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Automated Design Error Debugging of Digital VLSI Circuits 数字VLSI电路的自动设计错误调试
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-08-01 DOI: 10.1007/s10836-022-06020-z
M. Moness, Lamya Gaber, A. Hussein, Hanafy M. Ali
{"title":"Automated Design Error Debugging of Digital VLSI Circuits","authors":"M. Moness, Lamya Gaber, A. Hussein, Hanafy M. Ali","doi":"10.1007/s10836-022-06020-z","DOIUrl":"https://doi.org/10.1007/s10836-022-06020-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"395 - 417"},"PeriodicalIF":0.9,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44982412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata 三元量子点胞自动机中存储单元的新容错处理
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-08-01 DOI: 10.1007/s10836-022-06018-7
L. Dehbozorgi, R. Sabbaghi‐Nadooshan, A. Kashaninia
{"title":"Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata","authors":"L. Dehbozorgi, R. Sabbaghi‐Nadooshan, A. Kashaninia","doi":"10.1007/s10836-022-06018-7","DOIUrl":"https://doi.org/10.1007/s10836-022-06018-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"419 - 444"},"PeriodicalIF":0.9,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44499410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion 将人工神经网络应用于逻辑内置自检：改进测试点插入
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-08-01 DOI: 10.1007/s10836-022-06016-9
Yang Sun, S. Millican
{"title":"Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion","authors":"Yang Sun, S. Millican","doi":"10.1007/s10836-022-06016-9","DOIUrl":"https://doi.org/10.1007/s10836-022-06016-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"339 - 352"},"PeriodicalIF":0.9,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47682801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor Wien桥振荡电路的实验与仿真结果用忆阻器实现第w个运算放大器
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-08-01 DOI: 10.1007/s10836-022-06017-8
İ. Parlar, M. N. Almali
{"title":"Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor","authors":"İ. Parlar, M. N. Almali","doi":"10.1007/s10836-022-06017-8","DOIUrl":"https://doi.org/10.1007/s10836-022-06017-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"445-452"},"PeriodicalIF":0.9,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49516281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A New Approximate 4-2 Compressor using Merged Sum and Carry 一种基于和进位的近似4-2压缩器
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-08-01 DOI: 10.1007/s10836-022-06019-6
Chinthalgiri Jyothi, K. Saranya, B. Jammu, S. Veeramachaneni, S. Mahammad
{"title":"A New Approximate 4-2 Compressor using Merged Sum and Carry","authors":"Chinthalgiri Jyothi, K. Saranya, B. Jammu, S. Veeramachaneni, S. Mahammad","doi":"10.1007/s10836-022-06019-6","DOIUrl":"https://doi.org/10.1007/s10836-022-06019-6","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"381 - 394"},"PeriodicalIF":0.9,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47811779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors 已知近似4:2压缩器的CMOS实现和性能分析
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-07-26 DOI: 10.1007/s10836-022-06010-1
Parthibaraj Anguraj, T. Krishnan, S. Subramanian
{"title":"CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors","authors":"Parthibaraj Anguraj, T. Krishnan, S. Subramanian","doi":"10.1007/s10836-022-06010-1","DOIUrl":"https://doi.org/10.1007/s10836-022-06010-1","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"353 - 370"},"PeriodicalIF":0.9,"publicationDate":"2022-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49475972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization 温度传感器特性的温湿度控制试验台
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-07-25 DOI: 10.1007/s10836-022-06013-y
Syed Usman Amin, Muhammad Aaquib Shahbaz, S. A. Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Z. Warsi, Naveed
{"title":"Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization","authors":"Syed Usman Amin, Muhammad Aaquib Shahbaz, S. A. Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Z. Warsi, Naveed","doi":"10.1007/s10836-022-06013-y","DOIUrl":"https://doi.org/10.1007/s10836-022-06013-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"453-461"},"PeriodicalIF":0.9,"publicationDate":"2022-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48918594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application 用于容错应用的基于舍入的静态分段不精确乘法器的有效设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-07-04 DOI: 10.1007/s10836-022-06011-0
D. Raju, Y. S. Rao
{"title":"Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application","authors":"D. Raju, Y. S. Rao","doi":"10.1007/s10836-022-06011-0","DOIUrl":"https://doi.org/10.1007/s10836-022-06011-0","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"371 - 379"},"PeriodicalIF":0.9,"publicationDate":"2022-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41407907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking AFIA：ATPG引导的安全逻辑锁定故障注入攻击
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-06-09 DOI: 10.1007/s10836-022-06028-5
Yadi Zhong, Ayush Jain, M. T. Rahman, N. Asadizanjani, Jiafeng Xie, Ujjwal Guin
{"title":"AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking","authors":"Yadi Zhong, Ayush Jain, M. T. Rahman, N. Asadizanjani, Jiafeng Xie, Ujjwal Guin","doi":"10.1007/s10836-022-06028-5","DOIUrl":"https://doi.org/10.1007/s10836-022-06028-5","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"527 - 546"},"PeriodicalIF":0.9,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43584019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Editorial 社论
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-06-01 DOI: 10.1007/s10836-022-06015-w
V. Agrawal
{"title":"Editorial","authors":"V. Agrawal","doi":"10.1007/s10836-022-06015-w","DOIUrl":"https://doi.org/10.1007/s10836-022-06015-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"231 - 231"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46178750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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