Journal of Instrumentation最新文献_第7页

Characterisation of Redlen HF-CdZnTe at > 106 ph s-1 mm-2 using HEXITECMHz 使用 HEXITECMHz 在大于 106 ph s-1 mm-2 的条件下对 Redlen HF-CdZnTe 进行表征

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/p04028

B. Cline, D. Banks, S. Bell, I. Church, A. Davis, T. Gardiner, J. Harris, M. Hart, L. Jones, T. Nicholls, J. Nobes, S. Pradeep, M. Roberts, D. Sole, M. C. Veale, M. Wilson, V. Dhamgaye, O. Fox, K. Sawhney

{"title":"Characterisation of Redlen HF-CdZnTe at > 106 ph s-1 mm-2 using HEXITECMHz","authors":"B. Cline, D. Banks, S. Bell, I. Church, A. Davis, T. Gardiner, J. Harris, M. Hart, L. Jones, T. Nicholls, J. Nobes, S. Pradeep, M. Roberts, D. Sole, M. C. Veale, M. Wilson, V. Dhamgaye, O. Fox, K. Sawhney","doi":"10.1088/1748-0221/19/04/p04028","DOIUrl":"https://doi.org/10.1088/1748-0221/19/04/p04028","url":null,"abstract":"\u0000 In this paper, results are presented from the\u0000 characterisation of Redlen Technologies high-flux-capable Cadmium\u0000 Zinc Telluride (HF-CZT) hybridised to the HEXITECMHz \u0000 ASIC, a novel 1 MHz continuous X-ray imaging system. A 2 mm thick\u0000 HF-CZT HEXITECMHz detector was characterised on the B16\u0000 Test Beamline at the Diamond Light Source and displayed an average\u0000 FWHM of 850 eV for monochromatic X-rays of energy\u0000 20 keV. Measurements revealed a shift in the baseline of\u0000 irradiated pixels that results in a movement of the entire spectrum\u0000 to higher ADU values. Datasets taken to analyse the effect's\u0000 dynamics showed it to be highly localised and flux-dependent, with\u0000 the excess leakage current generated equivalent to per-pixel shifts\u0000 of ∼ 543 pA (8.68 nA mm-2) at a flux of\u0000 1.26×107 ph s-1 mm-2. Comparison to results\u0000 from a p-type Si HEXITECMHz device indicate this `excess\u0000 leakage-current' effect is unique to HF-CZT and it is hypothesised\u0000 that it originates from trapping at the electrode-CZT interface and\u0000 a temporary modification of the potential barrier between the CZT\u0000 and metal electrode.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140771176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Hybrid designs and kick-off batch production experience for the CMS Phase-2 Upgrade CMS 第二阶段升级的混合设计和启动批量生产经验

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04052

M. Kovacs, M. Abbas, I. Ahmed, G. Blanchot, A. Honma, A. La Rosa, I. Mateos Domínguez, K. Klein, M. Mohammadi Najafabadi, K. Schleidweiler, P. Szydlik, A. Zografos

引用次数: 0

Overview of the production and qualification tests of the lpGBT lpGBT 生产和鉴定测试概述

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04048

D. Hernandez Montesinos, S. Baron, S. Biereigel, P. Hazell, S. Kulis, P. Vicente Leitao, P. Moreira, D. Porret, K. Wyllie

引用次数: 0

Counting alpha particles produced by radon daughters using commercial off-the-shelf complementary metal oxide semiconductor (COTS CMOS) image sensors 使用现成的商用互补金属氧化物半导体（COTS CMOS）图像传感器对氡女儿产生的α粒子进行计数

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/t04001

F. Lin, R. Xie, Huiying Li, Shuaibin Liu, T. Hu, Z. Fan, Yixiang Mo, Shuai Yuan, Jiale Sun, Haibo Yi, Zhipeng Liu, Jiulin Wu, Jianfeng Tang, H. Yuan, Yanliang Tan

{"title":"Counting alpha particles produced by radon daughters using commercial off-the-shelf complementary metal oxide semiconductor (COTS CMOS) image sensors","authors":"F. Lin, R. Xie, Huiying Li, Shuaibin Liu, T. Hu, Z. Fan, Yixiang Mo, Shuai Yuan, Jiale Sun, Haibo Yi, Zhipeng Liu, Jiulin Wu, Jianfeng Tang, H. Yuan, Yanliang Tan","doi":"10.1088/1748-0221/19/04/t04001","DOIUrl":"https://doi.org/10.1088/1748-0221/19/04/t04001","url":null,"abstract":"\u0000 Radon (Rn-222) is the main source of radiation exposure to\u0000 human beings from natural radiation; it is of great significance to\u0000 study the measuring methods and measuring instruments of radon for\u0000 natural radiation protection. In recent years, the application of\u0000 pixel detectors in radiation detection has attracted attention. In\u0000 this paper, a Commercial Off-the-Shelf Complementary Metal Oxide\u0000 Semiconductor (COTS CMOS) image sensor which replaces the glass for\u0000 protection covering in front of the sensors was used to perform a\u0000 series of measurements to identify alpha particles. During the\u0000 experiment, the CMOS image sensor was used to record a video during\u0000 the sampling period, and then use the FFmpeg software to take\u0000 screenshots of the video by frame. MATLAB was used to count bright\u0000 spots from the image frames. A measurement chamber was designed to\u0000 measure radon concentrations, and when the relative humidity was\u0000 constant, the count of alpha particles by the CMOS image sensor\u0000 increased along with the increase of the concentration. The\u0000 experiments verified the feasibility of the low-cost COTS CMOS image\u0000 sensors to monitor radon.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140780440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The CMOS Pseudo-Thyristor: a zero-static current discriminator circuit CMOS 伪晶闸管：零静态电流鉴别器电路

