016/j.chip.2024.100101
{"title":"Challenges and recent advances in HfO2-based ferroelectric films for non-volatile memory applications","authors":"","doi":"10.1016/j.chip.2024.100101","DOIUrl":"10.1016/j.chip.2024.100101","url":null,"abstract":"<div><div>The emergence of data-centric applications such as artificial intelligence (AI), machine learning, and the Internet of Things (IoT), has promoted surges in demand for storage memories with high operating speed and nonvolatile characteristics. HfO<sub>2</sub>-based ferroelectric memory technologies, which emerge as a promising alternative, have attracted considerable attention due to their high performance, energy efficiency, and full compatibility with the standard complementary metal-oxide-semiconductors (CMOS) process. These nonvolatile storage elements, such as ferroelectric random access memory (FeRAM), ferroelectric field-effect transistors (FeFETs), and ferroelectric tunnel junctions (FTJs), possess different data access mechanisms, individual merits, and specific application boundaries in next-generation memories or even beyond von Neumann architecture. This paper provides an overview of ferroelectric HfO<sub>2</sub> memory technologies, addresses the current challenges, and offers insights into future research directions and prospects.</div></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100101"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141394538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Remote electric powering by germanium photovoltaic conversion of an Erbium-fiber laser beam 通过锗光电转换铒光纤激光束实现远程供电
Chip Pub Date : 2024-09-01 Epub Date: 2024-06-26 DOI: 10.1016/j.chip.2024.100099
Richard Soref , Francesco De Leonardis , Oussama Moutanabbir , Gerard Daligou
{"title":"Remote electric powering by germanium photovoltaic conversion of an Erbium-fiber laser beam","authors":"Richard Soref ,&nbsp;Francesco De Leonardis ,&nbsp;Oussama Moutanabbir ,&nbsp;Gerard Daligou","doi":"10.1016/j.chip.2024.100099","DOIUrl":"10.1016/j.chip.2024.100099","url":null,"abstract":"<div><p>The commercially available 4000-Watt continuous-wave (CW) Erbium-doped-fiber laser, emitting at the 1567-nm wavelength where the atmosphere has high transmission, provides an opportunity for harvesting electric power at remote “off the grid” locations using a multi-module photovoltaic (PV) “receiver” panel. This paper proposes a 32-element monocrystalline thick-layer Germanium PV panel for efficient harvesting of a collimated 1.13-m-diam beam. The 0.78-m<sup>2</sup> PV panel is constructed from commercial Ge wafers. For incident CW laser-beam power in the 4000 to 10,000 W range, our thermal, electrical, and infrared simulations predict 660 to 1510 Watts of electrical output at the panel temperatures of 350 to 423 K.</p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 3","pages":"Article 100099"},"PeriodicalIF":0.0,"publicationDate":"2024-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000170/pdfft?md5=d0ba424633e8badf6dfa158686b16e97&pid=1-s2.0-S2709472324000170-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141722083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Coexistence of multiuser entanglement distribution and classical light in optical fiber network with a semiconductor chip 带半导体芯片的光纤网络中的多用户纠缠分布与经典光共存
Chip Pub Date : 2024-06-01 Epub Date: 2024-01-17 DOI: 10.1016/j.chip.2024.100083
Xu Jing , Cheng Qian , Xiaodong Zheng , Hu Nian , Chenquan Wang , Jie Tang , Xiaowen Gu , Yuechan Kong , Tangsheng Chen , Yichen Liu , Chong Sheng , Dong Jiang , Bin Niu , Liangliang Lu
{"title":"Coexistence of multiuser entanglement distribution and classical light in optical fiber network with a semiconductor chip","authors":"Xu Jing ,&nbsp;Cheng Qian ,&nbsp;Xiaodong Zheng ,&nbsp;Hu Nian ,&nbsp;Chenquan Wang ,&nbsp;Jie Tang ,&nbsp;Xiaowen Gu ,&nbsp;Yuechan Kong ,&nbsp;Tangsheng Chen ,&nbsp;Yichen Liu ,&nbsp;Chong Sheng ,&nbsp;Dong Jiang ,&nbsp;Bin Niu ,&nbsp;Liangliang Lu","doi":"10.1016/j.chip.2024.100083","DOIUrl":"10.1016/j.chip.2024.100083","url":null,"abstract":"<div><p><strong>Building communication links among multiple users in a scalable and robust way is a key objective in achieving</strong> <strong>large-scale</strong> <strong>quantum networks. In</strong> <strong>a</strong> <strong>realistic scenario, noise from the coexisting classical light is inevitable and can ultimately disrupt the entanglement. The previous significant fully connected multiuser entanglement distribution experiments are conducted using dark fiber links</strong><strong>,</strong> <strong>and there is no explicit relation between the entanglement degradations induced by classical noise and its error rate. Here</strong><strong>,</strong> <strong>a semiconductor chip with a high</strong> <strong>figure-of-merit</strong> <strong>modal overlap</strong> <strong>is fabricated</strong> <strong>to directly generate broadband polarization entanglement.</strong> <strong>The</strong> <strong>m</strong><strong>onolithic source maintains</strong> <strong>the</strong> <strong>polarization</strong> <strong>entanglement fidelity</strong> <strong>of</strong> <strong>above 96% for 42 nm bandwidth</strong><strong>,</strong> <strong>with a brightness of 1.2 × 10</strong><sup><strong>7</strong></sup> <strong>Hz mW</strong><sup><strong>−1</strong></sup><strong>.</strong> <strong>A</strong> <strong>continuously working quantum entanglement distribution</strong> <strong>are performed</strong> <strong>among three users coexisting with classical light. Under</strong> <strong>finite-key</strong> <strong>analysis,</strong> <strong>secure keys</strong> <strong>are established</strong> <strong>and</strong> <strong>images encryption</strong> <strong>are enabled</strong> <strong>as well as quantum secret sharing between users.</strong> <strong>This</strong> <strong>work paves the way for practical multiparty quantum communication with integrated photonic architecture compatible with</strong> <strong>real-world</strong> <strong>fiber optical communication network.</strong></p></div>","PeriodicalId":100244,"journal":{"name":"Chip","volume":"3 2","pages":"Article 100083"},"PeriodicalIF":0.0,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2709472324000017/pdfft?md5=e5b68fc97cc379307475a2b6b95af66a&pid=1-s2.0-S2709472324000017-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139483531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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