S. R. Lee, B. L. Doyle, T. Drummond, J. Medernach, R. P. Schneider
{"title":"Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection","authors":"S. R. Lee, B. L. Doyle, T. Drummond, J. Medernach, R. P. Schneider","doi":"10.1007/978-1-4615-1797-9_22","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"201-213"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-1-4615-1797-9_22","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