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04034

X. Wen, T. Fu, D. Gong, X. Huang, T. Liu, P. Gui, J. Wu

引用次数: 0

Numerical study of the plasma meniscus shape and beam optics in RF negative ion sources 射频负离子源中等离子半月板形状和光束光学的数值研究

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04031

K. Hayashi, K. Hoshino, K. Miyamoto, A. Hatayama, J. Lettry

{"title":"Numerical study of the plasma meniscus shape and beam optics in RF negative ion sources","authors":"K. Hayashi, K. Hoshino, K. Miyamoto, A. Hatayama, J. Lettry","doi":"10.1088/1748-0221/19/04/c04031","DOIUrl":"https://doi.org/10.1088/1748-0221/19/04/c04031","url":null,"abstract":"\u0000 In order to extract intense ion beams with good beam optics from hydrogen negative ion\u0000 sources, it is important to control the shape of the plasma meniscus (i.e. beam emission\u0000 surface). Recently, it is suggested experimentally that the degradation of beam optics in the RF\u0000 negative ion sources may be due to the fluctuation of the distance d\u0000 eff between the meniscus\u0000 and the extraction grid caused by the fluctuation of the plasma density np\u0000 . The purpose of\u0000 this study is to make clear the dependence of d\u0000 eff on np\u0000 in the presence of a\u0000 large amount of surface produced H- ions in order to understand such fluctuation of beam\u0000 optics in RF sources For the purpose, 3D electrostatic PIC simulation was conducted taking the\u0000 bulk plasma density as a parameter, investigating the extraction region of a H- ion source. A\u0000 large amount of the surface H- production on the PG has been taken into account under the\u0000 assumption that the H- production rate is proportional to the bulk plasma density. The result\u0000 shows that the effective distance d\u0000 eff is proportional to np\u0000 \u0000 -1/2 even for a\u0000 large amount of surface H- production. This dependence suggests that the bulk plasma density\u0000 np\u0000 is the key parameters to control d\u0000 eff and the resultant beam optics extracted from\u0000 the negative ion source.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140782924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design and measurements of SMAUG1, a prototype ASIC for voltage measurement using noise distribution 利用噪声分布测量电压的 ASIC 原型 SMAUG1 的设计与测量

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04053

Grzegorz Węgrzyn, Robert Szczygieł

引用次数: 0

On an X-ray 3-block Laue-interferometer with violation of ideal geometry 关于违反理想几何的 X 射线 3 块 Laue 干涉仪

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04012

S. A. Mkhitaryan, H.G. Margaryan, M. Vasilyan, H. Drmeyan

{"title":"On an X-ray 3-block Laue-interferometer with violation of ideal geometry","authors":"S. A. Mkhitaryan, H.G. Margaryan, M. Vasilyan, H. Drmeyan","doi":"10.1088/1748-0221/19/04/c04012","DOIUrl":"https://doi.org/10.1088/1748-0221/19/04/c04012","url":null,"abstract":"\u0000 An X-ray monolithic 4-block interference system has been developed and manufactured, in which the first 3 blocks are thin and form a 3- block Laue interferometer with disrupted geometry, and the 4th additional block is thick and is in the reflection position. It is shown that fine structures of interference patterns registered from 3-block interferometers with thin blocks and distorted geometry are observed in cases where an additional 4th thick block is used. The calculations show that when the ideal geometry of a 3-block interferometer is violated, an interference pattern is formed in the form of families of parallel stripes (lines) on the recording plate lying perpendicular to the incident beam. The coordinates of the interference stripes maxima, their periods, as well as the coefficient of a linear enlargement in the presence and absence of the 4th thick block, are calculated. It has been experimentally proven that a thick block does not introduce new information into the interference pattern, but will only enlarge its dimensions in the scattering plane. The limits for reducing the period of interference stripes and their complete disappearance are determined depending on the size of violations from the ideal geometry of a 3-block interferometer.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140796005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Spectral micro-CT for simultaneous gold and iodine detection, and multi-material identification 用于同时检测金和碘以及识别多种材料的光谱微计算机断层扫描技术

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04023

P. Perion, F. Arfelli, R. Menk, L. Brombal

引用次数: 0

A novel silicon pixel sensor for beam monitoring applications at heavy-ion accelerators 用于重离子加速器束流监测的新型硅像素传感器

Journal of Instrumentation Pub Date : 2024-04-01 DOI: 10.1088/1748-0221/19/04/c04039

Y. Tian, W. Zhou, Q. Wang, X. Niu, W. Han, H. Yang, H. Zhang, S. Liao, X. Li, C. Zhao

引用次数: 0