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A Survey of PCB Defect Detection Algorithms PCB缺陷检测算法综述
Journal of Electronic Testing Pub Date : 2023-12-01 DOI: 10.1007/s10836-023-06091-6
Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar
{"title":"A Survey of PCB Defect Detection Algorithms","authors":"Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar","doi":"10.1007/s10836-023-06091-6","DOIUrl":"https://doi.org/10.1007/s10836-023-06091-6","url":null,"abstract":"<p>Printed circuit boards (PCBs) are the first stage in manufacturing any electronic product. The reliability of the electronic product depends on the PCB. The presence of manufacturing defects in PCBs might affect the performance of the PCB and thereby the reliability of the electronic products. In this paper, the various challenges faced in identifying manufacturing defects along with a review of various learning methods employed for defect detection are presented. We compare the various techniques available in the literature for further understanding of the accuracy of these techniques in defect detection.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Fault Detection by Test Case Prioritization via Test Case Selection 通过测试用例选择的测试用例优先级进行有效的故障检测
Journal of Electronic Testing Pub Date : 2023-11-22 DOI: 10.1007/s10836-023-06086-3
J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan
{"title":"Efficient Fault Detection by Test Case Prioritization via Test Case Selection","authors":"J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan","doi":"10.1007/s10836-023-06086-3","DOIUrl":"https://doi.org/10.1007/s10836-023-06086-3","url":null,"abstract":"<p>One of the significant features of software quality is software reliability. In the testing phase, faults are identified and corrected by integrating them into software development, thus obtaining better reliability. Here, by utilizing the Elliptical Distributions-centric Emperor Penguins Colony Algorithm (ED-EPCA)-based Test Case Prioritization (TCP), an effectual Fault Detection (FD) technique is proposed using Fishers Yates Shuffled Shepherd Optimization Algorithm (FY-SSOA)-based Test Case Selection (TCS). Initially, for the incoming source code, the Test Case (TC) is created. Then, the significant factors needed for TCS and prioritization are identified. Next, by utilizing the Log Scaling-centered Generalized Discriminant Analysis (LS-GDA) model, the estimated factors are abated further to enhance the TCS along with prioritization for the Fault Detection Process (FDP). Then, using the FY-SSOA, the optimized TCs are selected. Subsequently, with the help of ED-EPCA, the TCs being selected are ranked as well as prioritized. Finally, to validate the proposed system’s effectiveness, the model’s performance is evaluated in the working platform of Java and analogized with the traditional methodologies. The results indicate that the test case prioritization-based fault detection method is robust with a 99.23% fault detection rate and a small amount of memory usage, which is only 8245475 kb by generating a large number of test cases.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"28 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices 用于轻型设备的基于 SRAM 的抗老化真随机数发生器
Journal of Electronic Testing Pub Date : 2020-05-31 DOI: 10.1007/s10836-020-05881-6
Wendong Wang, Ujjwal Guin, A. Singh
{"title":"Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices","authors":"Wendong Wang, Ujjwal Guin, A. Singh","doi":"10.1007/s10836-020-05881-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05881-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"27 3","pages":"301 - 311"},"PeriodicalIF":0.0,"publicationDate":"2020-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141201947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A probability density estimation algorithm on multiwavelet for the high-resolution ADC 用于高分辨率 ADC 的多小波概率密度估计算法
Journal of Electronic Testing Pub Date : 2020-05-24 DOI: 10.1007/s10836-020-05877-2
Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang
{"title":"A probability density estimation algorithm on multiwavelet for the high-resolution ADC","authors":"Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang","doi":"10.1007/s10836-020-05877-2","DOIUrl":"https://doi.org/10.1007/s10836-020-05877-2","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"5 1","pages":"375 - 383"},"PeriodicalIF":0.0,"publicationDate":"2020-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141203365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High Performance Approximate Memories for Image Processing Applications 图像处理应用中的高性能近似存储器
Journal of Electronic Testing Pub Date : 2020-05-21 DOI: 10.1007/s10836-020-05879-0
R. Jothin, M. P. Mohamed
{"title":"High Performance Approximate Memories for Image Processing Applications","authors":"R. Jothin, M. P. Mohamed","doi":"10.1007/s10836-020-05879-0","DOIUrl":"https://doi.org/10.1007/s10836-020-05879-0","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"56 4","pages":"419 - 428"},"PeriodicalIF":0.0,"publicationDate":"2020-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141203819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing LoBA：用于高效图像处理的领先的基于一位的不精确乘法器
Journal of Electronic Testing Pub Date : 2020-05-18 DOI: 10.1007/s10836-020-05883-4
Bharat Garg, S. Patel, Sunil Dutt
{"title":"LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing","authors":"Bharat Garg, S. Patel, Sunil Dutt","doi":"10.1007/s10836-020-05883-4","DOIUrl":"https://doi.org/10.1007/s10836-020-05883-4","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"45 25","pages":"429 - 437"},"PeriodicalIF":0.0,"publicationDate":"2020-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141204211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks 片上通信网络中具有通道开放故障的最大连接性测试
Journal of Electronic Testing Pub Date : 2020-04-27 DOI: 10.1007/s10836-020-05878-1
Biswajit Bhowmik
{"title":"Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks","authors":"Biswajit Bhowmik","doi":"10.1007/s10836-020-05878-1","DOIUrl":"https://doi.org/10.1007/s10836-020-05878-1","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"15 1","pages":"385 - 408"},"PeriodicalIF":0.0,"publicationDate":"2020-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141209874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A Novel Approach of Data Content Zeroization Under Memory Attacks 内存攻击下的数据内容清零新方法
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05867-4
Ankush Srivastava, P. Ghosh
{"title":"A Novel Approach of Data Content Zeroization Under Memory Attacks","authors":"Ankush Srivastava, P. Ghosh","doi":"10.1007/s10836-020-05867-4","DOIUrl":"https://doi.org/10.1007/s10836-020-05867-4","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"116 7","pages":"147 - 167"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141217687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Speed-Up in Test Methods Using Probabilistic Merit Indicators 使用概率优劣指标加快测试方法的速度
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05871-8
M. Fooladi, Arezoo Kamran
{"title":"Speed-Up in Test Methods Using Probabilistic Merit Indicators","authors":"M. Fooladi, Arezoo Kamran","doi":"10.1007/s10836-020-05871-8","DOIUrl":"https://doi.org/10.1007/s10836-020-05871-8","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 3","pages":"285 - 296"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter 使用改进型无香料粒子滤波器预测模拟电路的剩余使用寿命
Journal of Electronic Testing Pub Date : 2020-04-01 DOI: 10.1007/s10836-020-05870-9
S. Rathnapriya, V. Manikandan
{"title":"Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter","authors":"S. Rathnapriya, V. Manikandan","doi":"10.1007/s10836-020-05870-9","DOIUrl":"https://doi.org/10.1007/s10836-020-05870-9","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" January","pages":"169 - 181"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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