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Advances in x-ray analysis最新文献

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X-Ray Characterization of Phase Equilibria of the Raveau and 2212 Phases in the Bi-Sr-Ca-Cu-0 System Bi-Sr-Ca-Cu-0体系中Raveau和2212相相平衡的x射线表征
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023181
W. Wong-Ng, L. Cook, F. Jiang
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引用次数: 0
Characterisation and Modelling of Peak Shifts in Conventional Powder Diffractometry 传统粉末衍射中峰移的表征和建模
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023004
R. W. Cheary, J. Cline, M. Anast
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引用次数: 4
Accurate Measurement of Lattice Misfit Between γ And γ' Phases in Nickel-Base Superalloys at High Temperatures 镍基高温合金γ与γ′相晶格失配的精确测量
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022862
T. Yokokawa, K. Ohno, H. Murakami, Toshiharu Kobayashi, T. Yamagata, H. Harada
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引用次数: 8
X-Ray Quantitative Analysis of Transformed Martensite in Austentic Stainless Steel 奥氏体不锈钢中相变马氏体的x射线定量分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022904
Z. Yajima, Y. Kishi, Y. Hirose
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引用次数: 0
The Evolution of X-ray Analytical Instrumentation at Rigaku Corporation 理学公司x射线分析仪器的发展
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022436
A. Shibata
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引用次数: 0
Diffusivity of Pt in BaxSrl-xTiO3 by XPS Compositional Depth Profiling XPS成分深度剖面法研究Pt在BaxSrl-xTiO3中的扩散率
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023375
A. Naziripour, A. Nelson
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引用次数: 0
X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films 薄膜中应力和位错密度同时变化的x射线衍射分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022606
Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer
{"title":"X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films","authors":"Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer","doi":"10.1154/S0376030800022606","DOIUrl":"https://doi.org/10.1154/S0376030800022606","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"52 1","pages":"195-210"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82752058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The in-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023089
K. Hayashi, T. Horiuchi, K. Matsushige
{"title":"The in-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods","authors":"K. Hayashi, T. Horiuchi, K. Matsushige","doi":"10.1154/S0376030800023089","DOIUrl":"https://doi.org/10.1154/S0376030800023089","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"653-658"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76710888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection 利用全反射干涉效应的x射线荧光分析薄膜中特定界面
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023132
K. Sakurai, A. Iida
{"title":"Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection","authors":"K. Sakurai, A. Iida","doi":"10.1154/S0376030800023132","DOIUrl":"https://doi.org/10.1154/S0376030800023132","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"49 1","pages":"695-700"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76779079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Quantitative X-Ray Diffraction Analysis of Smectites: II -- Reference Intensity Ratio Calculations for Smectite Analysis 蒙脱石的定量x射线衍射分析:II——蒙脱石分析的参考强度比计算
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023028
Hong Chen, B. Davis
{"title":"Quantitative X-Ray Diffraction Analysis of Smectites: II -- Reference Intensity Ratio Calculations for Smectite Analysis","authors":"Hong Chen, B. Davis","doi":"10.1154/S0376030800023028","DOIUrl":"https://doi.org/10.1154/S0376030800023028","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"68 1","pages":"599-606"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73697224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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