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Journal of Electronic Testing-Theory and Applications最新文献

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A Complete Design-for-Test Scheme for Reconfigurable Scan Networks 可重构扫描网络的完整测试设计方案
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06038-3
N. Lylina, Chih-Hao Wang, H. Wunderlich
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引用次数: 1
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit 尺寸和缩放对RHBD SRAM电路功耗和弹性的影响
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-11-18 DOI: 10.1007/s10836-022-06036-5
Neha Pannu, N. R. Prakash, Jasbir Kaur
{"title":"Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit","authors":"Neha Pannu, N. R. Prakash, Jasbir Kaur","doi":"10.1007/s10836-022-06036-5","DOIUrl":"https://doi.org/10.1007/s10836-022-06036-5","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"579 - 587"},"PeriodicalIF":0.9,"publicationDate":"2022-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45228389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function 使用稳定和不稳定SRAM位实现物理不可控制功能
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-10-01 DOI: 10.1007/s10836-022-06025-8
Zhi-Wei Lai, Po-Hua Huang, Kuen-Jong Lee
{"title":"Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function","authors":"Zhi-Wei Lai, Po-Hua Huang, Kuen-Jong Lee","doi":"10.1007/s10836-022-06025-8","DOIUrl":"https://doi.org/10.1007/s10836-022-06025-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"511 - 525"},"PeriodicalIF":0.9,"publicationDate":"2022-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49564955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2021 JETTA-TTTC Best Paper Award 2021年捷达- tttc最佳论文奖
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-10-01 DOI: 10.1007/s10836-022-06031-w
T. Copetti, G. Medeiros, M. Taouil, Said Hamdioui, Letícia, Bolzani Poehls, Tiago Balen
{"title":"2021 JETTA-TTTC Best Paper Award","authors":"T. Copetti, G. Medeiros, M. Taouil, Said Hamdioui, Letícia, Bolzani Poehls, Tiago Balen","doi":"10.1007/s10836-022-06031-w","DOIUrl":"https://doi.org/10.1007/s10836-022-06031-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"465 - 467"},"PeriodicalIF":0.9,"publicationDate":"2022-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44717694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test Technology Newsletter 测试技术通讯
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-10-01 DOI: 10.1007/s10836-022-06030-x
{"title":"Test Technology Newsletter","authors":"","doi":"10.1007/s10836-022-06030-x","DOIUrl":"https://doi.org/10.1007/s10836-022-06030-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"33 1","pages":"379-380"},"PeriodicalIF":0.9,"publicationDate":"2022-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46337065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Design of Rounding-Based Approximate Multiplier Using Modified Karatsuba Algorithm 基于改进Karatsuba算法的舍入近似乘法器的高效设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-10-01 DOI: 10.1007/s10836-022-06029-4
E. Rao, K. T. Rao, K. S. Ramya, D. Ajaykumar, R. Trinadh
{"title":"Efficient Design of Rounding-Based Approximate Multiplier Using Modified Karatsuba Algorithm","authors":"E. Rao, K. T. Rao, K. S. Ramya, D. Ajaykumar, R. Trinadh","doi":"10.1007/s10836-022-06029-4","DOIUrl":"https://doi.org/10.1007/s10836-022-06029-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"567-574"},"PeriodicalIF":0.9,"publicationDate":"2022-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48039552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach 自修复控制器缓解基于FPGA的系统控制路径中的SEU：一种完整的内在进化方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-09-28 DOI: 10.1007/s10836-022-06027-6
S. Deepanjali, N. Sk
{"title":"Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach","authors":"S. Deepanjali, N. Sk","doi":"10.1007/s10836-022-06027-6","DOIUrl":"https://doi.org/10.1007/s10836-022-06027-6","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"547-565"},"PeriodicalIF":0.9,"publicationDate":"2022-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48359637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm 通过层次分裂聚类算法实现项目的敏捷性
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-09-23 DOI: 10.1007/s10836-022-06024-9
Janani Varun, R. A. Karthika
{"title":"Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm","authors":"Janani Varun, R. A. Karthika","doi":"10.1007/s10836-022-06024-9","DOIUrl":"https://doi.org/10.1007/s10836-022-06024-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"471 - 479"},"PeriodicalIF":0.9,"publicationDate":"2022-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43161068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Review of Various Defects in PCB PCB中各种缺陷的综述
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-09-23 DOI: 10.1007/s10836-022-06026-7
V. U. Sankar, G. Lakshmi, Y. S. Sankar
{"title":"A Review of Various Defects in PCB","authors":"V. U. Sankar, G. Lakshmi, Y. S. Sankar","doi":"10.1007/s10836-022-06026-7","DOIUrl":"https://doi.org/10.1007/s10836-022-06026-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"481 - 491"},"PeriodicalIF":0.9,"publicationDate":"2022-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48099064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach 印刷电路板动力学对电子连接器微动磨损的影响:一种动态分析方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-09-10 DOI: 10.1007/s10836-022-06022-x
S. Doranga, Jenny Zhou, R. Poudel
{"title":"Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach","authors":"S. Doranga, Jenny Zhou, R. Poudel","doi":"10.1007/s10836-022-06022-x","DOIUrl":"https://doi.org/10.1007/s10836-022-06022-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"493 - 510"},"PeriodicalIF":0.9,"publicationDate":"2022-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52280963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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