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Journal of Electronic Testing-Theory and Applications最新文献

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Test Technology Newsletter 测试技术通讯
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06083-6
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引用次数: 0
Editorial 编辑
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-08-01 DOI: 10.1007/s10836-023-06084-5
V. Agrawal
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引用次数: 0
E3C Techniques for Protecting NAND Flash Memories 用于保护NAND闪存的E3C技术
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-07-01 DOI: 10.1007/s10836-023-06075-6
Shyue-Kung Lu, Zeng-Long Tsai
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引用次数: 0
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems 容错近似系统不同表决方案的可靠性评估
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-20 DOI: 10.1007/s10836-023-06072-9
T. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar Da Rosa Jr., R. I. Soares, R. Schvittz, N. Added, E. Macchione, V. Aguiar, M. Guazzelli, Nilberto H. Medina, P. Butzen
{"title":"Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems","authors":"T. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar Da Rosa Jr., R. I. Soares, R. Schvittz, N. Added, E. Macchione, V. Aguiar, M. Guazzelli, Nilberto H. Medina, P. Butzen","doi":"10.1007/s10836-023-06072-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06072-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42203351","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing 模块化测试套件-高效和功能导向测试的模块化方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-01 DOI: 10.1007/s10836-023-06063-w
Benedikt Jooß, D. Schramm
{"title":"Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing","authors":"Benedikt Jooß, D. Schramm","doi":"10.1007/s10836-023-06063-w","DOIUrl":"https://doi.org/10.1007/s10836-023-06063-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48969690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection 基于多目标优化的硬件木马检测测试模式生成
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-01 DOI: 10.1007/s10836-023-06071-w
V. Rathor, Deepak Singh, Simranjith Singh, Mohit Sajwan
{"title":"Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection","authors":"V. Rathor, Deepak Singh, Simranjith Singh, Mohit Sajwan","doi":"10.1007/s10836-023-06071-w","DOIUrl":"https://doi.org/10.1007/s10836-023-06071-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49258269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test Technology Newsletter 测试技术通讯
4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-01 DOI: 10.1007/s10836-023-06073-8
{"title":"Test Technology Newsletter","authors":"","doi":"10.1007/s10836-023-06073-8","DOIUrl":"https://doi.org/10.1007/s10836-023-06073-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136280762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Editorial 编辑
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-01 DOI: 10.1007/s10836-023-06074-7
V. Agrawal
{"title":"Editorial","authors":"V. Agrawal","doi":"10.1007/s10836-023-06074-7","DOIUrl":"https://doi.org/10.1007/s10836-023-06074-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45956059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm 一种基于元启发式的软件突变检测方法——基于离散化和改进的Forrest优化算法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-06-01 DOI: 10.1007/s10836-023-06070-x
Bahman Arasteh, F. S. Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar
{"title":"A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm","authors":"Bahman Arasteh, F. S. Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar","doi":"10.1007/s10836-023-06070-x","DOIUrl":"https://doi.org/10.1007/s10836-023-06070-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42789232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Incomplete Testing of SOC SOC测试不完整
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-05-29 DOI: 10.1007/s10836-023-06067-6
Kunwer Mrityunjay Singh, J. Deka, S. Biswas
{"title":"Incomplete Testing of SOC","authors":"Kunwer Mrityunjay Singh, J. Deka, S. Biswas","doi":"10.1007/s10836-023-06067-6","DOIUrl":"https://doi.org/10.1007/s10836-023-06067-6","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49356966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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