L. Langhammer, R. Sotner, Jan Dvorak, J. Jerabek, Miroslav Zapletal
{"title":"Fully-Differential Universal Frequency Filter with Dual-Parameter Control of the Pole Frequency and Quality Factor","authors":"L. Langhammer, R. Sotner, Jan Dvorak, J. Jerabek, Miroslav Zapletal","doi":"10.1109/ISCAS.2018.8351005","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351005","url":null,"abstract":"The paper presents a proposal of modified 2nd-order fully-differential universal frequency filter. Both the pole frequency and quality factor (controlled without disturbing each other) of the filter can be controlled by two independent parameters (i.e. dual-parameter control) in order to increase the range of their control. It is the main improvement in comparison to recent state-of-the-art. The function of the proposed filter has been verified by PSpice simulations and also by experimental measurements.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"21 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83275300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Novel Sensing Circuit with Large Sensing Margin for Embedded Spin-Transfer Torque MRAMs","authors":"Leila Bagheriye, S. Toofan, R. Saeidi, F. Moradi","doi":"10.1109/ISCAS.2018.8351577","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351577","url":null,"abstract":"Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) has emerged as a promising candidate for next-generation computing systems. However, with increasing process variation and decreasing supply voltage, a big design challenge of embedded STT-MRAMs is to guarantee negligible read-disturbance and high yield. In this paper, to deal with the read reliability challenge, a sensing circuit with strong positive feedback and a high sensing margin is proposed. It improves the sensing margin (SM) by 10.42×/3.3× and a with 1.24×/1.59× lower read energy at iso-sensing time (2ns) in comparison with the conventional sensing scheme and the state-of-the art current-sampling-based sensing circuit. Moreover the proposed scheme supports six sigma and higher yield for both states 0 and 1, while the compared schems fail.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"15 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85252048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jeferson F. Chaves, M. A. Ribeiro, F. Sill, O. V. Neto
{"title":"Enhancing Fundamental Energy Limits of Field-Coupled Nanocomputing Circuits","authors":"Jeferson F. Chaves, M. A. Ribeiro, F. Sill, O. V. Neto","doi":"10.1109/ISCAS.2018.8351150","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351150","url":null,"abstract":"Energy dissipation of future integrated systems, consisting of a myriad of devices, is a challenge that cannot be solved solely by emerging technologies and process improvements. Even though approaches like Field-Coupled Nanocomputing allow computations near the fundamental energy limits, there is a demand for strategies that enable the recycling of bits' energy to avoid thermalization of information. In this direction, we propose a new kind of partially reversible systems by exploiting fan-outs in logic networks. We have also introduced a computationally efficient method to evaluate the gain obtained by our strategy. Simulation results for state-of-the-art benchmarks indicate an average reduction of the fundamental energy limit by 17% without affecting the delay. If delay is not the main concern, the average reduction reaches even 51%. To the best of our knowledge, this work presents the first post-synthesis strategy to reduce fundamental energy limits for Field-Coupled Nanocomputing circuits.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"30 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77432640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 35μW 64 × 64 Pixels Vision Sensor Embedding Local Binary Pattern Code Computation","authors":"M. Gottardi, M. Lecca","doi":"10.1109/ISCAS.2018.8351037","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351037","url":null,"abstract":"This paper presents a 64 × 64 pixels vision sensor embedding pixel-wise computation of the Local Binary Pattern (LBP) code, which is an oriented, binary, vector contrast that is widely used for texture description and retrieval. For each pixel, the sensor estimates the LBP code over four neighbors in a 3×3 pixel kernel. The image processing is performed inside each pixel during the integration time over a dynamic range up to 98dB, thanks to a pixel-level auto-exposure control. The contrast detection relies on the estimation of the time difference between two pixels thresholded against two reference voltages. The four binary signed contrast vectors are delivered to the output, coded into 4-bit/pixel. The 0.35μm CMOS sensor features a power consumption of 35μW at 3.3V and 15fps.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"56 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77447936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Sub-pico Joules Per Bit Robust Physical Unclonable Function Based on Subthreshold Voltage References","authors":"Yuan Cao, Chip-Hong Chang, Wenhan Zheng, Xiaojin Zhao","doi":"10.1109/ISCAS.2018.8351253","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351253","url":null,"abstract":"Low power, lightweight and robust physical unclonable function (PUF) is a sought-after for IoT device identification/authentication. This paper presents a low power PUF design with high reliability against temperature and supply voltage variations. A response bit is extracted by comparing a pair of identically designed subthreshold voltage references. The voltage difference due to device mismatch is digitized and registered in a bidirectional counter, which can be used to identify and filter out the unstable response bits. The readout circuit works in tandem with the proposed double sampling technique to reduce the bias of components that are not the main entropy source of response bits. The proposed design is evaluated by extensive simulation using standard 65 nm CMOS process. It consumes merely 0.16 pJ/bit. The simulated uniqueness is an almost ideal 50.03%. Due to the intrinsic stability of voltage references, the reliability of its native response is 98.17% for the supply voltage variation from 1 V to 1.4 V and 97.60% for the temperature variation from 0 ° C to 80 °C. The generated response bitstream has passed both the autocorrelation test and NIST randomness test.