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Journal of Electronic Testing-Theory and Applications最新文献

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Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations 基于TCAD和SPICE耦合仿真的阻性RAM存储阵列单事件效应研究
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-05-25 DOI: 10.1007/s10836-023-06068-5
K. Coulié, H. Aziza, W. Rahajandraibe
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引用次数: 0
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits 集成电路中非反馈和反馈桥接故障的灵活并行测试方案
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-05-24 DOI: 10.1007/s10836-023-06066-7
P. Biswal
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引用次数: 0
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems BISCC：一种用于混合信号/RF系统快速容量验证的内置状态一致性检查新方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-05-18 DOI: 10.1007/s10836-023-06062-x
Sabyasachi Deyati, B. Muldrey, A. Chatterjee
{"title":"BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems","authors":"Sabyasachi Deyati, B. Muldrey, A. Chatterjee","doi":"10.1007/s10836-023-06062-x","DOIUrl":"https://doi.org/10.1007/s10836-023-06062-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"303 - 322"},"PeriodicalIF":0.9,"publicationDate":"2023-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46808935","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets 低开销和高稳定性辐射硬化闩锁双/三节点翻转
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-05-09 DOI: 10.1007/s10836-023-06064-9
Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan
{"title":"Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets","authors":"Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan","doi":"10.1007/s10836-023-06064-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06064-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":" ","pages":"1-13"},"PeriodicalIF":0.9,"publicationDate":"2023-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42484985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift 在扫描移位期间增加对难以检测到的卡在故障的检测
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-04-01 DOI: 10.1007/s10836-023-06060-z
Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, T. Manikas
{"title":"Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift","authors":"Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, T. Manikas","doi":"10.1007/s10836-023-06060-z","DOIUrl":"https://doi.org/10.1007/s10836-023-06060-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"1 1","pages":"1-17"},"PeriodicalIF":0.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42953175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation 基于模式排列的电压/温度分析的成本有效路径延迟缺陷测试
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-04-01 DOI: 10.1007/s10836-023-06057-8
Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstić Miloš
{"title":"Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation","authors":"Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstić Miloš","doi":"10.1007/s10836-023-06057-8","DOIUrl":"https://doi.org/10.1007/s10836-023-06057-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":" ","pages":"1-17"},"PeriodicalIF":0.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44248689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security 提高硬件安全性的INV/BUFF逻辑锁设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-04-01 DOI: 10.1007/s10836-023-06061-y
R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya, S. Ashika
{"title":"Design of INV/BUFF Logic Locking For Enhancing the Hardware Security","authors":"R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya, S. Ashika","doi":"10.1007/s10836-023-06061-y","DOIUrl":"https://doi.org/10.1007/s10836-023-06061-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"1 1","pages":"1-13"},"PeriodicalIF":0.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41591934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network 基于双鉴别器辅助条件生成对抗网络的硬件木马检测方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-04-01 DOI: 10.1007/s10836-023-06054-x
Wenjing Tang, Jing Su, Yuchan Gao
{"title":"Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network","authors":"Wenjing Tang, Jing Su, Yuchan Gao","doi":"10.1007/s10836-023-06054-x","DOIUrl":"https://doi.org/10.1007/s10836-023-06054-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"1 1","pages":"1-12"},"PeriodicalIF":0.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43034721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications 光发射跟踪与测量在汽车模拟电路故障诊断中的应用
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-03-28 DOI: 10.1007/s10836-023-06059-6
T. Melis, E. Simeu, E. Auvray, L. Saury
{"title":"Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications","authors":"T. Melis, E. Simeu, E. Auvray, L. Saury","doi":"10.1007/s10836-023-06059-6","DOIUrl":"https://doi.org/10.1007/s10836-023-06059-6","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":" ","pages":"1-17"},"PeriodicalIF":0.9,"publicationDate":"2023-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43918555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits 间接测试策略在射频电路寿命性能监测中的应用研究
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-03-27 DOI: 10.1007/s10836-023-06058-7
H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre
{"title":"On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits","authors":"H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre","doi":"10.1007/s10836-023-06058-7","DOIUrl":"https://doi.org/10.1007/s10836-023-06058-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"1 1","pages":"1-16"},"PeriodicalIF":0.9,"publicationDate":"2023-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45827531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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