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Advances in x-ray analysis最新文献

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Modeling and Optimization Algorithm to Analyse Xrpd Data Via Modulation and Pseudo-Voigt Functions 利用调制和伪voigt函数分析Xrpd数据的建模和优化算法
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022886
G. Berti
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引用次数: 1
Generation of 1-10 Ps Hard X-Rav Pulses for Time Resolved X-Ray Diffraction 用于时间分辨x射线衍射的1- 10ps硬x射线脉冲的产生
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022497
P. Chen, I. Tomov, P. Rentzepis
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引用次数: 1
An Analysis of Macro- and Microstresses Around a Fatigue Crack Tip 疲劳裂纹尖端的宏观和微观应力分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002276X
J. Almer, J. Cohen, W. Kirk, R. Winholtz
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引用次数: 1
Residual Stress in Si3N4-Passivated GaAs Wafers si3n4钝化GaAs晶圆中的残余应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022631
A. Ward, R. Hendricks
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引用次数: 1
Txrf-Sources-Samples and Detectors txrf -源-样本和检测器
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023211
P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke
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引用次数: 3
Residual Stress in Thin Films of Rf-Sputtered Aluminum by X-ray Multtaxial Stress Measurement 用x射线多轴应力测量射频溅射铝薄膜中的残余应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022849
Sho Ejiri, Zheng Lin, T. Sasaki, Y. Hirose
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引用次数: 0
Oxide Scale Stresses in Polycrystalune Cu/Cu2O System 多晶Cu/Cu2O体系中的氧化皮应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022837
N. Jayaraman, P. Rangaswamy
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引用次数: 2
Application of Graded Multilayer Optics in X-Ray Diffraction 梯度多层光学在x射线衍射中的应用
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002245X
M. Schuster, H. Göbel
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引用次数: 25
Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semrcrystallkve Polymers 低结晶半晶聚合物的x射线衍射扫描分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002293X
N. Murthy
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引用次数: 0
X-Ray Powder Diffraction Patterns as Random Fractals 随机分形的x射线粉末衍射图样
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023193
D. T. Griffen, K. Sullivan
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引用次数: 0
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