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Journal of Electronic Testing最新文献

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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits 在射频电路规范导向间接测试中使用集合方法的研究
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05868-3
H. E. Badawi, F. Azaïs, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre
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引用次数: 6
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter 使用改进型无香料粒子滤波器预测模拟电路的剩余使用寿命
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05870-9
S. Rathnapriya, V. Manikandan
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引用次数: 0
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs 基于 TSV 的 3D SOC 的测试封装长度和 TSV 的协同优化
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05872-7
Tanusree Kaibartta, G. P. Biswas, D. K. Das
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引用次数: 3
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films 用于薄膜介电特性分析的共面波导测试结构设计与优化方法学
Journal of Electronic Testing Pub Date : 2020-03-30 DOI: 10.1007/s10836-020-05873-6
Jinqun Ge, T. Xia, Guoan Wang
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引用次数: 0
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films 用于薄膜介电特性分析的共面波导测试结构设计与优化方法学
Journal of Electronic Testing Pub Date : 2020-03-30 DOI: 10.1007/s10836-020-05873-6
Jinqun Ge, T. Xia, Guoan Wang
{"title":"Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films","authors":"Jinqun Ge, T. Xia, Guoan Wang","doi":"10.1007/s10836-020-05873-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05873-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 14","pages":"183 - 188"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141220141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips 优化数字微流控生物芯片测试路径的高效算法
Journal of Electronic Testing Pub Date : 2020-03-18 DOI: 10.1007/s10836-020-05865-6
Xijun Huang, Chuan-pei Xu, Long Zhang
{"title":"An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips","authors":"Xijun Huang, Chuan-pei Xu, Long Zhang","doi":"10.1007/s10836-020-05865-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05865-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 32","pages":"205 - 218"},"PeriodicalIF":0.0,"publicationDate":"2020-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141222170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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