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Journal of Electronic Testing-Theory and Applications最新文献

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2022 Reviewers 2022评审员
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-01-24 DOI: 10.1007/s10836-023-06053-y
Carolyn Seepersad
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引用次数: 0
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends 不同角度弯曲外接PCB迹线失效特性的研究
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-01-23 DOI: 10.1007/s10836-023-06043-0
Jake Elliot, Jason Brown
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引用次数: 0
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit 非侵入电路无电感低噪声放大器的精细自校正
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-01-10 DOI: 10.1007/s10836-022-06042-7
Wenrun Xiao, Jidong Diao, Yanping Qiao, Xianming Liu, Shan He, Donghui Guo
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引用次数: 0
Test Technology Newsletter 测试技术时事通讯
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-01-10 DOI: 10.1007/s10836-013-5422-8
T. Theocharides
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引用次数: 0
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm 基于染色体重构算法的内在自愈加法器设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2023-01-01 DOI: 10.1007/s10836-023-06050-1
Raghavendra Kumar Sakali, S. Mahammad
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引用次数: 0
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing 自动化软件测试中气味检测代理路径生成的优化方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06033-8
S. Chandra, S. S. Sankar, H. S. Anand
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引用次数: 1
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing 半导体多点测试中硬件系统误差识别与校正的多项式变换方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06039-2
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen
{"title":"A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing","authors":"Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen","doi":"10.1007/s10836-022-06039-2","DOIUrl":"https://doi.org/10.1007/s10836-022-06039-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"637 - 651"},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42253730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems 硬件木马检测系统中基于CatBoost的标签翻转中毒攻击检测方法
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06035-6
Richa Sharma, G. K. Sharma, M. Pattanaik
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引用次数: 1
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries 用于发展中国家嵌入式系统测试和教育的基于16LF18856的简化编程工具包的开发
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06037-4
Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, D. Asoh, Nicole Adélaïde Kengnou Telem, René Kuaté-Fochie, G. Kenné
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引用次数: 0
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications XOR仲裁器物理不可控制函数的设计、评估及其在硬件安全应用中的FPGA实现
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-12-01 DOI: 10.1007/s10836-022-06034-7
R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya
{"title":"Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications","authors":"R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya","doi":"10.1007/s10836-022-06034-7","DOIUrl":"https://doi.org/10.1007/s10836-022-06034-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"653 - 666"},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49530643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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