lpGBT 生产和鉴定测试概述

D. Hernandez Montesinos, S. Baron, S. Biereigel, P. Hazell, S. Kulis, P. Vicente Leitao, P. Moreira, D. Porret, K. Wyllie
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引用次数: 0

摘要

低功耗千兆位收发器(lpGBT)是一种耐辐射 ASIC,用于高能物理实验的多用途高速双向串行链路。此外,还进行了超出生产测试仪限制的特定单项鉴定测试,包括辐射、多点总线拓扑、通过不同类型电气链路的芯片间通信以及恢复时钟的抖动和稳定性鉴定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Overview of the production and qualification tests of the lpGBT
The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. Around 200,000 chips have been tested with a production test system capable of exercising the majority of the ASIC functionality to ensure its correct operation. Furthermore, specific individual qualification tests were carried out beyond the production tester limits, including radiation, multi-drop bus topology, inter-chip communication through different types of electrical links and characterization of jitter and stability of the recovered clocks. In this article, an overview of the production and qualification tests is given together with their results demonstrating the robustness and flexibility of the lpGBT.
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