发布求助
文献互助 智能选刊 最新文献

Advances in x-ray analysis最新文献

筛选
英文 中文
Measurement of the Refraction Correction for Asymmetric Grazing Incidence Xrd From Rough Surfaces and Powders 粗糙表面和粉末不对称掠入射x射线衍射的折射校正测量
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022795
T. Ely, P. Predecki, X. Zhu, M. Eatough, R. Goehner, R. Lucernoni
{"title":"Measurement of the Refraction Correction for Asymmetric Grazing Incidence Xrd From Rough Surfaces and Powders","authors":"T. Ely, P. Predecki, X. Zhu, M. Eatough, R. Goehner, R. Lucernoni","doi":"10.1154/S0376030800022795","DOIUrl":"https://doi.org/10.1154/S0376030800022795","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"17 1","pages":"381-389"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89580587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe 用电子探针研究掺杂Co的ZnS电子结构
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023302
Z. Spolnik, K. Lawniczak-Jablonska
{"title":"The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe","authors":"Z. Spolnik, K. Lawniczak-Jablonska","doi":"10.1154/S0376030800023302","DOIUrl":"https://doi.org/10.1154/S0376030800023302","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"121 1","pages":"831-835"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72691138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An Update on Standards Activity for Txrf and the Challenges Ahead Txrf标准活动的最新进展和未来的挑战
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023223
R. Hockett
{"title":"An Update on Standards Activity for Txrf and the Challenges Ahead","authors":"R. Hockett","doi":"10.1154/S0376030800023223","DOIUrl":"https://doi.org/10.1154/S0376030800023223","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"15 1","pages":"767-770"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73920387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Quantitative XRFA of carbon in a special matrix by the fundamental parameter method 用基本参数法定量分析特定基体中的碳
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.2172/264594
F. Weber, L. D. Silva, T. Barbee, D. Ciarlo, M. Mantler
{"title":"Quantitative XRFA of carbon in a special matrix by the fundamental parameter method","authors":"F. Weber, L. D. Silva, T. Barbee, D. Ciarlo, M. Mantler","doi":"10.2172/264594","DOIUrl":"https://doi.org/10.2172/264594","url":null,"abstract":"We report on results obtained from experiments using specially prepared carbon substrates and treatment of the data by means of recently introduced theory. Medium Z grids with known parameters have been coated on top of pyrolytic carbon substrates to achieve well defined absorption geometries. The various copper grids exhibit satisfactory performance in terms of mechanical stability, homogeneity and uniformity of the coating. A detailed study of the measurement results shows that there is a more rapid increase of the associated C-K{alpha} countrate from the coated samples compared to the pure elements and is attributed to the contribution of secondary enhancement effects, including those resulting from photoelectrons generated after the primary ionization. A variety of multilayer analyzers has also been evaluated during these experiments. Only a certain combination of muitilayer component materials have been found to be appropriate for use as dispersing elements due to the reflectivity and spatial resolution requirements of our long wavelength spectrometer. Another experimental factor is the low intensity of available tube photons which is due to the selection of the target material and absorption effects in the target as well as the tube window. 12 refs., 7 figs., 2 tabs.","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"117 1","pages":"821-829"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89813663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Elastic Anisotrophy and Residual Stress in Textured Production Electrolytic Chromium Coatings on Steel 织构生产钢电解铬涂层的弹性各向异性和残余应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022667
S. L. Lee, G. Capsimalis
{"title":"Elastic Anisotrophy and Residual Stress in Textured Production Electrolytic Chromium Coatings on Steel","authors":"S. L. Lee, G. Capsimalis","doi":"10.1154/S0376030800022667","DOIUrl":"https://doi.org/10.1154/S0376030800022667","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"45 1","pages":"257-266"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84243789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Inhomogeneous Deformation in Thin Films 薄膜中的非均匀变形
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023053
I. C. Noyan, C. Goldsmith
{"title":"Inhomogeneous Deformation in Thin Films","authors":"I. C. Noyan, C. Goldsmith","doi":"10.1154/S0376030800023053","DOIUrl":"https://doi.org/10.1154/S0376030800023053","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"63 1","pages":"627-635"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89500243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rietveld Refinement of YBa2Cu3-xNixOy Prepared by Quenching and Oxygen Gettering 淬火吸氧法制备YBa2Cu3-xNixOy的Rietveld细化
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002303X
M. Rodriguez, M. Eatough, F. Licci
{"title":"Rietveld Refinement of YBa2Cu3-xNixOy Prepared by Quenching and Oxygen Gettering","authors":"M. Rodriguez, M. Eatough, F. Licci","doi":"10.1154/S037603080002303X","DOIUrl":"https://doi.org/10.1154/S037603080002303X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"17 1","pages":"607-614"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81174178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
X-Ray Residual Stress Measurement of Ground Tungsten Carbides with Various Cobalt Contents 不同钴含量研磨碳化钨的x射线残余应力测量
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022722
M. Miyano, Y. Hirose
{"title":"X-Ray Residual Stress Measurement of Ground Tungsten Carbides with Various Cobalt Contents","authors":"M. Miyano, Y. Hirose","doi":"10.1154/S0376030800022722","DOIUrl":"https://doi.org/10.1154/S0376030800022722","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"68 1","pages":"311-318"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73496820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Application of Xrf to the Detection and Estimation of Metals in Toxicological Specimens Xrf在毒理学样品中金属含量检测与评价中的应用
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023351
D. Rendle, J. Taylor
{"title":"Application of Xrf to the Detection and Estimation of Metals in Toxicological Specimens","authors":"D. Rendle, J. Taylor","doi":"10.1154/S0376030800023351","DOIUrl":"https://doi.org/10.1154/S0376030800023351","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"869-879"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76466899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Energy Dispersive Measurement of X-Ray Tube Spectra x射线管光谱的能量色散测量
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022540
H. Aiginger, M. Benedikt, R. Görgl
{"title":"Energy Dispersive Measurement of X-Ray Tube Spectra","authors":"H. Aiginger, M. Benedikt, R. Görgl","doi":"10.1154/S0376030800022540","DOIUrl":"https://doi.org/10.1154/S0376030800022540","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"72 1","pages":"137-147"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76168207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信