Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer
{"title":"X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films","authors":"Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer","doi":"10.1154/S0376030800022606","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"52 1","pages":"195-210"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in x-ray analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1154/S0376030800022606","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}