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Advances in x-ray analysis最新文献

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Effect of Macro and Micro Stresses on Hardness of Titanium Aluminides 宏观和微观应力对铝化物钛硬度的影响
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022813
Hiroyuki Tabata, Z. Yajima, Y. Hirose
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引用次数: 0
Separation of Txrf Peaks and Background Using a Spreadsheet 使用电子表格分离Txrf峰值和背景
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023259
Dennis Brown, B. Cordis, J. V. Gilfrict, C. Dozier
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引用次数: 0
Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity 用x射线衍射和反射率表征薄膜的结构
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023041
D. Brower, B. Medower, Ting C. Huang
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引用次数: 0
Peak Broadening in Asymmetric X-Ray Diffraction Resulting from Chi Tilts Chi倾斜引起的不对称x射线衍射峰展宽
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022928
D. Dragoi, T. Watkins, K. Kozaczek
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引用次数: 1
Novel GIX2 Apparatus for Thin Film Analysis Using Color Laue Method 彩色法薄膜分析的新型GIX2装置
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022588
T. Horiuchi, K. Ishida, K. Hayashi, K. Matsushige, A. Shibata
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引用次数: 4
High Resolution X-ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures [111]B取向InGaAs/GaAs Mqw结构的高分辨率x射线衍射表征
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022850
A. Sanz-Hervás, A. Sacedon, E. Abril, J. Sánchez-Rojas, C. Villar, G. D. Benito, M. Aguilar, M. López, E. Calleja, E. Muñoz
{"title":"High Resolution X-ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures","authors":"A. Sanz-Hervás, A. Sacedon, E. Abril, J. Sánchez-Rojas, C. Villar, G. D. Benito, M. Aguilar, M. López, E. Calleja, E. Muñoz","doi":"10.1154/S0376030800022850","DOIUrl":"https://doi.org/10.1154/S0376030800022850","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"29 1","pages":"439-448"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88359145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection 利用位置敏感x射线探测外延材料的倒易空间映射
Advances in x-ray analysis Pub Date : 1994-10-01 DOI: 10.1007/978-1-4615-1797-9_22
S. R. Lee, B. L. Doyle, T. Drummond, J. Medernach, R. P. Schneider
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引用次数: 10
Fluorine Implantation and Residual Stresses in Polysilicon Films 多晶硅薄膜中的氟注入和残余应力
Advances in x-ray analysis Pub Date : 1994-08-05 DOI: 10.1007/978-1-4615-1797-9_26
L. Lowery, P. Zschack, R. J. Angelis
{"title":"Fluorine Implantation and Residual Stresses in Polysilicon Films","authors":"L. Lowery, P. Zschack, R. J. Angelis","doi":"10.1007/978-1-4615-1797-9_26","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_26","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"19 1","pages":"235-242"},"PeriodicalIF":0.0,"publicationDate":"1994-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82710005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Picosecond x-ray diffraction: System and applications 皮秒x射线衍射:系统和应用
Advances in x-ray analysis Pub Date : 1994-01-01 DOI: 10.1007/978-1-4615-1797-9_3
I. Tomov, P. Chen, P. Rentzepis
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引用次数: 1
A new approach in performing microdiffraction analysis 微衍射分析的一种新方法
Advances in x-ray analysis Pub Date : 1994-01-01 DOI: 10.1007/978-1-4615-1797-9_64
D. Winter, B. Squires
{"title":"A new approach in performing microdiffraction analysis","authors":"D. Winter, B. Squires","doi":"10.1007/978-1-4615-1797-9_64","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_64","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"93 1","pages":"551-556"},"PeriodicalIF":0.0,"publicationDate":"1994-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75904800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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