发布求助
文献互助 智能选刊 最新文献

Advances in x-ray analysis最新文献

筛选
英文 中文
Analysis of Residual Stress States in Coarse Grained and Single Crystal Nickel-Base Superalloys 粗晶和单晶镍基高温合金残余应力状态分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022618
W. Reimers
{"title":"Analysis of Residual Stress States in Coarse Grained and Single Crystal Nickel-Base Superalloys","authors":"W. Reimers","doi":"10.1154/S0376030800022618","DOIUrl":"https://doi.org/10.1154/S0376030800022618","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"56 1","pages":"211-223"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72686344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Refined Determination of the Structure of Kerogen Etc. by Xrd and its Significance 用Xrd精细化测定干酪根等的结构及其意义
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022977
Wei Mingxin, Liu Delian, Cheng Deyu, Wang Guan-xin
{"title":"Refined Determination of the Structure of Kerogen Etc. by Xrd and its Significance","authors":"Wei Mingxin, Liu Delian, Cheng Deyu, Wang Guan-xin","doi":"10.1154/S0376030800022977","DOIUrl":"https://doi.org/10.1154/S0376030800022977","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"36 1","pages":"553-560"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85559603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Determination of Thickness and Composition of Thin AlxGa1-xAs Films on GaAs substrates by Total Electron Yield (Tey) Measurements 用总电子产额(Tey)测定GaAs衬底上AlxGa1-xAs薄膜的厚度和组成
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023120
H. Ebel, R. Svagera, M. Ebel, N. Zagler
{"title":"Determination of Thickness and Composition of Thin AlxGa1-xAs Films on GaAs substrates by Total Electron Yield (Tey) Measurements","authors":"H. Ebel, R. Svagera, M. Ebel, N. Zagler","doi":"10.1154/S0376030800023120","DOIUrl":"https://doi.org/10.1154/S0376030800023120","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"2 1","pages":"683-694"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84589984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sample Curvature Effects on d-versus-sin2ѱ plots for Residual Stress Analysis 样品曲率对残余应力分析d- vs - sin2<e:1>图的影响
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022692
A. Ward, H. Allison, Brian Zimmerman, R. Hendricks
{"title":"Sample Curvature Effects on d-versus-sin2ѱ plots for Residual Stress Analysis","authors":"A. Ward, H. Allison, Brian Zimmerman, R. Hendricks","doi":"10.1154/S0376030800022692","DOIUrl":"https://doi.org/10.1154/S0376030800022692","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"64 1","pages":"291-296"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88916604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners 掠入射衍射测量的新工具:不同主次光束调理器的比较
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022485
R. Stabenow, A. Haase
{"title":"New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners","authors":"R. Stabenow, A. Haase","doi":"10.1154/S0376030800022485","DOIUrl":"https://doi.org/10.1154/S0376030800022485","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"18 1","pages":"87-94"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75028519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Assessing the Validity of Diffraction Stress Data with the Goodness-Of-Fit Statistic 用拟合优度统计评价衍射应力数据的有效性
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022680
Thomas A. Lohkamp, R. A. Winhoitz
{"title":"Assessing the Validity of Diffraction Stress Data with the Goodness-Of-Fit Statistic","authors":"Thomas A. Lohkamp, R. A. Winhoitz","doi":"10.1154/S0376030800022680","DOIUrl":"https://doi.org/10.1154/S0376030800022680","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"9 1","pages":"281-289"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74746284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Oxide Scale Stresses in Polycrystalune Cu/Cu2O System 多晶Cu/Cu2O体系中的氧化皮应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022837
N. Jayaraman, P. Rangaswamy
{"title":"Oxide Scale Stresses in Polycrystalune Cu/Cu2O System","authors":"N. Jayaraman, P. Rangaswamy","doi":"10.1154/S0376030800022837","DOIUrl":"https://doi.org/10.1154/S0376030800022837","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"18 1","pages":"421-432"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81492116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF 含轻元素薄膜和多层薄膜的XRF分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800023144
M. Kaufmann, M. Mantler, F. Weber
{"title":"Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF","authors":"M. Kaufmann, M. Mantler, F. Weber","doi":"10.1154/S0376030800023144","DOIUrl":"https://doi.org/10.1154/S0376030800023144","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"16 1","pages":"701-706"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85979426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An Analysis of Macro- and Microstresses Around a Fatigue Crack Tip 疲劳裂纹尖端的宏观和微观应力分析
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S037603080002276X
J. Almer, J. Cohen, W. Kirk, R. Winholtz
{"title":"An Analysis of Macro- and Microstresses Around a Fatigue Crack Tip","authors":"J. Almer, J. Cohen, W. Kirk, R. Winholtz","doi":"10.1154/S037603080002276X","DOIUrl":"https://doi.org/10.1154/S037603080002276X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"353-361"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79811344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Residual Stress in Thin Films of Rf-Sputtered Aluminum by X-ray Multtaxial Stress Measurement 用x射线多轴应力测量射频溅射铝薄膜中的残余应力
Advances in x-ray analysis Pub Date : 1995-01-01 DOI: 10.1154/S0376030800022849
Sho Ejiri, Zheng Lin, T. Sasaki, Y. Hirose
{"title":"Residual Stress in Thin Films of Rf-Sputtered Aluminum by X-ray Multtaxial Stress Measurement","authors":"Sho Ejiri, Zheng Lin, T. Sasaki, Y. Hirose","doi":"10.1154/S0376030800022849","DOIUrl":"https://doi.org/10.1154/S0376030800022849","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"19 1","pages":"433-438"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81487413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信
小红书