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Journal of Electronic Testing-Theory and Applications最新文献

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A Tunable Concurrent BIST Design Based on Reconfigurable LFSR 基于可重构LFSR的可调并发BIST设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-03-06 DOI: 10.1007/s10836-023-06055-w
Ahmad Menbari, H. Jahanirad
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引用次数: 1
Multiple Retest Systems for Screening High-Quality Chips 筛选高质量芯片的多重重测系统
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-20 DOI: 10.1007/s10836-023-06051-0
Chung-Huang Yeh, Jwu E. Chen
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引用次数: 1
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing 模拟和混合信号多站点测试中问题站点识别的加权Bin-Difference方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06047-w
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen
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引用次数: 0
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation 基于并联电极驱动的DMFB故障检测与诊断
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06048-9
Sourav Ghosh, Surajit Kumar Roy, C. Giri
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引用次数: 0
Journal of Electronic Testing: Theory and Applications New Editors – 2023 电子测试杂志:理论与应用新编辑- 2023
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06049-8
Bahman Arasteh, Y. Malaiya
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引用次数: 0
Editorial 社论
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06052-z
V. Agrawal
{"title":"Editorial","authors":"V. Agrawal","doi":"10.1007/s10836-023-06052-z","DOIUrl":"https://doi.org/10.1007/s10836-023-06052-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"1-2"},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44576977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey 片上网络和片上光子网络基本概念综述
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06046-x
Bahareh Asadi, Syed Maqsood Zia, H. M. Al-Khafaji, Asghar Mohamadian
{"title":"Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey","authors":"Bahareh Asadi, Syed Maqsood Zia, H. M. Al-Khafaji, Asghar Mohamadian","doi":"10.1007/s10836-023-06046-x","DOIUrl":"https://doi.org/10.1007/s10836-023-06046-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"11-25"},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45235166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram DFS-KeyLevel: UML活动图的两层测试场景生成方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06045-y
Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
{"title":"DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram","authors":"Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou","doi":"10.1007/s10836-023-06045-y","DOIUrl":"https://doi.org/10.1007/s10836-023-06045-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"71-88"},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48402103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test Technology Newsletter 测试技术通讯
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06056-9
{"title":"Test Technology Newsletter","authors":"","doi":"10.1007/s10836-023-06056-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06056-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"7-9"},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52281032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Identifying Resistive Open Defects in Embedded Cells under Variations 变化条件下嵌入单元中电阻性开放缺陷的识别
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-02-01 DOI: 10.1007/s10836-023-06044-z
Zahra Paria Najafi-Haghi, H. Wunderlich
{"title":"Identifying Resistive Open Defects in Embedded Cells under Variations","authors":"Zahra Paria Najafi-Haghi, H. Wunderlich","doi":"10.1007/s10836-023-06044-z","DOIUrl":"https://doi.org/10.1007/s10836-023-06044-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"39 1","pages":"27-40"},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45352697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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