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Advances in x-ray analysis最新文献

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X-Ray Fluorescence Cross-Section Measurements in the Energy Range 4-18 keV 能量范围4- 18kev的x射线荧光截面测量
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023326
K. Stoev, J. F. Dlouhy
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引用次数: 0
Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region 可变光束几何形状的Xrf深度剖面在纳米区域薄膜中的应用
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023119
H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen
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引用次数: 0
Comparison of Various Descriptions of X-Ray Tube Spectra x射线管光谱各种描述的比较
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022539
B. Schossmann, H. Wiederschwinger, H. Ebel, J. Wernisch
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引用次数: 5
Generation of 1-10 Ps Hard X-Rav Pulses for Time Resolved X-Ray Diffraction 用于时间分辨x射线衍射的1- 10ps硬x射线脉冲的产生
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022497
P. Chen, I. Tomov, P. Rentzepis
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引用次数: 1
Residual Stress in Si3N4-Passivated GaAs Wafers si3n4钝化GaAs晶圆中的残余应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022631
A. Ward, R. Hendricks
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引用次数: 1
Txrf-Sources-Samples and Detectors txrf -源-样本和检测器
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023211
P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke
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引用次数: 3
Modeling and Optimization Algorithm to Analyse Xrpd Data Via Modulation and Pseudo-Voigt Functions 利用调制和伪voigt函数分析Xrpd数据的建模和优化算法
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022886
G. Berti
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引用次数: 1
Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection 利用全反射干涉效应的x射线荧光分析薄膜中特定界面
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023132
K. Sakurai, A. Iida
{"title":"Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection","authors":"K. Sakurai, A. Iida","doi":"10.1154/S0376030800023132","DOIUrl":"https://doi.org/10.1154/S0376030800023132","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"49 1","pages":"695-700"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76779079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Application of Graded Multilayer Optics in X-Ray Diffraction 梯度多层光学在x射线衍射中的应用
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002245X
M. Schuster, H. Göbel
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引用次数: 25
Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semrcrystallkve Polymers 低结晶半晶聚合物的x射线衍射扫描分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002293X
N. Murthy
{"title":"Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semrcrystallkve Polymers","authors":"N. Murthy","doi":"10.1154/S037603080002293X","DOIUrl":"https://doi.org/10.1154/S037603080002293X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"21 1","pages":"505-514"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82056464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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