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"1 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90576173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A bi-directional Address-Event transceiver block for low-latency inter-chip communication in neuromorphic systems","authors":"Ning Qiao, G. Indiveri","doi":"10.1109/ISCAS.2018.8351623","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351623","url":null,"abstract":"Neuromorphic systems typically use the Address-Event Representation (AER) to transmit signals among nodes, cores, and chips. Communication of Address-Events (AEs) between neuromorphic cores/chips typically requires two parallel digital signal buses for Input/Output (I/O) operations. This requirement can become very expensive for large-scale systems in terms of both dedicated I/O pins and power consumption. In this paper we present a compact fully asynchronous event-driven transmitter/receiver block that is both power efficient and I/O efficient. This block implements high-throughput low-latency bi-directional communication through a parallel AER bus. We show that by placing the proposed AE transceiver block in two separate chips and linking them by a single AER bus, we can drive the communication and switch the transmission direction of the shared bus on a single event basis, from either side with low-latency. We present experimental results that validate the circuits proposed and demonstrate reliable bi-directional event transmission with high-throughput. The proposed AE block, integrated in a neuromorphic chip fabricated using a 28 nm FDSOI process, occupies a silicon die area of 140 μm × 70 μm. The experimental measurements show that the event-driven AE block combined with standard digital I/Os has a direction switch latency of 5 ns and can achieve a worst-case bi-directional event transmission throughput of 28.6M Events/second while consuming 11 pJ per event (26-bit) delivery.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"73 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83933784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Weis, Matthias Jung, Éder F. Zulian, C. Sudarshan, Deepak M. Mathew, N. Wehn
{"title":"The Role of Memories in Transprecision Computing","authors":"C. Weis, Matthias Jung, Éder F. Zulian, C. Sudarshan, Deepak M. Mathew, N. Wehn","doi":"10.1109/ISCAS.2018.8351768","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351768","url":null,"abstract":"Computing paradigms largely evolved over the last decades mainly driven by continuously increasing performance requirements, energy efficiency and power density challenges. Heterogeneous highly parallel architectures enhanced with dedicated accelerators tuned to specific applications, near-threshold computing, and recently approximate computing are examples of these new approaches. In this context the memory part was relatively untouched. However, memories play a central role in any computing system, are a major source of power consumption, and limit in many applications the overall compute performance. In this paper, we focus mainly on Dynamic Random Access Memories (DRAMs), which are today's most prominent external memories. In transprecision computing we address the DRAM memory challenge by several new approaches that are strongly related to the new techniques known on the compute side. In particular, these are the concept of approximate DRAM, advanced power-down modes and the integration of application knowledge into the memory system.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"16 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76761394","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Active IC Metering of Digital Signal Processing Subsystem with Two-Tier Activation for Secure Split Test","authors":"S. Dhabu, Yue Zheng, Wenye Liu, Chip-Hong Chang","doi":"10.1109/ISCAS.2018.8351390","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351390","url":null,"abstract":"Active integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of individual methods into a secure functional lock on digital signal processing submodule of wireless communication system to avoid legitimate channel exploitation and the risk of deploying unreliable out-of-specs gray market ICs. Our method makes use of aging-sensitive physical unclonable function to enable a two-tier activation of ICs in split test flow to track chip supply after production tests. Extraneous states are inserted into the state-space mapping of digital signal processing submodule as opposed to controller to provide a stronger state dependency on datapath and input signal. The scheme is illustrated experimentally on a pulse shaping filter of the transmitter for a wireless communication system.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"578 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77203611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ray Lattarulo, E. Martí, M. Marcano, Jose A. Matute, Joshué Pérez
{"title":"A Speed Planner Approach Based On Bézier Curves Using Vehicle Dynamic Constrains and Passengers Comfort","authors":"Ray Lattarulo, E. Martí, M. Marcano, Jose A. Matute, Joshué Pérez","doi":"10.1109/ISCAS.2018.8351307","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351307","url":null,"abstract":"This paper presents a speed profile generation approach for longitudinal control of automated vehicles, based on quintic Bézier curves. The described method aims to increase comfort level of passengers based on the ISO2631-1 specification, while taking into account vehicle dynamics and traffic rules to keep high safety levels. The algorithm has been tested in an in-house tool for high accuracy vehicle dynamics simulations, called Dynacar. The considered scenario is a closed circuit inside Tecnalia facilities. The resulting profile has better properties (for example, rate of change) than a raw input based on traffic speed limits. When used as reference for the speed controller, it improves both comfort and safety.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"26 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85431037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Prefix Sequence: Optimization of Parallel Prefix Adders using Simulated Annealing","authors":"Takayuki Moto, M. Kaneko","doi":"10.1109/ISCAS.2018.8351414","DOIUrl":"https://doi.org/10.1109/ISCAS.2018.8351414","url":null,"abstract":"Parallel prefix adder is a type of adder design which emphasizes the parallelism on carry propagations, and can trade-off between the circuit size and the logical depth. This paper proposes a novel approach to the optimization of parallel prefix structure, which is based on Simulated Annealing (SA), a stochastic search of solution space, with respect to parallel prefix structures. A coding scheme named “prefix sequence” for representing the structure of parallel prefix adder and its application to SA-based search are main proposals of this paper. Finally, the advantage of our approach is demonstrated through design experiment.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"05 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85973980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}