可变光束几何形状的Xrf深度剖面在纳米区域薄膜中的应用

{"title":"可变光束几何形状的Xrf深度剖面在纳米区域薄膜中的应用","authors":"H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen","doi":"10.1154/S0376030800023119","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"7 1","pages":"675-682"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region\",\"authors\":\"H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen\",\"doi\":\"10.1154/S0376030800023119\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":7518,\"journal\":{\"name\":\"Advances in x-ray analysis\",\"volume\":\"7 1\",\"pages\":\"675-682\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advances in x-ray analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1154/S0376030800023119\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1154/S0376030800023119","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}