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Journal of Electronic Testing-Theory and Applications最新文献

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Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection 数据流软错误检测的可靠性与性能权衡机制
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-11-02 DOI: 10.1007/s10836-023-06087-2
Zhenyu Zhao, Xin Chen, Yufan Lu
{"title":"Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection","authors":"Zhenyu Zhao, Xin Chen, Yufan Lu","doi":"10.1007/s10836-023-06087-2","DOIUrl":"https://doi.org/10.1007/s10836-023-06087-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"188 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135933159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms 基于matlab -开源工具的基于进化算法的数字电路测试生成框架
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-10-24 DOI: 10.1007/s10836-023-06088-1
Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka
{"title":"MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms","authors":"Priyajit Bhattacharya, Rahul Bhattacharya, Himasree Deka","doi":"10.1007/s10836-023-06088-1","DOIUrl":"https://doi.org/10.1007/s10836-023-06088-1","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"33 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135273292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN 基于暹罗- cnn的未知电磁干扰源识别
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-10-12 DOI: 10.1007/s10836-023-06082-7
Ying-Chun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang
{"title":"Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN","authors":"Ying-Chun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang","doi":"10.1007/s10836-023-06082-7","DOIUrl":"https://doi.org/10.1007/s10836-023-06082-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136013329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells 基于电流镜和WTA单元的低位不稳定性CMOS PUF
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-09-15 DOI: 10.1007/s10836-023-06085-4
Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad
{"title":"A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells","authors":"Joseph Herbert Mitchell-Moreno, Guillermo Espinosa Flores-Verdad","doi":"10.1007/s10836-023-06085-4","DOIUrl":"https://doi.org/10.1007/s10836-023-06085-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135437073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns 利用功能驱动模式在线诊断和修复雏菊链MEDA生物芯片中的缺陷细胞
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06081-8
Ling Zhang
{"title":"Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns","authors":"Ling Zhang","doi":"10.1007/s10836-023-06081-8","DOIUrl":"https://doi.org/10.1007/s10836-023-06081-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135003946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection 基于概率Xgboost分类器的硬件木马检测阈值分析
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06079-2
Tapobrata Dhar, Ranit Das, C. Giri, S. Roy
{"title":"Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection","authors":"Tapobrata Dhar, Ranit Das, C. Giri, S. Roy","doi":"10.1007/s10836-023-06079-2","DOIUrl":"https://doi.org/10.1007/s10836-023-06079-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"447 - 463"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42686734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model 基于结构和SCOAP特征的SHAP和光梯度增强模型硬件木马检测方法
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06080-9
Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant
{"title":"Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model","authors":"Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant","doi":"10.1007/s10836-023-06080-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06080-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135002464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network 指数深度学习神经网络在模拟和数字电路故障诊断中的应用
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06078-3
R. Saravana, ·. M. Lordwin, Cecil Prabhaker, M. Lordwin
{"title":"Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network","authors":"R. Saravana, ·. M. Lordwin, Cecil Prabhaker, M. Lordwin","doi":"10.1007/s10836-023-06078-3","DOIUrl":"https://doi.org/10.1007/s10836-023-06078-3","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"421 - 433"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43937409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New Second-order Threshold Implementation of Sm4 Block Cipher Sm4分组密码新的二阶门限实现
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06076-5
Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu
{"title":"New Second-order Threshold Implementation of Sm4 Block Cipher","authors":"Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu","doi":"10.1007/s10836-023-06076-5","DOIUrl":"https://doi.org/10.1007/s10836-023-06076-5","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"435 - 445"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49379002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System 利用可扩展和多用途自动化测试系统对空间收发模块进行有效测试和表征
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06077-4
V. Chippalkatti, R. Biradar, Venkatesh Shenoy, P. Udayakumar
{"title":"Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System","authors":"V. Chippalkatti, R. Biradar, Venkatesh Shenoy, P. Udayakumar","doi":"10.1007/s10836-023-06077-4","DOIUrl":"https://doi.org/10.1007/s10836-023-06077-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"501 - 519"},"PeriodicalIF":0.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47712604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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